Abstract: A system and method for testing multiple smart card devices in parallel and asynchronously are provided. The system includes a smart card module that may be easily inserted in a digital test system. The smart card module includes multiple smart card instrument channels, each one of which testing a separate smart card device independently and asynchronously from the others. The smart card instrument channels employ a novel modulation technique based on palette waveforms that are formed of transitions between two data bits.

Abstract: Current consumption of a device under test (DUT) is measured using a tester including a device power supply (DPS) having force and return lines terminating in respective power supply terminals. The DUT is removably received by a load board having contact elements which are in electrically conductive pressure contact with the power supply terminals of the force and return lines and are connected to power supply pins of the DUT. A circuit branch including a bypass capacitor and an nMOSFET is connected between the force and return lines.

Abstract: A circuit tester stimulates an analog circuit device under test (DUT) with a test signal and periodically digitizes a resulting DUT output signal to produce an output data sequence that may be analyzed to ascertain DUT operating characteristics. The tester is powered by a switching power supply that induces periodic noise spikes in the DUT output signal. To eliminate the influence of the noise spikes on test results, the period of the switching power supply noise is made coherent with the digitization period. The phase of digitization is then adjusted so that the tester avoids digitizing the noise spikes in the DUT output signal.

Abstract: Apparatus for automatically testing electronic circuits and performing time measurements, including a time measuring circuit for counting clock pulses provided between stop and start event edges presented to it, two independent input selectors for each selectively connecting one of a plurality of its inputs to the time measuring circuit, and a plurality of local comparators located within the test apparatus near sources of signals to be timed and generating an event edge upon receiving a signal crossing a threshold value. Also disclosed are making time measurements of signals at digital and analog pins using local comparators connected to input selectors over deskewed transmission paths and connecting a local comparator to the filter output of an analog instrument.

Abstract: A differential input selector for selectively connecting one of a plurality of differential inputs to a differential output, the selector including a plurality of pairs of differential input lines, a differential output bus, and a separately powerable differential amplifier connected to each pair of input lines, the amplifier being directly connected to the differential output bus, the amplifier being powered on and off to selectively connect the pair of input lines to the output bus.

Abstract: Apparatus for measuring the difference between two voltages in which a first current proportional to the voltage difference is generated at a first point, and there is circuitry for delivering at a second point a second current that is based on the first current and is indicative of the voltage difference; the circuitry includes an uninterrupted current path from the first point to the second point and the current path has a circuit element across which at least a portion of the common mode voltage appears; and the circuit element provides an output current to the path which is independent of the voltage across the circuit element.