Patents by Inventor Michael Keith Fuller

Michael Keith Fuller has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11844641
    Abstract: An x-ray tube source is disclosed that allows differential phase shift, attenuation, and x-ray scattering features of an object to be acquired in a single exposure. Such multiplexed x-ray tube source includes multiple x-ray spot origins controlled in such a way that each slightly separated spot is temporally modulated “ON and OFF” at differing frequencies. In an x-ray interferometer system, such x-ray tube source forms multiple illumination beams of a single angular view of an object's feature but each with different interference fringe locations. A composite image can be acquired with a high frame-rate digital detector as a component element in such x-ray interferometer system. Such composite image can be subsequently de-multipexed and separately presented according to each spot-source illumination beam.
    Type: Grant
    Filed: July 12, 2021
    Date of Patent: December 19, 2023
    Inventor: Michael Keith Fuller
  • Publication number: 20220328277
    Abstract: An x-ray tube source is disclosed that allows differential phase shift, attenuation, and x-ray scattering features of an object to be acquired in a single exposure. Such multiplexed x-ray tube source includes multiple x-ray spot origins controlled in such a way that each slightly separated spot is temporally modulated “ON and OFF” at differing frequencies. In an x-ray interferometer system, such x-ray tube source forms multiple illumination beams of a single angular view of an object's feature but each with different interference fringe locations. A composite image can be acquired with a high frame-rate digital detector as a component element in such x-ray interferometer system. Such composite image can be subsequently de-multipexed and separately presented according to each spot-source illumination beam.
    Type: Application
    Filed: July 12, 2021
    Publication date: October 13, 2022
    Inventor: Michael Keith Fuller
  • Patent number: 9887087
    Abstract: A method of manufacturing p-n junction in semiconductor material such that small dimensions of such junctions are maintained, and associated lattice dislocations of such junctions may be preferentially maintained, and devices with such patterned semiconductor material, is disclosed. Typically, a neutron moderator is used to slow fast neutrons to thermal energies. A mask made from thermal neutron absorbing material, such as cadmium, is placed in close proximity to such neutron moderator. Thermal neutron focusing optics, such as compound refractive lenses, are used to collect and focus thermal neutrons emitted from the mask such that the pattern or portion of the pattern is transferred to the silicon body, with neutrons transmitted from the window areas in the mask and through the neutron optic so as to form the donor dopant concentration for the n-type regions by transmutation of silicon atoms into phosphorus.
    Type: Grant
    Filed: July 8, 2014
    Date of Patent: February 6, 2018
    Inventor: Michael Keith Fuller
  • Patent number: 9412481
    Abstract: A method and device is disclosed for the generation of high-contrast, localized sinusoidal patterns or stepped-intensity modulated patterns from spatially non-coherent or coherent illumination, and using such patterns for imaging the internal features of objects.
    Type: Grant
    Filed: January 22, 2014
    Date of Patent: August 9, 2016
    Inventor: Michael Keith Fuller
  • Patent number: 7505561
    Abstract: A system for observing the internal features of an object, such that the object's internal absorption, refraction, reflection and/or scattering properties are visualized, is disclosed. An embodiment may include one or more beams of penetrating radiation, an object with internal features to be imaged, a single or an array of radiation optics, and a detection system for capturing the resultant shadowgraph images. The beam(s) of radiation transmitted through the object typically originate from a line-shaped source(s), which has high spatial purity along the narrow axis, and low spatial purity in the perpendicular, long axis. In the long axis, radiation optic(s) capture and focus diverging rays exiting from the object to form a high resolution image of the object, without which optic(s) the shadowgraph would have blurring in this axis.
    Type: Grant
    Filed: November 17, 2007
    Date of Patent: March 17, 2009
    Inventor: Michael Keith Fuller
  • Publication number: 20090060134
    Abstract: A system for observing the internal features of an object, such that the object's internal absorption, refraction, reflection and/or scattering properties are visualized, is disclosed. An embodiment may include one or more beams of penetrating radiation, an object with internal features to be imaged, a single or an array of radiation optics, and a detection system for capturing the resultant shadowgraph images. The beam(s) of radiation transmitted through the object typically originate from a line-shaped source(s), which has high spatial purity along the narrow axis, and low spatial purity in the perpendicular, long axis. In the long axis, radiation optic(s) capture and focus diverging rays exiting from the object to form a high resolution image of the object, without which optic(s) the shadowgraph would have blurring in this axis.
    Type: Application
    Filed: November 17, 2007
    Publication date: March 5, 2009
    Inventor: Michael Keith Fuller