Patents by Inventor Michael James Owen
Michael James Owen has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20220319206Abstract: The invention relates to method and system configured for material analysis and mineralogy. At least one image based on first emission from a sample is provided. First spectra of the sample based on second emissions from the second scan locations of the image are provided. A confidence score is calculated for every first spectrum, and second scan location(s) with confidence score(s) below a threshold value are selected. Second emissions from the selected second scan location(s) are acquired to provide new image and determine new second scan locations within the respective new image.Type: ApplicationFiled: March 29, 2022Publication date: October 6, 2022Applicant: FEI CompanyInventors: Darius Kocár, Michael James OWEN
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Publication number: 20220207256Abstract: Methods and systems for high dynamic range (HDR) charged particle analysis using clustering processes include accessing a plurality of instances of image data for a region of a sample, where each instance of image data was captured with different parameters by a charged particle microscope. The difference in parameters may include one or more of a difference in contrast, brightness, beam strength, beam type, gamma, and/or a combination thereof. An HDR charged particle microscopy data structure is then generated using the captured image data, and one or more features of the sample are identified based on the HDR charged particle microscopy data structure. In some methods according to the present invention, the methods further include performing EDS analysis on the sample based on the determined one or more identified features.Type: ApplicationFiled: December 30, 2020Publication date: June 30, 2022Applicant: FEI CompanyInventors: Michael James Owen, Cody Levien, Garth Howell, Tomás Tûma
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Patent number: 10620142Abstract: A method of operating a charged particle microscope comprising: Providing a specimen on a specimen holder; Using a source to produce a beam of charged particles, and irradiating the specimen with said beam; Using a detector to detect X-ray radiation emanating from the specimen in response to said irradiation, and to produce a spectrum comprising X-ray characteristic peaks on a Bremsstrahlung background, comprising the following additional steps: Using an elemental decomposition algorithm to analyze the characteristic peaks in said spectrum, thereby determining a reference group of major chemical elements contributing to the spectrum; Calculating an average atomic number for said reference group, and using this in a predictive model to generate a calculated Bremsstrahlung profile for the reference group; Fitting said calculated Bremsstrahlung profile to the Bremsstrahlung background in said spectrum, and attributing a discrepancy between the latter and the former to a residual element absent from, or incType: GrantFiled: October 29, 2018Date of Patent: April 14, 2020Assignee: FEI CompanyInventors: Michael James Owen, Ashley Donaldson
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Publication number: 20190172681Abstract: A method of operating a charged particle microscope comprising: Providing a specimen on a specimen holder; Using a source to produce a beam of charged particles, and irradiating the specimen with said beam; Using a detector to detect X-ray radiation emanating from the specimen in response to said irradiation, and to produce a spectrum comprising X-ray characteristic peaks on a Bremsstrahlung background, comprising the following additional steps: Using an elemental decomposition algorithm to analyze the characteristic peaks in said spectrum, thereby determining a reference group of major chemical elements contributing to the spectrum; Calculating an average atomic number for said reference group, and using this in a predictive model to generate a calculated Bremsstrahlung profile for the reference group; Fitting said calculated Bremsstrahlung profile to the Bremsstrahlung background in said spectrum, and attributing a discrepancy between the latter and the former to a residual element absent from, or incoType: ApplicationFiled: October 29, 2018Publication date: June 6, 2019Inventors: Michael James OWEN, Ashley DONALDSON
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Patent number: 9778215Abstract: The present invention discloses a combination of two existing approaches for mineral analysis and makes use of the Similarity Metric Invention, that allows mineral definitions to be described in theoretical compositional terms, meaning that users are not required to find examples of each mineral, or adjust rules. This system allows untrained operators to use it, as opposed to previous systems, which required extensive training and expertise.Type: GrantFiled: October 26, 2012Date of Patent: October 3, 2017Assignee: FEI CompanyInventors: Michael James Owen, Michael Buhot
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Patent number: 9734986Abstract: Mineral definitions each include a list of elements, each of the elements having a corresponding standard spectrum. To determine the composition of an unknown mineral sample, the acquired spectrum of the sample is sequentially decomposed into the standard spectra of the elements from the element list of each of the mineral definitions, and a similarity metric computed for each mineral definition. The unknown mineral is identified as the mineral having the best similarity metric.Type: GrantFiled: June 2, 2015Date of Patent: August 15, 2017Assignee: FEI CompanyInventors: Michael James Owen, Michael Buhot
