Abstract: An imaging sensor for scanning a thermal image is disclosed. The imaging sensor comprises a first set of elemental detectors operable to receive a thermal image during a first portion of the calibration cycle. A second set of elemental detector is provided which are operable to receive the image during a second portion of the calibration cycle. Means are provided for calibrating the first and second sets of elemental detectors by comparing the output of the first set of elemental detectors during the first portion of the calibration cycle with the outputs of the second set of elemental detectors during the second portion of the calibration cycle.

Abstract: In order to reduce the amount of internally scattered radiant energy in an optical system having a collecting optical chamber and a secondary optical chamber, a moving aperture device is positioned in a first focal plane between the chambers; the aperture device has a continuous moving metal band that has staggered slits therein. The band is sprocket driven and cryogenically cooled to reduce thermal emission. The band can be synchronized with other scanning detectors in the optical system such as one might find in an infrared telescope used in outer space.

Abstract: Apparatus for calibrating and testing infrared detection devices is provided. The apparatus comprises a substrate which supports a target pattern of dielectric material which is at least partially absorbing to infrared radiation. A heater is used to supply heat to the substrate. Since the substrate and dielectric material have different emissivities, an apparent temperature difference is perceived by an IR detection device. As a consequence, temperature differences as low as about 0.02.degree. C. and below can be generated for calibrating and testing IR imaging devices.

Abstract: Apparatus for calibrating and testing infrared detection devices is provided. The apparatus comprises a substrate which supports a target pattern of dielectric material which is at least partially absorbing to infrared radiation. A heater is used to supply heat to the substrate. Since the substrate and dielectric material have different emissivities, an apparent temperature difference is perceived by an IR detection device. As a consequence, temperature differences as low as about 0.02.degree. C. and below can be generated for calibrating and testing IR imaging devices.

Abstract: Apparatus, including a detector array, analog-to-digital converter, a microprocessor including a memory, and display for determining the total energy, divergence and position of an applied laser beam from a single laser pulse. The detector array is coupled to the microprocessor and computer memory by way of the analog-to-digital converter. The microprocessor controls the detector array scanning and computes the values for the desired characteristics. The display provides for a numerical, alpha-numerical or printed record of the calculated values. A method of determining the total energy, relative position and divergence is also provided.