Abstract: An improved clocked data converter with a vibrating microelectromechanical systems (MEMS) resonator. The MEMS resonator is used as part of the clock circuitry of an analog to digital converter or a digital to analog converter. The MEMS resonator may be used as the frequency determining element of an on-chip oscillator, or as a bandpass filter used to clean up an external clock signal.

Abstract: A test system that includes a generator and an analyzer acting cooperatively to test a device having a plurality of device communication channels. The device has a plurality of inputs and corresponding outputs, each input being connected to a corresponding one of the outputs. The correspondence between the input and output channels may change if the device is turned off and on or if the device is not actively sending data from the inputs to the outputs. The test system determines a mapping between the device inputs and outputs prior to performing bit error rate testing utilizing a mapping test pattern. The test system can then switch to a bit error rate test pattern without causing the device to drift such that the correspondence between the input and output channels is lost.

Abstract: The present invention is directed to a system and method which expands the applicability of subsampling to a larger range of signal repetition rates while reducing the range over which the sample rate must be tuned to accommodate a given signal. The resulting sample sequences are in the correct order, enabling direct display with an ordinary oscilloscope or other instrumentation. In one embodiment, a technique is used such that decimation of the samples also improves the response characteristics of the sensor. The system and method provides for a number of different procedures for sampling a signal of a given length. All other parameters being the same, the system allows more freedom in selecting the sample rate to correctly sub-sample a repetitive signal.

Abstract: A test system that includes a generator and an analyzer acting cooperatively to test a device having a plurality of device communication channels. The device has a plurality of inputs and corresponding outputs, each input being connected to a corresponding one of the outputs. The correspondence between the input and output channels may change if the device is turned off and on or if the device is not actively sending data from the inputs to the outputs. The test system determines a mapping between the device inputs and outputs prior to performing bit error rate testing utilizing a mapping test pattern. The test system can then switch to a bit error rate test pattern without causing the device to drift such that the correspondence between the input and output channels is lost.

Abstract: A CAD system and method for designing sheet metal parts. A proposed design is automatically tested against a set of design rules. Available tools are selected according to criteria computed with reference to the part to the fabricated and then are tested to determine whether they can be used to make desired bends. A fabrication sequence is computed.