Patents by Inventor Michael KUPNIEWSKI

Michael KUPNIEWSKI has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Contactor arrangement, IC test handler and IC test arrangement
    Patent number: 9791504
    Abstract: Contactor arrangement of an IC test handler, comprising: a contactor unit which has test contacts for contacting an IC in test and for temporarily pressing the IC against the test contacts, a plunger head, which has a recessed central region corresponding to the geometrical configuration of the IC, such that those surface of the IC which is adjacent to the upper surface of the plunger head does not touch the plunger head surface, and a contactor unit interface, which includes a vacuum suction system for actively attracting the IC to an IC contact surface of the contactor unit interface, that corresponds with an adjacent surface of the IC having IC device contacts and, thus, towards the test contacts of the contactor unit.
    Type: Grant
    Filed: July 2, 2015
    Date of Patent: October 17, 2017
    Assignee: RASCO GMBH
    Inventors: Michael Kupniewski, Christian Wammetsberger, Josef Mayer, Rainer Hittmann
  • Contactor Arrangement, IC Test Handler and IC Test Arrangement
    Publication number: 20160003897
    Abstract: Contactor arrangement of an IC test handler, comprising: a contactor unit which has test contacts for contacting an IC in test and for temporarily pressing the IC against the test contacts, a plunger head, which has a recessed central region corresponding to the geometrical configuration of the IC, such that those surface of the IC which is adjacent to the upper surface of the plunger head does not touch the plunger head surface, and a contactor unit interface, which includes a vacuum suction system for actively attracting the IC to an IC contact surface of the contactor unit interface, that corresponds with an adjacent surface of the IC having IC device contacts and, thus, towards the test contacts of the contactor unit.
    Type: Application
    Filed: July 2, 2015
    Publication date: January 7, 2016
    Inventors: Michael KUPNIEWSKI, Christian WAMMETSBERGER, Josef MAYER, Rainer HITTMANN