Patents by Inventor Michael James Owen

Michael James Owen has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20220319206
    Abstract: The invention relates to method and system configured for material analysis and mineralogy. At least one image based on first emission from a sample is provided. First spectra of the sample based on second emissions from the second scan locations of the image are provided. A confidence score is calculated for every first spectrum, and second scan location(s) with confidence score(s) below a threshold value are selected. Second emissions from the selected second scan location(s) are acquired to provide new image and determine new second scan locations within the respective new image.
    Type: Application
    Filed: March 29, 2022
    Publication date: October 6, 2022
    Applicant: FEI Company
    Inventors: Darius Kocár, Michael James OWEN
  • Publication number: 20220207256
    Abstract: Methods and systems for high dynamic range (HDR) charged particle analysis using clustering processes include accessing a plurality of instances of image data for a region of a sample, where each instance of image data was captured with different parameters by a charged particle microscope. The difference in parameters may include one or more of a difference in contrast, brightness, beam strength, beam type, gamma, and/or a combination thereof. An HDR charged particle microscopy data structure is then generated using the captured image data, and one or more features of the sample are identified based on the HDR charged particle microscopy data structure. In some methods according to the present invention, the methods further include performing EDS analysis on the sample based on the determined one or more identified features.
    Type: Application
    Filed: December 30, 2020
    Publication date: June 30, 2022
    Applicant: FEI Company
    Inventors: Michael James Owen, Cody Levien, Garth Howell, Tomás Tûma
  • Patent number: 10620142
    Abstract: A method of operating a charged particle microscope comprising: Providing a specimen on a specimen holder; Using a source to produce a beam of charged particles, and irradiating the specimen with said beam; Using a detector to detect X-ray radiation emanating from the specimen in response to said irradiation, and to produce a spectrum comprising X-ray characteristic peaks on a Bremsstrahlung background, comprising the following additional steps: Using an elemental decomposition algorithm to analyze the characteristic peaks in said spectrum, thereby determining a reference group of major chemical elements contributing to the spectrum; Calculating an average atomic number for said reference group, and using this in a predictive model to generate a calculated Bremsstrahlung profile for the reference group; Fitting said calculated Bremsstrahlung profile to the Bremsstrahlung background in said spectrum, and attributing a discrepancy between the latter and the former to a residual element absent from, or inc
    Type: Grant
    Filed: October 29, 2018
    Date of Patent: April 14, 2020
    Assignee: FEI Company
    Inventors: Michael James Owen, Ashley Donaldson
  • Publication number: 20190172681
    Abstract: A method of operating a charged particle microscope comprising: Providing a specimen on a specimen holder; Using a source to produce a beam of charged particles, and irradiating the specimen with said beam; Using a detector to detect X-ray radiation emanating from the specimen in response to said irradiation, and to produce a spectrum comprising X-ray characteristic peaks on a Bremsstrahlung background, comprising the following additional steps: Using an elemental decomposition algorithm to analyze the characteristic peaks in said spectrum, thereby determining a reference group of major chemical elements contributing to the spectrum; Calculating an average atomic number for said reference group, and using this in a predictive model to generate a calculated Bremsstrahlung profile for the reference group; Fitting said calculated Bremsstrahlung profile to the Bremsstrahlung background in said spectrum, and attributing a discrepancy between the latter and the former to a residual element absent from, or inco
    Type: Application
    Filed: October 29, 2018
    Publication date: June 6, 2019
    Inventors: Michael James OWEN, Ashley DONALDSON
  • Patent number: 9778215
    Abstract: The present invention discloses a combination of two existing approaches for mineral analysis and makes use of the Similarity Metric Invention, that allows mineral definitions to be described in theoretical compositional terms, meaning that users are not required to find examples of each mineral, or adjust rules. This system allows untrained operators to use it, as opposed to previous systems, which required extensive training and expertise.
    Type: Grant
    Filed: October 26, 2012
    Date of Patent: October 3, 2017
    Assignee: FEI Company
    Inventors: Michael James Owen, Michael Buhot
  • Patent number: 9734986
    Abstract: Mineral definitions each include a list of elements, each of the elements having a corresponding standard spectrum. To determine the composition of an unknown mineral sample, the acquired spectrum of the sample is sequentially decomposed into the standard spectra of the elements from the element list of each of the mineral definitions, and a similarity metric computed for each mineral definition. The unknown mineral is identified as the mineral having the best similarity metric.
    Type: Grant
    Filed: June 2, 2015
    Date of Patent: August 15, 2017
    Assignee: FEI Company
    Inventors: Michael James Owen, Michael Buhot
  • Patent number: 9719950
    Abstract: A method and apparatus are provided for identifying a material with a sample-specific reference spectral list or library. A sequential approach to SEM-EDS automated mineralogy classification is carried out by performing two or more material classification analyses. A pre-classification step restricts the processing of spectra deconvolution algorithms to a subset of spectra that pass a dominant mineral criteria resulting in a significantly reduced subset of reference spectra that occur within the measured sample in pure enough form at a given minimum quantity. The following complex classification stages involving deconvolution of multiple constituents within measured spectra is based on this sample relevant subset.
