Patents by Inventor Michael P. K. Feser

Michael P. K. Feser has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Verification of integrated circuits against malicious circuit insertions and modifications using non-destructive X-ray microscopy
    Patent number: 8139846
    Abstract: A method and system for verifying the integrity of integrated circuits (ICs) by detecting the presence of unauthorized circuit insertions or modifications using non-destructive x-ray microscopy is disclosed. A reference image based on a trusted IC or a trusted design file may be generated. An un-trusted IC may be received from an un-trusted foundry, which IC is manufactured in response to the trusted design file provided to the foundry. An x-ray microscope may record a plurality of sets of base images of the un-trusted IC, each set corresponding to a different viewing angle. One or more un-trusted images may be produced from the base images. The reference images may be compared with the un-trusted images to illuminate any additions or modifications in circuit elements or other parameters.
    Type: Grant
    Filed: November 5, 2008
    Date of Patent: March 20, 2012
    Assignees: University of Southern California, Xradia
    Inventors: Michael A. Bajura, John N. Damoulakis, Younes Boulghassoul, Michael P. K. Feser, Andrei V. Tkachuk
  • VERIFICATION OF INTEGRATED CIRCUITS AGAINST MALICIOUS CIRCUIT INSERTIONS AND MODIFICATIONS USING NON-DESTRUCTIVE X-RAY MICROSCOPY
    Publication number: 20110002528
    Abstract: A method and system for verifying the integrity of integrated circuits (ICs) by detecting the presence of unauthorized circuit insertions or modifications using non-destructive x-ray microscopy is disclosed. A reference image based on a trusted IC or a trusted design file may be generated. An un-trusted IC may be received from an un-trusted foundry, which IC is manufactured in response to the trusted design file provided to the foundry. An x-ray microscope may record a plurality of sets of base images of the un-trusted IC, each set corresponding to a different viewing angle. One or more un-trusted images may be produced from the base images. The reference images may be compared with the un-trusted images to illuminate any additions or modifications in circuit elements or other parameters.
    Type: Application
    Filed: November 5, 2008
    Publication date: January 6, 2011
    Applicants: UNIVERSITY OF SOUTHERN CALIFORNIA, XRADIA
    Inventors: Michael A. Bajura, John N. Damoulakis, Younes Boulghassoul, Michael P.K. Feser, Andrei V. Tkachuk