Patents by Inventor Michael L. Abrams

Michael L. Abrams has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7114366
    Abstract: A system for acquiring environmental information measurements. The 5 system (100) utilize a sensor, (205) a front-end circuit, (310) a loop filter (315), a switch controller (206), and a reduced-order loop control circuit to provide reliable data measurements while providing robust system behavior. The system further includes a sensor simulator (330) for simulating the operation of the sensor (205) and testing the operation of the front-end circuit (310) and the loop filter (315).
    Type: Grant
    Filed: March 16, 2000
    Date of Patent: October 3, 2006
    Assignee: Input / Output Inc.
    Inventors: Ben Jones, Scott T. Dupuie, Jeffrey Allen Blackburn, Richard A. Johnson, Michael L. Abrams, James Broseghini, Mauricio A. Zavaleta, Mark E. Burchfield, Roger Maher, Burton A. Devolk, Frank Mayo
  • Patent number: 6101864
    Abstract: A high performance method and apparatus for testing a closed loop transducer is disclosed. A test bitstream signal is combined with a .SIGMA..DELTA. feedback bitstream of the transducer to produce a combined bitstream which is converted to a physical feedback to the sensor of the transducer. The .SIGMA..DELTA. bitstream output of the transducer is recorded for later analysis so as to test characteristics of the transducer. The test bitstream signal is preferably an oversampled, pulse density modulated signal. A testing arrangement is provided which is based upon the storage of short-length test patterns which are repetitively accessed to form a continuous test pattern. The test bitstream provided by the method of the invention produces very low noise and low distortion test signals where a repetitive test pattern is equivalent in length to one period of the test signal.
    Type: Grant
    Filed: December 17, 1997
    Date of Patent: August 15, 2000
    Assignee: I/O Sensors, Inc.
    Inventors: Michael L. Abrams, Ben W. Jones, Franklin W. Mayo, Scott T. Dupuie, Jeffery C. Gannon, Richard A. Johnson
  • Patent number: 6035694
    Abstract: A method and apparatus for measuring and compensating for stray capacitance of a micro-machined sensor of an accelerometer system is disclosed. Stray capacitance differences between a top plate and a sensing element and between a bottom plate and the sensing element degrade accelerometer performance if not compensated for. Measurement of stray capacitance difference is achieved by operating the accelerometer in two calibration phases and measuring the steady-state output voltage in each of the two phases. In calibration phase 1, no force is applied to the sensor during clock intervals 1-4. In calibration phase 2, a dummy force up is applied and then a dummy force down is applied during those intervals 1-4. The difference in the output voltage of the two calibration phases is representative of the difference in stray capacitance of the sensor. Capacitance is added to the top or bottom plates in an amount proportional to the measured stray capacitance.
    Type: Grant
    Filed: March 12, 1999
    Date of Patent: March 14, 2000
    Assignee: I/O of Austin, Inc.
    Inventors: Scott T. Dupuie, Richard A. Johnson, Ben W. Jones, Mauricio A. Zavaleta, Mark E. Burchfield, Burton A. Devolk, Franklin W. Mayo, Michael L. Abrams, Roger Maher
  • Patent number: 6023960
    Abstract: A high performance method and apparatus for testing a closed loop transducer is disclosed. A test bitstream signal is combined with a .SIGMA..DELTA. feedback bitstream of the transducer to produce a combined bitstream which is converted to a physical feedback to the sensor of the transducer. The .SIGMA..DELTA. bitstream output of the transducer is recorded for later analysis so as to test characteristics of the transducer. The test bitstream signal is preferably an oversampled, pulse density modulated signal. A testing arrangement is provided which is based upon the storage of short-length test patterns which are repetitively accessed to form a continuous test pattern. The test bitstream provided by the method of the invention produces very low noise and low distortion test signals where a repetitive test pattern is equivalent in length to one period of the test signal.
    Type: Grant
    Filed: April 28, 1999
    Date of Patent: February 15, 2000
    Assignee: I/O Sensors, Inc.
    Inventors: Michael L. Abrams, Ben W. Jones, Franklin W. Mayo, Scott T. Dupuie, Jeffery C. Gannon, Richard A. Johnson
  • Patent number: 4750156
    Abstract: The system for suppressing an ambient noise signal which comtaminates a desired signal includes a noise pickup detector for detecting the ambient noise signal. A noise discriminator processes the detected noise signal into noise data. A reference noise generator converts the noise data into a reference noise signal. The noise generator automatically adjusts the reference noise signal to correspond with changes in the noise signal as it is being detected. A filter filters the reference noise signal into an error signal which is adapted to remove the noise signal from the contaminated signal. A cross-correlator cross-correlates the contaminated signal with the reference noise signal and adjusts the filter to produce the required error signal.
    Type: Grant
    Filed: March 3, 1986
    Date of Patent: June 7, 1988
    Assignee: Input/Output, Inc.
    Inventors: Michael L. Abrams, Charles G. Rice, Paul E. Carroll, Roy W. James, III