Abstract: A laser system may include a laser array comprising a plurality of laser array emitters and a seed laser. The seed laser may be positioned on and directed toward an emitting side of the laser array or may be optically coupled to the plurality of laser array emitters by a waveguide bordering the laser array. The seed laser may be configured to emit a seed beam that interferes with one or more array beams emitted by one or more of the laser array emitters and locks the one or more array beams to a phase of the seed beam. An adjustable micro-lens array positioned on an emitting side of the laser array may enable laser array beams to be steered to a target location.

Abstract: System and methods are described for generating recommendations from dynamically-mapped data. In one implementation, a database system receives a first request to generate a recommendation objection and a second request to retrieve additional data to include in the recommendation object. The database system retrieves the recommendation data from a first database table. The database system identifies the additional data in a second database table that is stored separately from the first database table. The database system generates the recommendation object to include the recommendation data from the first database, and maps the additional data to one or more fields of the recommendation object.

Abstract: System and methods are described for generating recommendations from dynamically-mapped data. In one implementation, a database system receives a first request to generate a recommendation objection and a second request to retrieve additional data to include in the recommendation object. The database system retrieves the recommendation data from a first database table. The database system identifies the additional data in a second database table that is stored separately from the first database table. The database system generates the recommendation object to include the recommendation data from the first database, and maps the additional data to one or more fields of the recommendation object.

Abstract: The present embodiments generally relate to methods of non-destructively imaging plant root damage by insect root herbivores and evaluating the efficacy of insecticidal materials associated with the roots of plants against the insect root herbivores, useful for automated high throughput bioassays.

Abstract: The present embodiments generally relate to methods of non-destructively imaging plant root damage by insect root herbivores and evaluating the efficacy of insecticidal materials associated with the roots of plants against the insect root herbivores, useful for automated high throughput bioassays.

Abstract: The present embodiments generally relate to methods of non-destructively imaging plant root damage by insect root herbivores and evaluating the efficacy of insecticidal materials associated with the roots of plants against the insect root herbivores, useful for automated high throughput bioassays.

Abstract: The present embodiments generally relate to methods of non-destructively imaging plant root damage by insect root herbivores and evaluating the efficacy of insecticidal materials associated with the roots of plants against the insect root herbivores, useful for automated high throughput bioassays.

Abstract: A method, system, and computer-readable medium for forming transmission electron microscopy sample lamellae using a focused ion beam including directing a high energy focused ion beam toward a bulk volume of material; milling away the unwanted volume of material to produce an unfinished sample lamella with one or more exposed faces having a damage layer; characterizing the removal rate of the focused ion beam; subsequent to characterizing the removal rate, directing a low energy focused ion beam toward the unfinished sample lamella for a predetermined milling time to deliver a specified dose of ions per area from the low energy focused ion beam; and milling the unfinished sample lamella with the low energy focused ion beam to remove at least a portion of the damage layer to produce the finished sample lamella including at least a portion of the feature of interest.

Abstract: System and methods are described for generating recommendations from dynamically-mapped data. In one implementation, a database system receives a first request to generate a recommendation objection and a second request to retrieve additional data to include in the recommendation object. The database system retrieves the recommendation data from a first database table. The database system identifies the additional data in a second database table that is stored separately from the first database table. The database system generates the recommendation object to include the recommendation data from the first database, and maps the additional data to one or more fields of the recommendation object.

Abstract: A method, system, and computer-readable medium for forming transmission electron microscopy sample lamellae using a focused ion beam including directing a high energy focused ion beam toward a bulk volume of material; milling away the unwanted volume of material to produce an unfinished sample lamella with one or more exposed faces having a damage layer; characterizing the removal rate of the focused ion beam; subsequent to characterizing the removal rate, directing a low energy focused ion beam toward the unfinished sample lamella for a predetermined milling time to deliver a specified dose of ions per area from the low energy focused ion beam; and milling the unfinished sample lamella with the low energy focused ion beam to remove at least a portion of the damage layer to produce the finished sample lamella including at least a portion of the feature of interest.

