Patents by Inventor Michael Moriarty

Michael Moriarty has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240121231
    Abstract: Techniques are described for controlling data and resource access. For example, methods and systems can facilitate controlled token distribution across systems and token processing in a manner so as to limit access to and to protect data that includes access codes.
    Type: Application
    Filed: December 11, 2023
    Publication date: April 11, 2024
    Applicant: Live Nation Entertainment, Inc.
    Inventors: Phillip Volini, John Raymond Werneke, Carl Schumaier, Michael Smith, Frank Giannantonio, Vito Iaia, Sean Moriarty
  • Publication number: 20240104630
    Abstract: System and methods are described for generating recommendations from dynamically-mapped data. In one implementation, a database system receives a first request to generate a recommendation objection and a second request to retrieve additional data to include in the recommendation object. The database system retrieves the recommendation data from a first database table. The database system identifies the additional data in a second database table that is stored separately from the first database table. The database system generates the recommendation object to include the recommendation data from the first database, and maps the additional data to one or more fields of the recommendation object.
    Type: Application
    Filed: December 4, 2023
    Publication date: March 28, 2024
    Applicant: Salesforce, Inc.
    Inventors: Joel Ragnar Palmert, Kiran Hariharan Nair, Merwan Hade, Nikhil Kataria, Jia Lian Wang, Michael Moriarty
  • Patent number: 11875393
    Abstract: System and methods are described for generating recommendations from dynamically-mapped data. In one implementation, a database system receives a first request to generate a recommendation objection and a second request to retrieve additional data to include in the recommendation object. The database system retrieves the recommendation data from a first database table. The database system identifies the additional data in a second database table that is stored separately from the first database table. The database system generates the recommendation object to include the recommendation data from the first database, and maps the additional data to one or more fields of the recommendation object.
    Type: Grant
    Filed: January 28, 2020
    Date of Patent: January 16, 2024
    Assignee: Salesforce, Inc.
    Inventors: Joel Ragnar Palmert, Kiran Hariharan Nair, Merwan Hade, Nikhil Kataria, Jia Lian Wang, Michael Moriarty
  • Publication number: 20230408426
    Abstract: The present embodiments generally relate to methods of non-destructively imaging plant root damage by insect root herbivores and evaluating the efficacy of insecticidal materials associated with the roots of plants against the insect root herbivores, useful for automated high throughput bioassays.
    Type: Application
    Filed: June 1, 2023
    Publication date: December 21, 2023
    Applicant: PIONEER HI-BRED INTERNATIONAL, INC.
    Inventors: DENNY JOSEPH BRUCK, KALEY J GADE, ALBERT L LU, TIMOTHY MICHAEL MORIARTY, ANGEL O ORTIZ LOZADA, GARY A SANDAHL, GERARDUS W A M VAN DER HEIJDEN
  • Patent number: 11703463
    Abstract: The present embodiments generally relate to methods of non-destructively imaging plant root damage by insect root herbivores and evaluating the efficacy of insecticidal materials associated with the roots of plants against the insect root herbivores, useful for automated high throughput bioassays.
    Type: Grant
    Filed: April 19, 2022
    Date of Patent: July 18, 2023
    Assignee: PIONEER HI-BRED INTERNATIONAL, INC.
    Inventors: Denny Joseph Bruck, Kaley J Gade, Albert L Lu, Timothy Michael Moriarty, Angel O Ortiz Lozada, Gary A Sandahl, Gerardus W A M Van Der Heijden
  • Publication number: 20220307993
    Abstract: The present embodiments generally relate to methods of non-destructively imaging plant root damage by insect root herbivores and evaluating the efficacy of insecticidal materials associated with the roots of plants against the insect root herbivores, useful for automated high throughput bioassays.
    Type: Application
    Filed: April 19, 2022
    Publication date: September 29, 2022
    Applicant: PIONEER HI-BRED INTERNATIONAL, INC.
    Inventors: DENNY JOSEPH BRUCK, KALEY J GADE, ALBERT L LU, TIMOTHY MICHAEL MORIARTY, ANGEL O ORTIZ LOZADA, GARY A SANDAHL, GERARDUS W A M VAN DER HEIJDEN
  • Patent number: 11333618
    Abstract: The present embodiments generally relate to methods of non-destructively imaging plant root damage by insect root herbivores and evaluating the efficacy of insecticidal materials associated with the roots of plants against the insect root herbivores, useful for automated high throughput bioassays.
