Patents by Inventor Michael Mikulka

Michael Mikulka has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9841449
    Abstract: A system and method corrects the phase of measurement signals obtained from remote heads during testing of a device. A first signal is transmitted along first and second transmission lines to respective remote heads. A shunt switch is connected between a remote end of the first transmission line and a first remote head, and another shunt switch is connected between a remote end of the second transmission line and a second remote head. The shunt switches in a first configuration respectively reflect the first signal back to a phase measurement apparatus as first and second reflected signals. The phase measurement apparatus determines a first reference phase and a second reference phase respectively based on the first and second reflected signals. A compensation unit compensates phase of the measurement signals based on the first and second reference phases.
    Type: Grant
    Filed: November 30, 2015
    Date of Patent: December 12, 2017
    Assignee: Keysight Technologies, Inc.
    Inventors: Michael Mikulka, Richard Lynn Rhymes, Hassan Tanbakuchi, Chen-Yu Chi, Kenneth H. Wong, Thomas Zwick
  • Publication number: 20170153280
    Abstract: A system and method corrects the phase of measurement signals obtained from remote heads during testing of a device. A first signal is transmitted along first and second transmission lines to respective remote heads. A shunt switch is connected between a remote end of the first transmission line and a first remote head, and another shunt switch is connected between a remote end of the second transmission line and a second remote head. The shunt switches in a first configuration respectively reflect the first signal back to a phase measurement apparatus as first and second reflected signals. The phase measurement apparatus determines a first reference phase and a second reference phase respectively based on the first and second reflected signals. A compensation unit compensates phase of the measurement signals based on the first and second reference phases.
    Type: Application
    Filed: November 30, 2015
    Publication date: June 1, 2017
    Inventors: Michael Mikulka, Richard Lynn Rhymes, Hassan Tanbakuchi, Chen-Yu Chi, Kenneth H. Wong, Thomas Zwick