    Type: Grant
    Filed: February 25, 2015
    Date of Patent: August 1, 2017
    Assignee: FEI Company
    Inventors: Michael James Owen, Ashley Donaldson, Garth Howell, Phillip John Christopher Parker
  • Patent number: 9714908
    Abstract: Method and apparatus for analysis and display of fine grained mineral samples. A portion of the sample is illuminated with a charged particle beam. Emitted radiation is detected, and a sample emission spectrum is generated and fit with a plurality of standard emission spectra of minerals in a candidate mineral composition. A mineral composition whose emission spectrum best fits the sample emission spectrum is selected from a plurality of candidate mineral compositions. An assigned color is received for each mineral in the selected mineral composition, and the assigned colors are blended according to the proportion of each mineral in the selected mineral composition. An image pixel corresponding to the portion of the sample is rendered for display.
    Type: Grant
    Filed: November 6, 2013
    Date of Patent: July 25, 2017
    Assignee: FEI Company
    Inventors: Michael James Owen, Garth Howell, Ashley Donaldson
  • Patent number: 9495786
    Abstract: Optimized blending mode for mineralogy images. A luminosity value is determined for a pixel in a base layer or top layer mineralogy image. An image weighting value is determined from the luminosity value and an optional mixing parameter. A multiply value is determined by multiplying the base and top layer pixel values. An overlay value is determined from twice the multiply value if the value of one of the base layer or top layer pixel values is over a threshold, otherwise it is determined by inverting twice the product of the inverted top layer pixel value with the inverted base layer pixel value. A blended image pixel value is determined by adding the multiply value weighted with the image weighting value and the overlay value weighted with the inverted image weighting value.
    Type: Grant
    Filed: November 9, 2015
    Date of Patent: November 15, 2016
    Assignee: FEI COMPAN
    Inventors: Garth Howell, Michael James Owen, Leonardo Salazar, David Haberlah, Eric Goergen
  • Publication number: 20160245762
    Abstract: A method and apparatus are provided for identifying a material with a sample-specific reference spectral list or library. A sequential approach to SEM-EDS automated mineralogy classification is carried out by performing two or more material classification analyses. A pre-classification step restricts the processing of spectra deconvolution algorithms to a subset of spectra that pass a dominant mineral criteria resulting in a significantly reduced subset of reference spectra that occur within the measured sample in pure enough form at a given minimum quantity. The following complex classification stages involving deconvolution of multiple constituents within measured spectra is based on this sample relevant subset.
    Type: Application
    Filed: February 25, 2015
    Publication date: August 25, 2016
    Applicant: FEI Company
    Inventors: Michael James Owen, Ashley Donaldson, Garth Howell, Phillip John Christopher Parker
  • Publication number: 20160063749
    Abstract: Optimized blending mode for mineralogy images. A luminosity value is determined for a pixel in a base layer or top layer mineralogy image. An image weighting value is determined from the luminosity value and an optional mixing parameter. A multiply value is determined by multiplying the base and top layer pixel values. An overlay value is determined from twice the multiply value if the value of one of the base layer or top layer pixel values is over a threshold, otherwise it is determined by inverting twice the product of the inverted top layer pixel value with the inverted base layer pixel value. A blended image pixel value is determined by adding the multiply value weighted with the image weighting value and the overlay value weighted with the inverted image weighting value.
    Type: Application
    Filed: November 9, 2015
    Publication date: March 3, 2016
    Applicant: FEI Company
    Inventors: Garth Howell, Michael James Owen, Leonardo Salazar, David Haberlah, Eric Goergen
  • Publication number: 20150338358
    Abstract: Mineral definitions each include a list of elements, each of the elements having a corresponding standard spectrum. To determine the composition of an unknown mineral sample, the acquired spectrum of the sample is sequentially decomposed into the standard spectra of the elements from the element list of each of the mineral definitions, and a similarity metric computed for each mineral definition. The unknown mineral is identified as the mineral having the best similarity metric.
    Type: Application
    Filed: June 2, 2015
    Publication date: November 26, 2015
    Inventors: Michael James Owen, Michael Buhot
  • Patent number: 9188555
    Abstract: This invention relates to a method and system for determining the composition of an unknown sample. The present invention is directed to a method of calibrating an x-ray spectrometer that does not require measuring all possible elements under the operating conditions used to measure the unknown sample to be analyzed. According to a preferred embodiment, the local instrument can be calibrated from an x-ray spectrum of a single elemental standard. The instrument will have a stored library containing high quality spectra for all elements being analyzed. The analysis of the single element is compared to the library spectra for that element to define a transformation that is used to create a calibrated spectra library that includes a calibrated spectrum for each spectrum in the original library. The spectra generated by the local instrument can be compared to the calibrated library spectra to determine the elements in an unknown mineral.
