Abstract: A method for sweeping an electromagnetic radiation source (12) to produce single mode operation having an optimized side-mode suppression ratio over a continuous range of wavelengths within a prescribed temporal profile, the electromagnetic radiation source is configured to output electromagnetic radiation at a given wavelength based upon parameters. The method includes determining a set of parameter combinations that satisfy a condition for a desired set of wavelengths and a maximum side mode suppression ratio over the range of wavelengths. The set of parameter combinations define sub-paths for transitioning from one wavelength to another wavelength. Combinations of select sub-paths provide a multivariate path for transitioning over the range of wavelengths. The method also includes controlling the semiconductor laser to emit electromagnetic radiation over the range of wavelengths by traversing the multivariate path in a desired manner.

Abstract: A system and method for measuring an interferometric signal from a swept-wavelength interferometer by scanning a tunable laser source over two wavelength ranges, whose centers are separated substantially more than the length of wavelength ranges. The spatial resolution of the measurement is determined by the inverse of the wavelength separation between a first and second wavelength region, as well as by the wavelength range of the first and second regions. An electronically tunable laser may be utilized to produce two wavelength ranges that are widely separated in wavelength. Such a system and method has wide applications to the fields of optical frequency domain reflectometry (OFDR) and swept-wavelength optical coherence tomography (OCT), for example.

Abstract: A system (10, 20) and method including a wavelength tuning mechanism and a laser path length tuning mechanism for reducing discontinuities in a sweep range. A processor (14) is coupled to a wavelength monitoring device (18) and the tuning mechanisms. The processor analyzes data from the wavelength monitor to adjust the wavelength tuning and cavity length tuning at discontinuities in the wavelength sweep to reduce the discontinuities.

Abstract: A method and a system for characterization of optical components through characterized decomposition of an optical device includes: directing incident light over a range of wavelengths to a device under test, wherein the incident light includes a primary signal and at least one sideband signal, the distance between the primary signal and any one of the sideband signals is substantially larger than the width of the band pass area of the device under test; detecting output light from the device under test to obtain a detected signal; correcting the detected signal to account errors associated with the sideband signal.

Abstract: A system and method for applying polarization scrambling through a device to a plurality of fiber optic cables by applying a compressive load simultaneously to each of the plurality of fiber optic cables in order to scramble polarization to each of the plurality of fiber optic cables simultaneously.

Abstract: A system and method for adjusting the coherence length of a tunable laser to optimize measurements and reduce artifacts. A tuning element of the laser system modulates, adjusts, or controls parameters associate with the tunable laser, such that the output wavelength of the tunable laser is modulated or adjusted over a wavelength range within a time interval. Modulation of the parameter has the effect of increasing a linewidth of the tunable laser.

Abstract: A system and method for correcting non-linearities in the output of a tunable laser over a sweep range. Electromagnetic radiation is directed over a range of wavelengths to a measurement system from the tunable laser source, wherein the measurement system collects data over the range of wavelengths. The electromagnetic radiation emitted over the range of wavelengths is monitored. A non-linearity in one or more wavelengths over the range of wavelengths is determined. A signal is transmitted to the measurement system to cease collecting data when the one or more wavelengths having the non-linearity is output from the tunable laser source or the data is ignored.

Abstract: A system and method for sweeping electromagnetic radiation over a first coherence length and a second length over a range of wavelengths to generate an image. Electromagnetic radiation having a first coherence length is generated and swept over a range of wavelengths. Electromagnetic radiation having a second coherence length is generated and swept over a range of wavelengths. The electromagnetic radiation is splitting through a reference path and a sample path; Electromagnetic radiation returned from the reference path and the sample path is detected, wherein the detector generates output signals corresponding to the received electromagnetic radiation. In one embodiment, the output signals are processed to generate an image. The image may be interleaved with data corresponding to the electromagnetic radiation having the first coherence length and the second coherence length.

Abstract: A method and a system for characterization of optical components through characterized decomposition of an optical device includes: directing incident light over a range of wavelengths to a device under test, wherein the incident light includes a primary signal and at least one sideband signal, the distance between the primary signal and any one of the sideband signals is substantially larger than the width of the band pass area of the device under test; detecting output light from the device under test to obtain a detected signal; correcting the detected signal to account errors associated with the sideband signal.

Abstract: A system and method for measuring an interferometric signal from a swept-wavelength interferometer by scanning a tunable laser source over two wavelength ranges, whose centers are separated substantially more than the length of wavelength ranges. The spatial resolution of the measurement is determined by the inverse of the wavelength separation between a first and second wavelength region, as well as by the wavelength range of the first and second regions. An electronically tunable laser may be utilized to produce two wavelength ranges that are widely separated in wavelength. Such a system and method has wide applications to the fields of optical frequency domain reflectometry (OFDR) and swept-wavelength optical coherence tomography (OCT), for example.

Abstract: A method of and system for correcting mode hop wavelength error in data obtained measuring optical characteristics over a number of wavelengths, includes at a location where mode hop wavelength error occurs in an assemblage of data, representing optical characteristics with respect to wavelength of incident electromagnetic energy of a device under test, compensating or correcting the data to overcome errors due to mode hop occurring in the measurement process.

Abstract: A method of and system for correcting mode hop wavelength error in data obtained measuring optical characteristics over a number of wavelengths, includes at a location where mode hop wavelength error occurs in an assemblage of data, representing optical characteristics with respect to wavelength of incident electromagnetic energy of a device under test, compensating or correcting the data to overcome errors due to mode hop occurring in the measurement process.

Abstract: An optical test system for use in testing fiber optical transmission systems and components comprises a modular construction in a single housing. The modular construction includes a plurality of laser source channels, a MUX, additional optical conditioning devices both upstream and downstream of the MUX, and a master controller for operating the system components in synchrony. The integral housing, together with the modular construction, provides increased structural density that occupies in many instances at least seventy percent less space than is required for other optical test systems. The use of a master controller to drive the system affords expanded system functionality.

Abstract: A modulation control system is used in fiber optic data transmission and fiber optic test equipment. A modulation controller includes a plurality of function generators that are linked by a switching mechanics, to a rail system that drives a plurality of laser source cards. The switching mechanism for each rail is capable of driving the rail at the function-generated waveform or switching to an external source waveform. The laser source cards are intelligent in the sense that they can be programmably controlled by switching to select waveforms from a selected one of the rails.

Abstract: A modulation control system is used in fiber optic data transmission and fiber optic test equipment. A modulation controller includes a plurality of function generators that are linked by a switching mechanics, to a rail system that drives a plurality of laser source cards, The switching mechanism for each rail is capable of driving the rail at the function-generated waveform or switching to an external source waveform. The laser source cards are intelligent in the sense that they can be programmably controlled by switching to select waveforms from a selected one of the rails.

Abstract: An optical test system for use in testing fiber optical transmission systems and components comprises a modular construction in a single housing. The modular construction includes a plurality of laser source channels, a MUX, additional optical conditioning devices both upstream and downstream of the MUX, and a master controller for operating the system components in synchrony. The integral housing, together with the modular construction, provides increased structural density that occupies in many instances at least seventy percent less space than is required for other optical test systems. The use of a master controller to drive the system affords expanded system functionality.

Abstract: A current in a circuit is measured without breaking the circuit. A relatively low resistance element in the circuit such as a component lead is chosen. A current is forced through the element and the voltage drop measured. Another current is forced through the element and the voltage drop measured. The values of these currents and voltages are used to determine the original current in the circuit.