Patents by Inventor Michael Mauck

Michael Mauck has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and apparatus for simultaneously depositing and observing materials on a target
    Publication number: 20080258073
    Abstract: A system for joining at least two beams of charged particles that includes directing a first beam along a first axis into a field. A second beam is directed along a second axis into the field. The first and second beams are turned, by interaction between the field and the first and second beams, into a third beam directed along a third axis.
    Type: Application
    Filed: May 27, 2008
    Publication date: October 23, 2008
    Inventor: Michael Mauck
  • Method and apparatus for simultaneously depositing and observing materials on a target
    Patent number: 7381949
    Abstract: A system for joining at least two beams of charged particles that includes directing a first beam along a first axis into a field. A second beam is directed along a second axis into the field. The first and second beams are turned, by interaction between the field and the first and second beams, into a third beam directed along a third axis.
    Type: Grant
    Filed: June 15, 2006
    Date of Patent: June 3, 2008
    Assignee: Coincident Bearns Licensing Corporation
    Inventor: Michael Mauck
  • Non-destructive testing system using a laser beam
    Patent number: 7206078
    Abstract: A noninvasive testing system using a method of testing a device under test by providing a beam of light from a light source having a first wavelength, and in a first beam instance imposing the beam of light on a test device when the test device has a first state of refractive indexes, and in a second beam instance imposing the beam of light on the test device when the test device has a second state of refractive indexes, in both instances the beam of light being imposed on the test device over a spatial region within the test device substantially greater than the first wavelength. Data resulting from the interference of the first beam instance and the second beam instance within the device under test is obtained representative of the voltages within the region. The first state of refractive indexes is at a first voltage potential, and the second state of refractive indexes is at a second voltage potential different from the first voltage potential.
    Type: Grant
    Filed: November 20, 2002
    Date of Patent: April 17, 2007
    Assignee: Attofemto, Inc.
    Inventors: Paul Pfaff, Michael Mauck
  • Method and apparatus for simultaneously depositing and observing materials on a target
    Publication number: 20060289793
    Abstract: A system for joining at least two beams of charged particles that includes directing a first beam along a first axis into a field. A second beam is directed along a second axis into the field. The first and second beams are turned, by interaction between the field and the first and second beams, into a third beam directed along a third axis.
    Type: Application
    Filed: June 15, 2006
    Publication date: December 28, 2006
    Inventor: Michael Mauck
  • Method and apparatus for simultaneously depositing and observing materials on a target
    Patent number: 7078852
    Abstract: A system for joining at least two beams of charged particles that includes directing a first beam along a first axis into a field. A second beam is directed along a second axis into the field. The first and second beams are turned, by interaction between the field and the first and second beams, into a third beam directed along a third axis.
    Type: Grant
    Filed: March 17, 2005
    Date of Patent: July 18, 2006
    Assignee: Coincident Beams Licensing Corporation
    Inventor: Michael Mauck
  • Non-destructive testing system
    Publication number: 20050231733
    Abstract: A non-invasive testing system.
    Type: Application
    Filed: March 4, 2003
    Publication date: October 20, 2005
    Inventors: Paul Pfaff, Michael Mauck
  • Method and apparatus for simultaneously depositing and observing materials on a target
    Publication number: 20050161616
    Abstract: A system for joining at least two beams of charged particles that includes directing a first beam along a first axis into a field. A second beam is directed along a second axis into the field. The first and second beams are turned, by interaction between the field and the first and second beams, into a third beam directed along a third axis.
    Type: Application
    Filed: March 17, 2005
    Publication date: July 28, 2005
    Inventor: Michael Mauck
  • Method and apparatus for simultaneously depositing and observing materials on a target
    Patent number: 6906453
    Abstract: A system for joining at least two beams of charged particles that includes directing a first beam along a first axis into a field. A second beam is directed along a second axis into the field. The first and second beams are turned, by interaction between the field and the first and second beams, into a third beam directed along a third axis.
    Type: Grant
    Filed: May 10, 2004
    Date of Patent: June 14, 2005
    Assignee: Coincident Beams Licensing Corporation
    Inventor: Michael Mauck
  • Method and apparatus for simultaneously depositing and observing materials on a target
    Patent number: 6815880
    Abstract: A system for joining at least two beams of charged particles that includes directing a first beam along a first axis into a field. A second beam is directed along a second axis into the field. The first and second beams are turned, by interaction between the field and the first and second beams, into a third beam directed along a third axis.
    Type: Grant
    Filed: May 2, 2003
    Date of Patent: November 9, 2004
    Assignee: Coincident Beams Licensing Corporation
    Inventor: Michael Mauck
  • Method and apparatus for simultaneously depositing and observing materials on a target
    Publication number: 20040207308
    Abstract: A system for joining at least two beams of charged particles that includes directing a first beam along a first axis into a field. A second beam is directed along a second axis into the field. The first and second beams are turned, by interaction between the field and the first and second beams, into a third beam directed along a third axis.
    Type: Application
    Filed: May 10, 2004
    Publication date: October 21, 2004
    Inventor: Michael Mauck
  • Method and apparatus for simultaneously depositing and observing materials on a target
    Publication number: 20030201397
    Abstract: A system for joining at least two beams of charged particles that includes directing a first beam along a first axis into a field. A second beam is directed along a second axis into the field. The first and second beams are turned, by interaction between the field and the first and second beams, into a third beam directed along a third axis.
    Type: Application
    Filed: May 2, 2003
    Publication date: October 30, 2003
    Inventor: Michael Mauck
  • Method and apparatus for simultaneously depositing and observing materials on a target
    Patent number: 6611087
    Abstract: A system for joining at least two beams of charged particles that includes directing a first beam along a first axis into a field. A second beam is directed along a second axis into the field. The first and second beams are turned, by interaction between the field and the first and second beams, into a third beam directed along a third axis.
    Type: Grant
    Filed: August 6, 2002
    Date of Patent: August 26, 2003
    Assignee: Coincident Beams Licensing Corporation
    Inventor: Michael Mauck
  • Method and apparatus for simultaneously depositing and observing materials on a target
    Patent number: 6522056
    Abstract: A system for joining at least two beams of charged particles that includes directing a first beam along a first axis into a field. A second beam is directed along a second axis into the field. The first and second beams are turned, by interaction between the field and the first and second beams, into a third beam directed along a third axis.
    Type: Grant
    Filed: June 30, 2000
    Date of Patent: February 18, 2003
    Assignee: Coincident Beams Licensing Corporation
    Inventor: Michael Mauck
  • Method and apparatus for simultaneously depositing and observing materials on a target
    Publication number: 20020190218
    Abstract: A system for joining at least two beams of charged particles that includes directing a first beam along a first axis into a field. A second beam is directed along a second axis into the field. The first and second beams are turned, by interaction between the field and the first and second beams, into a third beam directed along a third axis.
    Type: Application
    Filed: August 6, 2002
    Publication date: December 19, 2002
    Inventor: Michael Mauck