Patents by Inventor Michael Kaltenbach

Michael Kaltenbach has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11972259
    Abstract: A machine instruction to find a condition location within registers, such as vector registers. The machine instruction has associated therewith a register to be examined and a result location. The register includes a plurality of elements. In execution, the machine instruction counts a number of contiguous elements of the plurality of elements of the register having a particular value in a selected location within the contiguous elements. Other locations within the contiguous elements are ignored for the counting. The counting provides a count placed in the result location.
    Type: Grant
    Filed: July 3, 2019
    Date of Patent: April 30, 2024
    Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
    Inventors: Michael K. Gschwind, Markus Kaltenbach, Jentje Leenstra, Brett Olsson
  • Patent number: 11972260
    Abstract: A machine instruction to find a condition location within registers, such as vector registers. The machine instruction has associated therewith a register to be examined and a result location. The register includes a plurality of elements. In execution, the machine instruction counts a number of contiguous elements of the plurality of elements of the register having a particular value in a selected location within the contiguous elements. Other locations within the contiguous elements are ignored for the counting. The counting provides a count placed in the result location.
    Type: Grant
    Filed: July 3, 2019
    Date of Patent: April 30, 2024
    Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
    Inventors: Michael K. Gschwind, Markus Kaltenbach, Jentje Leenstra, Brett Olsson
  • Patent number: 10739399
    Abstract: A measurement apparatus and method for measurement of a radio frequency (RF) signal, said measurement apparatus comprising a signal input adapted to receive an RF-signal being split into a first measurement signal path and into a second measurement signal path of said measurement apparatus, wherein said first measurement signal path is adapted to measure the split RF-signal within a predefined first frequency band around a predefined measurement frequency, wherein said second measurement signal path is adapted to measure a current frequency at a power maximum of the split RF-signal in a predefined second frequency band, and wherein the RF-signal measured in said first measurement signal path is shifted in the frequency domain depending on the current frequency measured in said second measurement signal path.
    Type: Grant
    Filed: March 29, 2018
    Date of Patent: August 11, 2020
    Assignee: ROHDE & SCHWARZ & CO. KG
    Inventors: Georg Schnattinger, Marcel Thränhardt, Michael Kaltenbach
  • Patent number: 10693570
    Abstract: A device for analyzing a radio frequency signal is described. The device comprises an analyzing module that is configured to analyze input data relating to a multicarrier radio frequency signal with at least two carrier frequencies. The multicarrier analyzing module is further configured to calculate at least one of an optimized intermediate frequency and an optimized local oscillator frequency based on the input data. In addition, a method of analyzing a radio frequency signal is described.
    Type: Grant
    Filed: August 20, 2018
    Date of Patent: June 23, 2020
    Assignee: Rohde & Schwarz GmbH & Co. KG
    Inventors: Marcel Thraenhardt, Michael Kaltenbach, Georg Schnattinger
  • Publication number: 20200059307
    Abstract: A device for analyzing a radio frequency signal is described. The device comprises an analyzing module that is configured to analyze input data relating to a multicarrier radio frequency signal with at least two carrier frequencies. The multicarrier analyzing module is further configured to calculate at least one of an optimized intermediate frequency and an optimized local oscillator frequency based on the input data. In addition, a method of analyzing a radio frequency signal is described.
    Type: Application
    Filed: August 20, 2018
    Publication date: February 20, 2020
    Applicant: Rohde & Schwarz GmbH & Co. KG
    Inventors: Marcel Thraenhardt, Michael Kaltenbach, Georg Schnattinger
  • Publication number: 20190302173
    Abstract: A measurement apparatus and method for measurement of a radio frequency, RF, signal, said measurement apparatus comprising a signal input adapted to receive an RF-signal being split into a first measurement signal path and into a second measurement signal path of said measurement apparatus, wherein said first measurement signal path is adapted to measure the split RF-signal within a predefined first frequency band around a predefined measurement frequency, wherein said second measurement signal path is adapted to measure a current frequency at a power maximum of the split RF-signal in a predefined second frequency band, and wherein the RF-signal measured in said first measurement signal path is shifted in the frequency domain depending on the current frequency measured in said second measurement signal path.
    Type: Application
    Filed: March 29, 2018
    Publication date: October 3, 2019
    Inventors: Georg Schnattinger, Marcel Thränhardt, Michael Kaltenbach
  • Publication number: 20190118219
    Abstract: A method of providing a metallically reflective surface on a substrate includes applying a primer layer to the substrate, mixing a solution of silver salt with a reducing agent and spraying the solution onto the primer layer to form a silver layer, and applying at least one transparent or translucent top coat layer or at least one clear coat layer onto the silver layer, wherein the primer contains a corrosion inhibitor selected from the group consisting of benzotriazole, tolyltriazole, benzimidazole, derivatives of the compounds and mixtures of two or more of the compounds and/or derivatives.
    Type: Application
    Filed: May 9, 2017
    Publication date: April 25, 2019
    Inventors: Markus Schmidtchen, Jürgen Ortmeier, Michael Kaltenbach
  • Publication number: 20080014661
    Abstract: A method for the manufacture of solar panels from scrapped wafers and/or scrapped dies is provided, including the following steps: identifying scrap wafers and/or scrap dies; cleaning and removing remaining structures from the surface of the wafers/dies; grinding both surfaces of the wafers/dies down to a required thickness; doping the wafers/dies; and further processing the wafers/dies using a solar panel manufacturing method.
    Type: Application
    Filed: July 11, 2007
    Publication date: January 17, 2008
    Inventors: Michael Haag, Michael Kaltenbach, Udo Kleemann, Rainer Krause, Douglas J. Murray, Gerd Pfeiffer, Markus Schmidt
  • Publication number: 20050159973
    Abstract: A system handling fully automated supplier quality control and enabling quality improvement by using supplier raw data as well as manufacturer manufacturing in-line data is described. The system not only maintains fully automated data transfers and handling, but also enables immediate automated reporting for both the manufacturer and the supplier. Based on this automated notification, communication between sides is thus introduced. The system also enables the transfer from reactive into preventive working mode, concerning supplier quality, giving advantages like early warning, fast feedback. Beyond the so-called automated quality control features, the system supports quality improvement enabling advanced analysis features like yield prediction, specification validation, best of breed analysis, and the like. These capabilities include a close feedback control loop with an adaptation feature to correct the prediction in case of a deviation and/or trend.
    Type: Application
    Filed: December 22, 2004
    Publication date: July 21, 2005
    Applicant: International Business Machines Corporation
    Inventors: Rainer Krause, Christian Waldenmaier, Udo Kleemann, Michael Kaltenbach, Thomas Fleck
  • Publication number: 20030046193
    Abstract: A system and a corresponding method for the logistic management of supply chains of digitally networked suppliers, wherein supply chain participants that are linked directly within the supply chain are identified and grouped, and wherein, on the side of each of the grouped supply chain participants, logistic requirements for fulfilling local supply activities to the other supply chain participant of the group are determined, logistic information between those two supply chain participants exchanged, and the local logistic requirements on the side of each of the grouped supply chain participants dependent on the contents of the exchanged logistic information controlled. The invention enables decentralized management with considerable less efforts than conventional approaches, wherein collaboration and replenishment between collaborating suppliers are accomplished using a network like the Intranet or Internet.
    Type: Application
    Filed: June 5, 2002
    Publication date: March 6, 2003
    Applicant: International Business Machines Corporation
    Inventors: Peter Aschick, Thomas Fleck, Michael Kaltenbach, Udo Kleemann, Norbert Liebisch