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Patent number: 9719950Abstract: A method and apparatus are provided for identifying a material with a sample-specific reference spectral list or library. A sequential approach to SEM-EDS automated mineralogy classification is carried out by performing two or more material classification analyses. A pre-classification step restricts the processing of spectra deconvolution algorithms to a subset of spectra that pass a dominant mineral criteria resulting in a significantly reduced subset of reference spectra that occur within the measured sample in pure enough form at a given minimum quantity. The following complex classification stages involving deconvolution of multiple constituents within measured spectra is based on this sample relevant subset.Type: GrantFiled: February 25, 2015Date of Patent: August 1, 2017Assignee: FEI CompanyInventors: Michael James Owen, Ashley Donaldson, Garth Howell, Phillip John Christopher Parker
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Patent number: 9714908Abstract: Method and apparatus for analysis and display of fine grained mineral samples. A portion of the sample is illuminated with a charged particle beam. Emitted radiation is detected, and a sample emission spectrum is generated and fit with a plurality of standard emission spectra of minerals in a candidate mineral composition. A mineral composition whose emission spectrum best fits the sample emission spectrum is selected from a plurality of candidate mineral compositions. An assigned color is received for each mineral in the selected mineral composition, and the assigned colors are blended according to the proportion of each mineral in the selected mineral composition. An image pixel corresponding to the portion of the sample is rendered for display.Type: GrantFiled: November 6, 2013Date of Patent: July 25, 2017Assignee: FEI CompanyInventors: Michael James Owen, Garth Howell, Ashley Donaldson
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Patent number: 9495786Abstract: Optimized blending mode for mineralogy images. A luminosity value is determined for a pixel in a base layer or top layer mineralogy image. An image weighting value is determined from the luminosity value and an optional mixing parameter. A multiply value is determined by multiplying the base and top layer pixel values. An overlay value is determined from twice the multiply value if the value of one of the base layer or top layer pixel values is over a threshold, otherwise it is determined by inverting twice the product of the inverted top layer pixel value with the inverted base layer pixel value. A blended image pixel value is determined by adding the multiply value weighted with the image weighting value and the overlay value weighted with the inverted image weighting value.Type: GrantFiled: November 9, 2015Date of Patent: November 15, 2016Assignee: FEI COMPANInventors: Garth Howell, Michael James Owen, Leonardo Salazar, David Haberlah, Eric Goergen
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Publication number: 20160245762Abstract: A method and apparatus are provided for identifying a material with a sample-specific reference spectral list or library. A sequential approach to SEM-EDS automated mineralogy classification is carried out by performing two or more material classification analyses. A pre-classification step restricts the processing of spectra deconvolution algorithms to a subset of spectra that pass a dominant mineral criteria resulting in a significantly reduced subset of reference spectra that occur within the measured sample in pure enough form at a given minimum quantity. The following complex classification stages involving deconvolution of multiple constituents within measured spectra is based on this sample relevant subset.Type: ApplicationFiled: February 25, 2015Publication date: August 25, 2016Applicant: FEI CompanyInventors: Michael James Owen, Ashley Donaldson, Garth Howell, Phillip John Christopher Parker
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Publication number: 20160063749Abstract: Optimized blending mode for mineralogy images. A luminosity value is determined for a pixel in a base layer or top layer mineralogy image. An image weighting value is determined from the luminosity value and an optional mixing parameter. A multiply value is determined by multiplying the base and top layer pixel values. An overlay value is determined from twice the multiply value if the value of one of the base layer or top layer pixel values is over a threshold, otherwise it is determined by inverting twice the product of the inverted top layer pixel value with the inverted base layer pixel value. A blended image pixel value is determined by adding the multiply value weighted with the image weighting value and the overlay value weighted with the inverted image weighting value.Type: ApplicationFiled: November 9, 2015Publication date: March 3, 2016Applicant: FEI CompanyInventors: Garth Howell, Michael James Owen, Leonardo Salazar, David Haberlah, Eric Goergen
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Publication number: 20150338358Abstract: Mineral definitions each include a list of elements, each of the elements having a corresponding standard spectrum. To determine the composition of an unknown mineral sample, the acquired spectrum of the sample is sequentially decomposed into the standard spectra of the elements from the element list of each of the mineral definitions, and a similarity metric computed for each mineral definition. The unknown mineral is identified as the mineral having the best similarity metric.Type: ApplicationFiled: June 2, 2015Publication date: November 26, 2015Inventors: Michael James Owen, Michael Buhot
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Patent number: 9188555Abstract: This invention relates to a method and system for determining the composition of an unknown sample. The present invention is directed to a method of calibrating an x-ray spectrometer that does not require measuring all possible elements under the operating conditions used to measure the unknown sample to be analyzed. According to a preferred embodiment, the local instrument can be calibrated from an x-ray spectrum of a single elemental standard. The instrument will have a stored library containing high quality spectra for all elements being analyzed. The analysis of the single element is compared to the library spectra for that element to define a transformation that is used to create a calibrated spectra library that includes a calibrated spectrum for each spectrum in the original library. The spectra generated by the local instrument can be compared to the calibrated library spectra to determine the elements in an unknown mineral.Type: GrantFiled: July 30, 2012Date of Patent: November 17, 2015Assignee: FEI CompanyInventor: Michael James Owen
