Abstract: A method for quality and reliability assurance testing a lot of fabricated ICs comprising the steps of testing the differential Iddq of a sample of ICs at a plurality of different voltages, burning-in a sample of ICs, and then testing the functionality of the sample of ICs. The method of the present invention enables the reliability of an entire lot of ICs to be tested by determining an effective screening voltage for differential Iddq testing of the ICs, thereby eliminating the need both to burn-in and conduct post burn-in testing of all future lots of the ICs. The method of the present invention also enables fabrication facilities and workers to be engaged in other tasks rather than testing of ICs.

Abstract: A filament-wound plastic pressure vessel and technique for fabricating such vessel are disclosed. The pressure vessel includes a monolithic plastic liner having a cylindrical side wall portion and domed end portions. A multiplicity of resin-impregnated reinforcing filaments are wound about at least the cylindrical side wall portion of the liner in a predetermined winding pattern. A non-axial access opening to the interior of the tank is cut through the liner and through the filaments, resulting in discontinuous filament ends at the periphery of the opening. A reinforcement is provided for the filament ends to redistribute stress transmission paths around the opening. The reinforcement includes at least one randomly oriented fibrous mat pad sandwiched between a pair of woven cloth pads having a basket weave configuration.