    Type: Grant
    Filed: July 30, 2012
    Date of Patent: November 17, 2015
    Assignee: FEI Company
    Inventor: Michael James Owen
  • Patent number: 9183656
    Abstract: Optimized blending mode for mineralogy images. A luminosity value is determined for a pixel in a base layer or top layer mineralogy image. An image weighting value is determined from the luminosity value and an optional mixing parameter. A multiply value is determined by multiplying the base and top layer pixel values. An overlay value is determined from twice the multiply value if the value of one of the base layer or top layer pixel values is over a threshold, otherwise it is determined by inverting twice the product of the inverted top layer pixel value with the inverted base layer pixel value. A blended image pixel value is determined by adding the multiply value weighted with the image weighting value and the overlay value weighted with the inverted image weighting value.
    Type: Grant
    Filed: March 11, 2014
    Date of Patent: November 10, 2015
    Assignee: FEI Company
    Inventors: Garth Howell, Michael James Owen, Leonardo Salazar, David Haberlah, Eric Goergen
  • Publication number: 20150262400
    Abstract: Optimized blending mode for mineralogy images. A luminosity value is determined for a pixel in a base layer or top layer mineralogy image. An image weighting value is determined from the luminosity value and an optional mixing parameter. A multiply value is determined by multiplying the base and top layer pixel values. An overlay value is determined from twice the multiply value if the value of one of the base layer or top layer pixel values is over a threshold, otherwise it is determined by inverting twice the product of the inverted top layer pixel value with the inverted base layer pixel value. A blended image pixel value is determined by adding the multiply value weighted with the image weighting value and the overlay value weighted with the inverted image weighting value.
    Type: Application
    Filed: March 11, 2014
    Publication date: September 17, 2015
    Applicant: FEI Company
    Inventors: Garth Howell, Michael James Owen, Leonardo Salazar, David Haberlah, Eric Goergen
  • Patent number: 9091635
    Abstract: Determining the composition of a mineral sample entails comparing measurements of a sample to mineral definitions and determining a similarity metric. The mineral definition includes a subspace of compositional values defined by end members. The similarity metric is related to a projection of the measured data point onto the subspace or onto an extension of the subspace.
    Type: Grant
    Filed: October 26, 2012
    Date of Patent: July 28, 2015
    Assignee: FEI COMPANY
    Inventor: Michael James Owen
  • Patent number: 9048067
    Abstract: Mineral definitions each include a list of elements, each of the elements having a corresponding standard spectrum. To determine the composition of an unknown mineral sample, the acquired spectrum of the sample is sequentially decomposed into the standard spectra of the elements from the element list of each of the mineral definitions, and a similarity metric computed for each mineral definition. The unknown mineral is identified as the mineral having the best similarity metric.
    Type: Grant
    Filed: October 26, 2012
    Date of Patent: June 2, 2015
    Assignee: FEI COMPANY
    Inventor: Michael James Owen
  • Publication number: 20150122992
    Abstract: Method and apparatus for analysis and display of fine grained mineral samples. A portion of the sample is illuminated with a charged particle beam. Emitted radiation is detected, and a sample emission spectrum is generated and fit with a plurality of standard emission spectra of minerals in a candidate mineral composition. A mineral composition whose emission spectrum best fits the sample emission spectrum is selected from a plurality of candidate mineral compositions. An assigned color is received for each mineral in the selected mineral composition, and the assigned colors are blended according to the proportion of each mineral in the selected mineral composition. An image pixel corresponding to the portion of the sample is rendered for display.
    Type: Application
    Filed: November 6, 2013
    Publication date: May 7, 2015
    Applicant: FEI Company
    Inventors: Michael James Owen, Garth Howell, Ashley Donaldson
  • Patent number: 8937282
    Abstract: An improved mineral analysis system includes mineral definitions that include not only characteristics of the minerals, but also variability in those characteristics. The variabilities allow the calculation of ranges of expected values for different quality of measurements, for example, for different numbers of x-ray counts. Match probabilities can therefore be calculated to more accurately determine the composition of a mineral sample.
    Type: Grant
    Filed: October 26, 2012
    Date of Patent: January 20, 2015
    Assignee: FEI Company
    Inventors: Michael James Owen, Michael Buhot
  • Patent number: 8880356
    Abstract: A method and system for spectrum data analysis. The method comprises the steps of collecting a spectrum of an unknown material; providing a set of data templates; calculating weighting factors for the element data templates to minimize error in approximating the spectrum; removing one or more of the templates having negative weights in approximating the spectrum; and re-calculating an approximation of the spectrum with said one or more templates removed. Embodiments of the invention are suitable for analyzing noisy spectra having relatively few data points.
    Type: Grant
    Filed: February 6, 2009
    Date of Patent: November 4, 2014
    Assignee: Fei Company
    Inventors: Daniel Roy Corbett, Paul Gottlieb, Andrew Harley Menzies, Michael James Owen