Abstract: A computer groups failing paths of a simulated, analyzed integrated circuit. The failing paths are listed and include series connected nodes having names. The node names are represented as node patterns and grouped into node pattern sets. The computer: (1) determines the node pattern in the node pattern set that is most likely to fail in response to a measure of probability of failure of a node pattern in a path on the failing path list, (2) creates a failing path set containing the paths most likely to fail based on the determination of (1), and (3) iterates until each path on the list is in a failing path set by using paths not placed in a failing path set and node patterns not determined to be most likely to fail.

Abstract: A computer groups failing paths of a simulated, analyzed integrated circuit. The failing paths are listed and include series connected nodes having names. The node names are represented as node patterns and grouped into node pattern sets. The computer: (1) determines the node pattern in the node pattern set that is most likely to fail in response to a measure of probability of failure of a node pattern in a path on the failing path list, (2) creates a failing path set containing the paths most likely to fail based on the determination of (1), and (3) iterates until each path on the list is in a failing path set by using paths not placed in a failing path set and node patterns not determined to be most likely to fail.