    Type: Grant
    Filed: June 4, 2020
    Date of Patent: May 17, 2022
    Inventors: Denny Joseph Bruck, Kaley J. Gade, Albert L. Lu, Timothy Michael Moriarty, Angel O. Ortiz Lozada, Gary A. Sandahl, Gerardus W. A. M. Van Der Heijden
  • Patent number: 11313042
    Abstract: A method, system, and computer-readable medium for forming transmission electron microscopy sample lamellae using a focused ion beam including directing a high energy focused ion beam toward a bulk volume of material; milling away the unwanted volume of material to produce an unfinished sample lamella with one or more exposed faces having a damage layer; characterizing the removal rate of the focused ion beam; subsequent to characterizing the removal rate, directing a low energy focused ion beam toward the unfinished sample lamella for a predetermined milling time to deliver a specified dose of ions per area from the low energy focused ion beam; and milling the unfinished sample lamella with the low energy focused ion beam to remove at least a portion of the damage layer to produce the finished sample lamella including at least a portion of the feature of interest.
    Type: Grant
    Filed: September 10, 2019
    Date of Patent: April 26, 2022
    Assignee: FEI Company
    Inventors: Thomas G. Miller, Jason Arjavac, Michael Moriarty
  • Publication number: 20210233146
    Abstract: System and methods are described for generating recommendations from dynamically-mapped data. In one implementation, a database system receives a first request to generate a recommendation objection and a second request to retrieve additional data to include in the recommendation object. The database system retrieves the recommendation data from a first database table. The database system identifies the additional data in a second database table that is stored separately from the first database table. The database system generates the recommendation object to include the recommendation data from the first database, and maps the additional data to one or more fields of the recommendation object.
    Type: Application
    Filed: January 28, 2020
    Publication date: July 29, 2021
    Inventors: Joel Ragnar Palmert, Kiran Hariharan Nair, Merwan Hade, Nikhil Kataria, Jia Lian Wang, Michael Moriarty
  • Publication number: 20200095688
    Abstract: A method, system, and computer-readable medium for forming transmission electron microscopy sample lamellae using a focused ion beam including directing a high energy focused ion beam toward a bulk volume of material; milling away the unwanted volume of material to produce an unfinished sample lamella with one or more exposed faces having a damage layer; characterizing the removal rate of the focused ion beam; subsequent to characterizing the removal rate, directing a low energy focused ion beam toward the unfinished sample lamella for a predetermined milling time to deliver a specified dose of ions per area from the low energy focused ion beam; and milling the unfinished sample lamella with the low energy focused ion beam to remove at least a portion of the damage layer to produce the finished sample lamella including at least a portion of the feature of interest.
    Type: Application
    Filed: September 10, 2019
    Publication date: March 26, 2020
    Applicant: FEI Company
    Inventors: Thomas G. Miller, Jason Arjavac, Michael Moriarty
  • Patent number: 10465293
    Abstract: A method, system, and computer-readable medium for forming transmission electron microscopy sample lamellae using a focused ion beam including directing a high energy focused ion beam toward a bulk volume of material; milling away the unwanted volume of material to produce an unfinished sample lamella with one or more exposed faces having a damage layer; characterizing the removal rate of the focused ion beam; subsequent to characterizing the removal rate, directing a low energy focused ion beam toward the unfinished sample lamella for a predetermined milling time to deliver a specified dose of ions per area from the low energy focused ion beam; and milling the unfinished sample lamella with the low energy focused ion beam to remove at least a portion of the damage layer to produce the finished sample lamella including at least a portion of the feature of interest.
    Type: Grant
    Filed: August 31, 2012
    Date of Patent: November 5, 2019
    Assignee: FEI Company
    Inventors: Thomas G. Miller, Jason Arjavac, Michael Moriarty
  • Patent number: 10068749
    Abstract: A method and apparatus for producing thin lamella for TEM observation. The steps of the method are robust and can be used to produce lamella in an automated process. In some embodiments, a protective coating have a sputtering rate matched to the sputtering rate of the work piece is deposited before forming the lamella. In some embodiments, the bottom of the lamella slopes away from the feature of interest, which keeps the lamella stable and reduces movement during thinning. In some embodiments, a fiducial is used to position the beam for the final thinning, instead of using an edge of the lamella. In some embodiments, the tabs are completed after high ion energy final thinning to keep the lamella more stable. In some embodiments, a defocused low ion energy and pattern refresh delay is used for the final cut to reduce deformation of the lamella.
    Type: Grant
    Filed: May 21, 2013
    Date of Patent: September 4, 2018
    Assignee: FEI Company
    Inventors: Scott Edward Fuller, Brian Roberts Routh, Jr., Michael Moriarty
  • Patent number: 9933405
    Abstract: Methods for evaluating one or more immature ears of maize are presented in which digital imagery and image processing are used to assess physical properties of immature maize ears that are correlated with yield and other yield-related traits. Also provided are methods for identifying leads using immature ear photometry.
    Type: Grant
    Filed: April 8, 2016
    Date of Patent: April 3, 2018
    Assignee: PIONEER HI-BRED INTERNATIONAL, INC.
