Abstract: A stain-barrier is described along with methods of its application to a fabric. The stain barrier reduces variability between samples of different dilution or fabric type so that limits of stain detection can be assigned more accurately and precisely and stain detection techniques can be transparently compared.

Abstract: A stain-barrier is described along with methods of its application to a fabric. The stain barrier can be applied to fabric samples and limits the amount of fabric with which deposited liquid is able to interact. This stain barrier reduces unwanted variability between samples of different dilution or fabric type so that limits of stain detection can be assigned more accurately and precisely and stain detection techniques can be transparently compared.

Abstract: A stain-barrier is described along with methods of its application to a fabric. The stain barrier can be applied to fabric samples and limits the amount of fabric with which deposited liquid is able to interact. This stain barrier reduces unwanted variability between samples of different dilution or fabric type so that limits of stain detection can be assigned more accurately and precisely and stain detection techniques can be transparently compared.

Abstract: A stain-barrier is described along with methods of its application to a fabric. The stain barrier reduces variability between samples of different dilution or fabric type so that limits of stain detection can be assigned more accurately and precisely and stain detection techniques can be transparently compared.

Abstract: Methods for identifying chemical contrasts on a common surface are generally provided. The presence of a stain on a surface can be detected by applying a testing vapor, such as water, onto the surface and monitoring the surface with an infrared camera that detects wavelengths of about 700 nm to about 1 mm and/or a microbolometer that detects wavelengths of about 7.5 ?m to about 14 ?m. The surface may be at room temperature or preheated during the detection method.

Abstract: A system and method for analyzing a sample is disclosed. At least a portion of the sample is illuminated with modulated light from a light source, such as an infrared light source. Infrared energy from the sample is monitored with an infrared detector as the sample is being illuminated with the modulated light. The AC response of the infrared energy is analyzed to determine at least one of emission data or reflection data about the sample. The emission data or the reflection data can be used to enhance chemical contrast between varying substances on the sample.

Abstract: Infrared light sources, along with their methods of formation, are provided. The infrared light source can include a base substrate defining an aperture; a filament extending through the aperture defined by the base substrate; a resistive metal wire wrapped around the filament to define a coil having a first end and a second end; a high temperature coating surrounding at least a portion of the filament and the coil; a first electrode electrically connected to the first end of the coil; and a second electrode electrically connected to the second end of the coil.

Abstract: Methods for identifying chemical contrasts on a common surface are generally provided. The presence of a stain on a surface can be detected by applying a testing vapor, such as water, onto the surface and monitoring the surface with an infrared camera that detects wavelengths of about 700 nm to about 1 mm and/or a microbolometer that detects wavelengths of about 7.5 ?m to about 14 ?m. The surface may be at room temperature or preheated during the detection method.

Abstract: A system and method for analyzing a sample is disclosed. At least a portion of the sample is illuminated with modulated light from a light source, such as an infrared light source. Infrared energy from the sample is monitored with an infrared detector as the sample is being illuminated with the modulated light. The AC response of the infrared energy is analyzed to determine at least one of emission data or reflection data about the sample. The emission data or the reflection data can be used to enhance chemical contrast between varying substances on the sample.

Abstract: A thin film interference filter system includes a plurality of stacked films having a determined reflectance; a modeled monitor curve; and a topmost layer configured to exhibit a wavelength corresponding to one of the determined reflectance or the modeled monitor curve. The topmost layer is placed on the plurality of stacked films and can be a low-index film such as silica or a high index film such as niobia.