Abstract: A measurement device for the three-dimensional optical measurement of objects with a topometric sensor includes at least one projection unit for projecting a pattern onto an object and at least one image recording unit for recording the pattern that is scattered back from the object. The projection unit has a laser-light source and a pattern generator to which the laser light radiation from the laser-light source can be supplied. The laser-light source has at least one multi-laser-chip device having a plurality of laser diode chips in a common multi-laser-chip package, wherein the laser diode chips are attached to a mounting surface of the multi-laser-chip package and are in thermal communication with the multi-laser-chip package via the mounting surface.