Abstract: An interferometric measuring device for measuring a surface or an interface of an object (O) to be measured is described. The effect of vibration on the measurement result is suppressed by providing a connecting unit (VE) by which at least one section of the measuring device assigned to the object (O) to be measured is mechanically rigidly and detachably connectable directly to the object (O) to be measured.

Abstract: The invention relates to an interferometric measuring device (1) for measuring the shape of a surface of an object (O), with a radiation source (LQ) that emits a short coherence radiation, a beam splitter (ST) for producing an object beam (OS), which is guided along an object light path to the object (O), and a reference beam (RS), which is guided along a reference light path to a reflective reference plane (RSP), and with an image recorder (BA) that records the radiation, which is reflected by the object (O) and the reference plane (RSP) and is brought into interference, and supplies it to an evaluation device to determine the surface shape. A favorable adaptability and operation, even in measuring locations that are difficult to access is achieved by virtue of the fact that a lens system (SO), which is fixed in relation to the object (O), is disposed in the object light path and that the fixed lens system (SO) is followed by a lens system (BO) that can move in the direction of its optical axis.

Abstract: The present invention is directed to an optical measuring device having a 3-D measuring set-up for measuring the shapes of test object (O) surfaces in three dimensions, and having projection optics including an objective optics, the test object being illuminated by a light source (SLD) via an illuminating beam using an illuminating optics. A rapid, highly resolving measurement of surface shapes which are nearly radially symmetric is achieved by designing the objective optics as image-flattening optics for covering (measuring) and flattening a curved surface area or as panoramic optics (RO) for measuring a radially symmetric surface area that encircles 360°.

Abstract: An interferometric measuring device is described for measuring the shape of a surface (A) of an object (BO) having a radiation source (KL) which emits a short-coherent radiation, a beam splitter (ST) for forming an object beam which is directed via an object light path (OW) to the object (BO) and a reference beam which is directed via a reference light path (RW) to a reflective reference plane (TS, SP1) and having an image converter (BW) which picks up the radiation that has been brought to interference and reflected back from the surface (A) and the reference plane (TS, SP1) and sends it to an analyzing device for determining a measurement result pertaining to the surface (A); to analyze the interference peak by scanning, the optical length of the object light path (OW) is altered relative to the optical length of the reference light path (RW), or an intermediate image (ZA) of the surface (A) produced in the object light path (OW) is scanned.

Abstract: The present invention relates to an optical measuring device (1) for measuring the shape of particularly rough surfaces of a test object (O), the measuring device including a device that has at least one light source (LQ), one illumination optics, one measuring optics, and at least one detection unit, for determining the intensity distribution of a measuring beam reflected from the surface as a function of a focus position relative to the object surface. A simple measurement even of highly inaccessible locations on the test object is made possible by the fact that the measuring optics has an optical probe for generating at least one intermediate image (ZW) of the observed surface area (FIG. 1).

Abstract: The present invention relates to an interferometric measuring device for measuring the shape of a surface (A) of an object (BO) having a radiation source (KL) which emits a short-coherent radiation, a beam splitter (ST) for forming an object beam which is directed via an object light path (OW) to the object (BO), and a reference beam which is directed via a reference light path (RW) to a reflective reference plane (SP1), and having an image converter (BW) which picks up the radiation reflected back by the surface (A) and the reference plane (SP1) and brought to interference, and sends it to an analyzing device for determining a measuring result pertaining to the surface (A), the optical length of the object light path (OW) being changed relative to the optical length of the reference light path (RW) for analyzing the interference peak.

Abstract: A protective sheathing is provided for use as a protective wrap about longitudinal objects such as cables, wires and bundles of wires in a wiring harness. The sheathing has at least two layers of a non-woven felt fabric. The two layers are bonded together at certain points between them, but not all points, with a hot melt net-like adhesive layer between the felt fabric layers. A layer of adhesive film or velcro is provided on an outside surface of one of the layers of non-woven felt fabric to secure the sheathing around the bundle of wires to be protected.