    Inventors: Guofu Li, Travis A Hanselman, Jacque Hockenson, Dale F Loussaert, Timothy Michael Moriarty, Rachael Woods
  • Publication number: 20160223507
    Abstract: Methods for evaluating one or more immature ears of maize are presented in which digital imagery and image processing are used to assess physical properties of immature maize ears that are correlated with yield and other yield-related traits. Also provided are methods for identifying leads using immature ear photometry.
    Type: Application
    Filed: April 8, 2016
    Publication date: August 4, 2016
    Inventors: Guofu Li, TRAVIS A. HANSELMAN, Jacque Hockenson, Dale F. Loussaert, Timothy Michael Moriarty, Rachael Woods
  • Patent number: 9335313
    Abstract: Methods for evaluating one or more immature ears of maize are presented in which digital imagery and image processing are used to assess physical properties of immature maize ears that are correlated with yield and other yield-related traits. Also provided are methods for identifying leads using immature ear photometry.
    Type: Grant
    Filed: December 26, 2012
    Date of Patent: May 10, 2016
    Assignee: PIONEER HI BRED INTERNATIONAL INC.
    Inventors: Guofu Li, Travis A. Hanselman, Jacque Hockenson, Dale F. Loussaert, Timothy Michael Moriarty, Rachael Woods
  • Patent number: 9279752
    Abstract: A method and apparatus for preparing thin TEM samples in a manner that reduces or prevents bending and curtaining is realized. Embodiments of the present invention deposit material onto the face of a TEM sample during the process of preparing the sample. In some embodiments, the material can be deposited on a sample face that has already been thinned before the opposite face is thinned, which can serve to reinforce the structural integrity of the sample and refill areas that have been over-thinned due to a curtaining phenomena. In other embodiments, material can also be deposited onto the face being milled, which can serve to reduce or eliminate curtaining on the sample face.
    Type: Grant
    Filed: October 14, 2014
    Date of Patent: March 8, 2016
    Assignee: FEI Company
    Inventors: Michael Moriarty, Stacey Stone, Jeffrey Blackwood
  • Publication number: 20150324975
    Abstract: The present disclosure relates to methods for non-destructively assessing yield and/or stress tolerance in crop plants through the use of high-energy particle based imaging and analysis including X rays. Also provided are methods to non-destructively assess transgenic crop plants for the effects of a transgene on yield and/or on stress tolerance.
    Type: Application
    Filed: December 18, 2013
    Publication date: November 12, 2015
    Inventors: Jason Cope, Goufu Li, Timothy Michael Moriarty
  • Patent number: 9184025
    Abstract: A method for Transmission Electron Microscopy (TEM) sample creation. The use of a Scanning Electron Microscope (SEM)—Scanning Transmission Electron Microscope (STEM) detector in the dual-beam focused ion beam (FIB)/SEM allows a sample to be thinned using the FIB, while the STEM signal is used to monitor sample thickness. A preferred embodiment of the present invention can measure the thickness of or create TEM and STEM samples by using a precise endpoint detection method. Preferred embodiments also enable automatic endpointing during TEM lamella creation and provide users with direct feedback on sample thickness during manual thinning. Preferred embodiments of the present invention thus provide methods for endpointing sample thinning and methods to partially or fully automate endpointing.
    Type: Grant
    Filed: April 6, 2012
    Date of Patent: November 10, 2015
    Assignee: FEI Company
    Inventors: Richard J. Young, Brennan Peterson, Rudolf Johannes Peter Gerardus Schampers, Michael Moriarty
  • Patent number: 9154413
    Abstract: A method of processing network traffic within a computing system, comprises at a first configurable logic device (CLD), receiving an ingress network packet from an external network interface, associating the ingress network packet with a timestamp indicating the time of receipt, parsing the ingress network packet to locate a link-layer checksum value and a routing-layer checksum value, determining whether the link-layer and routing-layer checksum values are correct based on the ingress network packet contents, and transmitting the ingress network packet to a second CLD via a high-speed interconnection; and at the second CLD receiving the ingress network packet, parsing the ingress network packet to locate a source address and a destination address, determining a destination and a route for the ingress network packet based at least in part on the source and destination addresses, and transmitting the ingress network packet to the determined destination via the determined route.
    Type: Grant
    Filed: June 21, 2012
    Date of Patent: October 6, 2015
    Assignee: BreakingPoint Systems, Inc.
    Inventors: Jonathan Stroud, Michael Moriarty
  • Patent number: 9111720
    Abstract: A method and apparatus is provided for preparing samples for observation in a charged particle beam system in a manner that reduces or prevents artifacts. Material is deposited onto the sample using charged particle beam deposition just before or during the final milling, which results in an artifact-free surface. Embodiments are useful for preparing cross sections for SEM observation of samples having layers of materials of different hardnesses. Embodiments are useful for preparation of thin TEM samples.
    Type: Grant
    Filed: December 16, 2014
    Date of Patent: August 18, 2015
    Assignee: FEI COMPANY
    Inventors: Ronald Kelley, Michael Moriarty, Stacey Stone, Jeffrey Blackwood