Patents by Inventor Michael P Drake

Michael P Drake has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Modularized power amplifier devices and architectures
    Patent number: 11967937
    Abstract: A packaged semiconductor chip includes a semiconductor sub strate having formed thereon: radio-frequency (RF) input and output contact pads, DC contact pads, and first and second amplifier stages. An input of the first amplifier stage is coupled with the RF input contact pad. An input and an output of the second amplifier stage are respectively coupled to an output of the first amplifier stage and the RF output contact pad. The DC contact pads and the input of the first amplifier stages are connected via an input bias coupling path. The outputs of the amplifier stages are connected via an output bias coupling path. The chip further includes a lead frame having RF input and output pins electrically coupled to the RF input and output contact pads, and input bias pins electrically coupled to the DC contact pad.
    Type: Grant
    Filed: January 17, 2019
    Date of Patent: April 23, 2024
    Assignee: Viasat, Inc.
    Inventors: Shih Peng Sun, Kenneth V. Buer, Michael R. Lyons, Gary P. English, Qiang R. Chen, Ramanamurthy V. Darapu, Douglas J. Mathews, Mark S. Berkheimer, Brandon C. Drake
  • Compensated mechanical testing system
    Patent number: 10571379
    Abstract: A mechanical testing system having a frame, and a stage for holding a sample. An arm for pressing a tool against a surface of the sample. A primary actuator is connected to the frame and applies a primary force and drives the tool relative to the sample, thereby causing the frame to flex. A displacement sensor measures a displacement value comprised of two components, the first component including a distance traveled by the probe into the sample as the primary force is applied, and the second component including a measure of a degree of flex of the frame as the primary force is applied. A compensating actuator is connected to the frame and applies a compensating force that reduces the second component of the displacement value.
    Type: Grant
    Filed: April 4, 2016
    Date of Patent: February 25, 2020
    Assignee: KLA-Tencor Corporation
    Inventors: Warren C Oliver, Sudharshan P Pardhasaradhi, Michael P Drake
  • Compensated Mechanical Testing System
    Publication number: 20170284912
    Abstract: A mechanical testing system having a frame, and a stage for holding a sample. An arm for pressing a tool against a surface of the sample. A primary actuator is connected to the frame and applies a primary force and drives the tool relative to the sample, thereby causing the frame to flex. A displacement sensor measures a displacement value comprised of two components, the first component including a distance traveled by the probe into the sample as the primary force is applied, and the second component including a measure of a degree of flex of the frame as the primary force is applied. A compensating actuator is connected to the frame and applies a compensating force that reduces the second component of the displacement value.
    Type: Application
    Filed: April 4, 2016
    Publication date: October 5, 2017
    Applicant: Nanomechanics, Inc.
    Inventors: Warren C Oliver, Sudharshan P Pardhasaradhi, Michael P Drake