Patents by Inventor Michael Jon Hale

Michael Jon Hale has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20260043799
    Abstract: A system comprised of an apparatus and a test device is described. The test device and the apparatus are designed to interact to determine the presence or absence of an analyte of interest in a sample placed on the test device. The test device and apparatus interact to provide a timer feature for determining a test device specific adjustable cut-off value that is used to ascertain whether signal from a test line in the device corresponds to a positive or negative results, irrespective of the time elapsed since placement of sample on the test device. The adjustable cut-off value renders the system relatively insensitive to incubation time of the test device, where if the incubation time is shorter or longer than needed for accuracy of a test result, the analyzer will report an invalid result, thus preventing the reporting of an incorrect (false negative or false positive) result.
    Type: Application
    Filed: October 22, 2025
    Publication date: February 12, 2026
    Inventors: Rhys de Callier, Richard L. Egan, William J. Ferenczy, Michael Jon Hale
  • Patent number: 12474333
    Abstract: A system comprised of an apparatus and a test device is described. The test device and the apparatus are designed to interact to determine the presence or absence of an analyte of interest in a sample placed on the test device. The test device and apparatus interact to provide a timer feature for determining a test device specific adjustable cut-off value that is used to ascertain whether signal from a test line in the device corresponds to a positive or negative results, irrespective of the time elapsed since placement of sample on the test device. The adjustable cut-off value renders the system relatively insensitive to incubation time of the test device, where if the incubation time is shorter or longer than needed for accuracy of a test result, the analyzer will report an invalid result, thus preventing the reporting of an incorrect (false negative or false positive) result.
    Type: Grant
    Filed: June 9, 2021
    Date of Patent: November 18, 2025
    Assignee: Ortho-Clinical Diagnostics, Inc.
    Inventors: Rhys L. de Callier, Richard L. Egan, William J. Ferenczy, Michael Jon Hale
  • Publication number: 20210389316
    Abstract: A system comprised of an apparatus and a test device is described. The test device and the apparatus are designed to interact to determine the presence or absence of an analyte of interest in a sample placed on the test device.
    Type: Application
    Filed: August 26, 2021
    Publication date: December 16, 2021
    Inventors: Richard L. Egan, Michael Jon Hale, Jhobe Steadman
  • Patent number: 11131666
    Abstract: A system comprised of an apparatus and a test device is described. The test device and the apparatus are designed to interact to determine the presence or absence of an analyte of interest in a sample placed on the test device.
    Type: Grant
    Filed: March 8, 2019
    Date of Patent: September 28, 2021
    Assignee: Quidel Corporation
    Inventors: Richard L. Egan, Michael Jon Hale, Jhobe Steadman
  • Publication number: 20210293793
    Abstract: A system comprised of an apparatus and a test device is described. The test device and the apparatus are designed to interact to determine the presence or absence of an analyte of interest in a sample placed on the test device. The test device and apparatus interact to provide a timer feature for determining a test device specific adjustable cut-off value that is used to ascertain whether signal from a test line in the device corresponds to a positive or negative results, irrespective of the time elapsed since placement of sample on the test device. The adjustable cut-off value renders the system relatively insensitive to incubation time of the test device, where if the incubation time is shorter or longer than needed for accuracy of a test result, the analyzer will report an invalid result, thus preventing the reporting of an incorrect (false negative or false positive) result.
    Type: Application
    Filed: June 9, 2021
    Publication date: September 23, 2021
    Inventors: Rhys L. de Callier, Richard L. Egan, William J. Ferenczy, Michael Jon Hale
  • Patent number: 11061020
    Abstract: A system comprised of an apparatus and a test device is described. The test device and the apparatus are designed to interact to determine the presence or absence of an analyte of interest in a sample placed on the test device. The test device and apparatus interact to provide a timer feature for determining a test device specific adjustable cut-off value that is used to ascertain whether signal from a test line in the device corresponds to a positive or negative results, irrespective of the time elapsed since placement of sample on the test device. The adjustable cut-off value renders the system relatively insensitive to incubation time of the test device, where if the incubation time is shorter or longer than needed for accuracy of a test result, the analyzer will report an invalid result, thus preventing the reporting of an incorrect (false negative or false positive) result.
    Type: Grant
    Filed: March 1, 2013
    Date of Patent: July 13, 2021
    Assignee: Quidel Corporation
    Inventors: Rhys de Callier, Richard L. Egan, William J. Ferenczy, Michael Jon Hale
  • Publication number: 20190271695
    Abstract: A system comprised of an apparatus and a test device is described. The test device and the apparatus are designed to interact to determine the presence or absence of an analyte of interest in a sample placed on the test device.
    Type: Application
    Filed: March 8, 2019
    Publication date: September 5, 2019
    Inventors: Richard L. Egan, Michael Jon Hale, Jhobe Steadman
  • Patent number: 10281462
    Abstract: A system comprised of an apparatus and a test device is described. The test device and the apparatus are designed to interact to determine the presence or absence of an analyte of interest in a sample placed on the test device.
    Type: Grant
    Filed: November 4, 2015
    Date of Patent: May 7, 2019
    Assignee: Quidel Corporation
    Inventors: Richard L. Egan, Michael Jon Hale, Jhobe Steadman
  • Publication number: 20160054316
    Abstract: A system comprised of an apparatus and a test device is described. The test device and the apparatus are designed to interact to determine the presence or absence of an analyte of interest in a sample placed on the test device.
    Type: Application
    Filed: November 4, 2015
    Publication date: February 25, 2016
    Inventors: Richard L. Egan, Michael Jon Hale, Jhobe Steadman
  • Patent number: 9207181
    Abstract: A system comprised of an apparatus and a test device is described. The test device and the apparatus are designed to interact to determine the presence or absence of an analyte of interest in a sample placed on the test device.
    Type: Grant
    Filed: March 1, 2013
    Date of Patent: December 8, 2015
    Assignee: Quidel Corporation
    Inventors: Richard L. Egan, Michael Jon Hale, Jhobe Steadman
  • Publication number: 20130230845
    Abstract: A system comprised of an apparatus and a test device is described. The test device and the apparatus are designed to interact to determine the presence or absence of an analyte of interest in a sample placed on the test device. The test device and apparatus interact to provide a timer feature for determining a test device specific adjustable cut-off value that is used to ascertain whether signal from a test line in the device corresponds to a positive or negative results, irrespective of the time elapsed since placement of sample on the test device. The adjustable cut-off value renders the system relatively insensitive to incubation time of the test device, where if the incubation time is shorter or longer than needed for accuracy of a test result, the analyzer will report an invalid result, thus preventing the reporting of an incorrect (false negative or false positive) result.
    Type: Application
    Filed: March 1, 2013
    Publication date: September 5, 2013
    Applicant: Quidel Corporation
    Inventors: Richard L. Egan, Michael Jon Hale
  • Publication number: 20130230844
    Abstract: A system comprised of an apparatus and a test device is described. The test device and the apparatus are designed to interact to determine the presence or absence of an analyte of interest in a sample placed on the test device.
    Type: Application
    Filed: March 1, 2013
    Publication date: September 5, 2013
    Applicant: Quidel Corporation
    Inventors: Richard L. Egan, Michael Jon Hale, Jhobe Steadman