Abstract: A method, system, and computer-readable medium for forming transmission electron microscopy sample lamellae using a focused ion beam including directing a high energy focused ion beam toward a bulk volume of material; milling away the unwanted volume of material to produce an unfinished sample lamella with one or more exposed faces having a damage layer; characterizing the removal rate of the focused ion beam; subsequent to characterizing the removal rate, directing a low energy focused ion beam toward the unfinished sample lamella for a predetermined milling time to deliver a specified dose of ions per area from the low energy focused ion beam; and milling the unfinished sample lamella with the low energy focused ion beam to remove at least a portion of the damage layer to produce the finished sample lamella including at least a portion of the feature of interest.

Abstract: A method and apparatus for producing thin lamella for TEM observation. The steps of the method are robust and can be used to produce lamella in an automated process. In some embodiments, a protective coating have a sputtering rate matched to the sputtering rate of the work piece is deposited before forming the lamella. In some embodiments, the bottom of the lamella slopes away from the feature of interest, which keeps the lamella stable and reduces movement during thinning. In some embodiments, a fiducial is used to position the beam for the final thinning, instead of using an edge of the lamella. In some embodiments, the tabs are completed after high ion energy final thinning to keep the lamella more stable. In some embodiments, a defocused low ion energy and pattern refresh delay is used for the final cut to reduce deformation of the lamella.

Abstract: Methods for evaluating one or more immature ears of maize are presented in which digital imagery and image processing are used to assess physical properties of immature maize ears that are correlated with yield and other yield-related traits. Also provided are methods for identifying leads using immature ear photometry.

Abstract: Methods for evaluating one or more immature ears of maize are presented in which digital imagery and image processing are used to assess physical properties of immature maize ears that are correlated with yield and other yield-related traits. Also provided are methods for identifying leads using immature ear photometry.

Abstract: Methods for evaluating one or more immature ears of maize are presented in which digital imagery and image processing are used to assess physical properties of immature maize ears that are correlated with yield and other yield-related traits. Also provided are methods for identifying leads using immature ear photometry.

Abstract: A method and apparatus for preparing thin TEM samples in a manner that reduces or prevents bending and curtaining is realized. Embodiments of the present invention deposit material onto the face of a TEM sample during the process of preparing the sample. In some embodiments, the material can be deposited on a sample face that has already been thinned before the opposite face is thinned, which can serve to reinforce the structural integrity of the sample and refill areas that have been over-thinned due to a curtaining phenomena. In other embodiments, material can also be deposited onto the face being milled, which can serve to reduce or eliminate curtaining on the sample face.

Abstract: The present disclosure relates to methods for non-destructively assessing yield and/or stress tolerance in crop plants through the use of high-energy particle based imaging and analysis including X rays. Also provided are methods to non-destructively assess transgenic crop plants for the effects of a transgene on yield and/or on stress tolerance.

Abstract: A method for Transmission Electron Microscopy (TEM) sample creation. The use of a Scanning Electron Microscope (SEM)—Scanning Transmission Electron Microscope (STEM) detector in the dual-beam focused ion beam (FIB)/SEM allows a sample to be thinned using the FIB, while the STEM signal is used to monitor sample thickness. A preferred embodiment of the present invention can measure the thickness of or create TEM and STEM samples by using a precise endpoint detection method. Preferred embodiments also enable automatic endpointing during TEM lamella creation and provide users with direct feedback on sample thickness during manual thinning. Preferred embodiments of the present invention thus provide methods for endpointing sample thinning and methods to partially or fully automate endpointing.

Abstract: A method of processing network traffic within a computing system, comprises at a first configurable logic device (CLD), receiving an ingress network packet from an external network interface, associating the ingress network packet with a timestamp indicating the time of receipt, parsing the ingress network packet to locate a link-layer checksum value and a routing-layer checksum value, determining whether the link-layer and routing-layer checksum values are correct based on the ingress network packet contents, and transmitting the ingress network packet to a second CLD via a high-speed interconnection; and at the second CLD receiving the ingress network packet, parsing the ingress network packet to locate a source address and a destination address, determining a destination and a route for the ingress network packet based at least in part on the source and destination addresses, and transmitting the ingress network packet to the determined destination via the determined route.

Abstract: A method and apparatus is provided for preparing samples for observation in a charged particle beam system in a manner that reduces or prevents artifacts. Material is deposited onto the sample using charged particle beam deposition just before or during the final milling, which results in an artifact-free surface. Embodiments are useful for preparing cross sections for SEM observation of samples having layers of materials of different hardnesses. Embodiments are useful for preparation of thin TEM samples.