Abstract: The disclosed embodiments relate to systems and methods for creating a test record for a utility infrastructure including a plurality of interconnected components which convey a deliverable from at least one source to at least one destination. The computer implemented method may include a testing device that creates and monitors a test to create a test record. The test record may be stored in a database for access by other devices and/or users. The disclosed embodiments enable a testing device to provide accurate and convenient test records for the plurality of interconnected components.

Abstract: A data-processing-circuit comprising: a clock-input-terminal configured to receive a clock-signal; a data-output-terminal configured to provide a data-output-signal; an adjustable-driver-buffer configured to: receive a data-signal; and apply a driver-strength-value to the data-signal in order to provide a data-output-signal, wherein the current level of the data-output-signal is based on the driver-strength-value; and a driver-control-module comprising: a time-alignment-module configured to: process the clock-signal and the data-output-signal in order to determine a timing-delay-signal that is representative of a time delay between: a transition in the clock-signal; and a transition in the data-output-signal; provide the driver-strength-value for the adjustable-driver-buffer based on the timing-delay-signal and a target-delay-signal, wherein the driver-strength-value is for reducing a difference between: the timing-delay-signal; and the target-delay-signal.

Abstract: The disclosed embodiments relate to systems and methods for creating a test record for a utility infrastructure including a plurality of interconnected components which convey a deliverable from at least one source to at least one destination. The computer implemented method may include a testing device that creates and monitors a test to create a test record. The test record may be stored in a database for access by other devices and/or users. The disclosed embodiments enable a testing device to provide accurate and convenient test records for the plurality of interconnected components.

Abstract: A data-processing-circuit comprising: a clock-input-terminal configured to receive a clock-signal; a data-output-terminal configured to provide a data-output-signal; an adjustable-driver-buffer configured to: receive a data-signal; and apply a driver-strength-value to the data-signal in order to provide a data-output-signal, wherein the current level of the data-output-signal is based on the driver-strength-value; and a driver-control-module comprising: a time-alignment-module configured to: process the clock-signal and the data-output-signal in order to determine a timing-delay-signal that is representative of a time delay between: a transition in the clock-signal; and a transition in the data-output-signal; provide the driver-strength-value for the adjustable-driver-buffer based on the timing-delay-signal and a target-delay-signal, wherein the driver-strength-value is for reducing a difference between: the timing-delay-signal; and the target-delay-signal.

Abstract: A memory system includes an array of memory cells and a repair module. Multiple memory cells in the array are redundant to other memory cells in the array. The repair module iteratively tests the array. During the iterative testing of the array, the repair module, during each test of the array, (i) identifies one or more defective memory cells in the array, if any, and (ii) in response to one or more defective memory cells being identified during the test, respectively replaces the one or more defective memory cells with one or more memory cells that are redundant to other memory cells in the array. The repair module performs the iterative testing of the array until (i) the repair module does not detect a defective memory cell or (ii) no memory cells of the memory cells that are redundant remain available for replacement of a defective memory cell.

Abstract: A memory system includes an array of memory cells and a repair module. Multiple memory cells in the array are redundant to other memory cells in the array. The repair module iteratively tests the array. During the iterative testing of the array, the repair module, during each test of the array, (i) identifies one or more defective memory cells in the array, if any, and (ii) in response to one or more defective memory cells being identified during the test, respectively replaces the one or more defective memory cells with one or more memory cells that are redundant to other memory cells in the array. The repair module performs the iterative testing of the array until (i) the repair module does not detect a defective memory cell or (ii) no memory cells of the memory cells that are redundant remain available for replacement of a defective memory cell.

Abstract: A memory system includes an array of memory cells. The array of memory cells includes redundant memory cells. The redundant memory cells include at least two of a redundant row and a redundant column of memory cells. The repair module is configured to (i) identify at least two of a row and a column of the array of memory cells having non-operational memory cells and (ii) substitute the at least two of the row and the column of the array of memory cells with selected rows or columns of the redundant memory cells based on X predetermined sequences of substitutions. The repair module is configured to detect a failure in the array of memory cells that cannot be repaired using the X predetermined sequences of substitutions, and use an alternative repair sequence to repair the non-operational memory cells based on the detection of the failure.

Abstract: A memory system includes an array of memory cells. The array of memory cells includes redundant memory cells. The redundant memory cells include at least two of a redundant row and a redundant column of memory cells. The repair module is configured to (i) identify at least two of a row and a column of the array of memory cells having non-operational memory cells and (ii) substitute the at least two of the row and the column of the array of memory cells with selected rows or columns of the redundant memory cells based on X predetermined sequences of substitutions. The repair module is configured to detect a failure in the array of memory cells that cannot be repaired using the X predetermined sequences of substitutions, and use an alternative repair sequence to repair the non-operational memory cells based on the detection of the failure.

Abstract: A self-repairing memory system includes memory including memory elements and redundant memory elements. The memory elements include a plurality of memory cells. A memory repair module identifies non-operational memory cells and selects at least one memory element including the non-operational memory cells. A first repair sub-circuit soft repairs the memory by substituting the selected memory elements with the redundant memory elements. A second repair sub-circuit hard repairs the memory based on the substitutions.

Abstract: A data processing system for providing archiving of individual mail content while maintaining a single copy mail store can include a mail application enabled to maintain a single copy mail store, a primary data store configured for high data throughput and acting as a single copy mail store for the mail application, and a secondary data store configured for mass storage and having a lower data throughput than the primary data store. The system further can include at least one archive implementation of an archive interface, the archive interface defining an archive task and a restore task. In one aspect of the embodiment, the system can include each of a content table, a content map table and a restore queue. Furthermore, the system can include a map view of archived content for a specified user, the map view providing a user interface for activating the restore task.

Abstract: A self-repairing memory system includes memory including memory elements and redundant memory elements. The memory elements include a plurality of memory cells. A memory repair module identifies non-operational memory cells and selects at least one memory element including the non-operational memory cells. A first repair sub-circuit soft repairs the memory by substituting the selected memory elements with the redundant memory elements. A second repair sub-circuit hard repairs the memory based on the substitutions.

Abstract: A system comprising automatic apparatus for automatic optical inspection (AOI), verification and correction of defects in an article, and a processor operative to select between AOI, verification and correction for performing on the article.

Abstract: A system comprising automatic apparatus for automatic optical inspection (AOI), verification and correction of defects in an article, and a processor operative to select between AOI, verification and correction for performing on the article.

Abstract: A system comprising automatic apparatus for automatic optical inspection (AOI), verification and correction of defects in an article, and a processor operative to select between AOI, verification and correction for performing on the article.

Abstract: A data processing system for providing archiving of individual mail content while maintaining a single copy mail store can include a mail application enabled to maintain a single copy mail store, a primary data store configured for high data throughput and acting as a single copy mail store for the mail application, and a secondary data store configured for mass storage and having a lower data throughput than the primary data store. The system further can include at least one archive implementation of an archive interface, the archive interface defining an archive task and a restore task. In one aspect of the embodiment, the system can include each of a content table, a content map table and a restore queue. Furthermore, the system can include a map view of archived content for a specified user, the map view providing a user interface for activating the restore task.

Abstract: A system comprising automatic apparatus for automatic optical inspection (AOI), verification and correction of defects in an article, and a processor operative to select between AOI, verification and correction for performing on the article.

Abstract: A swinging seat includes suspension members having coil springs of nonlinear response so that the seat has a desirable bouncy feel for a wide range of weights supported on the seat. The springs in one embodiment are barrel shaped having coils of maximum diameter at the middle and coils of minimum diameter at the opposite ends of the spring.