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Patent number: 9183656Abstract: Optimized blending mode for mineralogy images. A luminosity value is determined for a pixel in a base layer or top layer mineralogy image. An image weighting value is determined from the luminosity value and an optional mixing parameter. A multiply value is determined by multiplying the base and top layer pixel values. An overlay value is determined from twice the multiply value if the value of one of the base layer or top layer pixel values is over a threshold, otherwise it is determined by inverting twice the product of the inverted top layer pixel value with the inverted base layer pixel value. A blended image pixel value is determined by adding the multiply value weighted with the image weighting value and the overlay value weighted with the inverted image weighting value.Type: GrantFiled: March 11, 2014Date of Patent: November 10, 2015Assignee: FEI CompanyInventors: Garth Howell, Michael James Owen, Leonardo Salazar, David Haberlah, Eric Goergen
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Publication number: 20150262400Abstract: Optimized blending mode for mineralogy images. A luminosity value is determined for a pixel in a base layer or top layer mineralogy image. An image weighting value is determined from the luminosity value and an optional mixing parameter. A multiply value is determined by multiplying the base and top layer pixel values. An overlay value is determined from twice the multiply value if the value of one of the base layer or top layer pixel values is over a threshold, otherwise it is determined by inverting twice the product of the inverted top layer pixel value with the inverted base layer pixel value. A blended image pixel value is determined by adding the multiply value weighted with the image weighting value and the overlay value weighted with the inverted image weighting value.Type: ApplicationFiled: March 11, 2014Publication date: September 17, 2015Applicant: FEI CompanyInventors: Garth Howell, Michael James Owen, Leonardo Salazar, David Haberlah, Eric Goergen
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Patent number: 9091635Abstract: Determining the composition of a mineral sample entails comparing measurements of a sample to mineral definitions and determining a similarity metric. The mineral definition includes a subspace of compositional values defined by end members. The similarity metric is related to a projection of the measured data point onto the subspace or onto an extension of the subspace.Type: GrantFiled: October 26, 2012Date of Patent: July 28, 2015Assignee: FEI COMPANYInventor: Michael James Owen
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Patent number: 9048067Abstract: Mineral definitions each include a list of elements, each of the elements having a corresponding standard spectrum. To determine the composition of an unknown mineral sample, the acquired spectrum of the sample is sequentially decomposed into the standard spectra of the elements from the element list of each of the mineral definitions, and a similarity metric computed for each mineral definition. The unknown mineral is identified as the mineral having the best similarity metric.Type: GrantFiled: October 26, 2012Date of Patent: June 2, 2015Assignee: FEI COMPANYInventor: Michael James Owen
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Publication number: 20150122992Abstract: Method and apparatus for analysis and display of fine grained mineral samples. A portion of the sample is illuminated with a charged particle beam. Emitted radiation is detected, and a sample emission spectrum is generated and fit with a plurality of standard emission spectra of minerals in a candidate mineral composition. A mineral composition whose emission spectrum best fits the sample emission spectrum is selected from a plurality of candidate mineral compositions. An assigned color is received for each mineral in the selected mineral composition, and the assigned colors are blended according to the proportion of each mineral in the selected mineral composition. An image pixel corresponding to the portion of the sample is rendered for display.Type: ApplicationFiled: November 6, 2013Publication date: May 7, 2015Applicant: FEI CompanyInventors: Michael James Owen, Garth Howell, Ashley Donaldson
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Patent number: 8937282Abstract: An improved mineral analysis system includes mineral definitions that include not only characteristics of the minerals, but also variability in those characteristics. The variabilities allow the calculation of ranges of expected values for different quality of measurements, for example, for different numbers of x-ray counts. Match probabilities can therefore be calculated to more accurately determine the composition of a mineral sample.Type: GrantFiled: October 26, 2012Date of Patent: January 20, 2015Assignee: FEI CompanyInventors: Michael James Owen, Michael Buhot
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Patent number: 8880356Abstract: A method and system for spectrum data analysis. The method comprises the steps of collecting a spectrum of an unknown material; providing a set of data templates; calculating weighting factors for the element data templates to minimize error in approximating the spectrum; removing one or more of the templates having negative weights in approximating the spectrum; and re-calculating an approximation of the spectrum with said one or more templates removed. Embodiments of the invention are suitable for analyzing noisy spectra having relatively few data points.Type: GrantFiled: February 6, 2009Date of Patent: November 4, 2014Assignee: Fei CompanyInventors: Daniel Roy Corbett, Paul Gottlieb, Andrew Harley Menzies, Michael James Owen