Abstract: A brain computer interface for interfacing with a brain of a subject is provided. The brain computer interface includes one or more shanks. Each shank includes an array of pixels and output traces. Each pixel includes an electrode and a front-end circuit positioned at a site of the electrode. The front-end circuit is configured to reduce noise in signals recorded by the electrode, and further configured to multiplex the signals. A density of power consumption of the each pixel is equal to or less than 1 ?W per area of 50 ?m by 50 ?m. The output traces are electrically coupled with the array of pixels. A number of output traces is less than a number of pixels in the array due to multiplexing. The one or more shanks are configured to be inserted on and/or into a brain of a subject.

Abstract: Test device having a signal input with a positive pin and a negative pin, between which an-input signal may be applied. Test device has a separation unit which is connected to the positive pin and to the negative pin and is configured to separate a positive signal component in the form of a positive track from the input signal, to output said signal component at a first pin, to separate a negative signal component in the form of a negative track from the input signal and to output said signal component at a second pin. The use of the test device to test a control unit of the switching device is described, wherein the test device simulates the switching device, the signal input of the test device is connected to the control unit and the control unit outputs an input signal to the signal input.

Abstract: Test device having a signal input with a positive pin and a negative pin, between which an-input signal may be applied. Test device has a separation unit which is connected to the positive pin and to the negative pin and is configured to separate a positive signal component in the form of a positive track from the input signal, to output said signal component at a first pin, to separate a negative signal component in the form of a negative track from the input signal and to output said signal component at a second pin. The use of the test device to test a control unit of the switching device is described, wherein the test device simulates the switching device, the signal input of the test device is connected to the control unit and the control unit outputs an input signal to the signal input.

Abstract: A testing device for testing a control unit of a switching device of an electrical switchgear installation. The testing device has a signal input, and to which a controlled current sink is provided, which is connected to the signal input. The controlled current sink shunts an input current from the signal input in order to provide a dynamically adjustable input impedance. A method for testing a control unit of a switching device of a switchgear installation, includes the testing device having a signal input, to which an input voltage may be applied. In the testing device, a controlled current sink shuts an input current from the signal input and thus provides a dynamically adjustable input impedance.

Abstract: In order to test substations from different manufacturers and of different types in a simple manner, it is provided that a control unit (6) for a switching device (5) of a substation (4) is connected via an adapter cable (11) to a test device (10), which simulates the switching device (5) for the test and the test device (10) reads configuration-specific data from a memory unit (15) on the adapter cable (11) and the test unit (10) thus configures its signal inputs (BE) and signal outputs (BA, AA) that are required for conducting the test.

Abstract: A testing device for testing a control unit of a switching device of an electrical switchgear installation. The testing device has a signal input, and to which a controlled current sink is provided, which is connected to the signal input. The controlled current sink shunts an input current from the signal input in order to provide a dynamically adjustable input impedance. A method for testing a control unit of a switching device of a switchgear installation, includes the testing device having a signal input, to which an input voltage may be applied. In the testing device, a controlled current sink shuts an input current from the signal input and thus provides a dynamically adjustable input impedance.

Abstract: In order to test substations from different manufacturers and of different types in a simple manner, it is provided that a control unit (6) for a switching device (5) of a substation (4) is connected via an adapter cable (11) to a test device (10), which simulates the switching device (5) for the test and the test device (10) reads configuration-specific data from a memory unit (15) on the adapter cable (11) and the test unit (10) thus configures its signal inputs (BE) and signal outputs (BA, AA) that are required for conducting the test.

Abstract: The present invention relates to a method (600) for data transfer via a communication device (100). The communication device (100) is configured to receive data via an input (Rx, A), to output the received data via an output (Tx, B) of the communication device (100), and to output additional data via the output (Tx, B). In the course of the method, data are received via the input (Rx, A) and are stored temporarily in an intermediate data memory (110). The intermediate data memory (110) has a predetermined size. Moreover, the data stored temporarily are output via the output (Tx, B). In addition, a size of a data area not used by the received data in the intermediate data memory (110) is determined, and additional data are output via the output (Tx, B) in a manner depending on this size.