Abstract: An apparatus and method of analysis including at least one microscope means operable to characterize the surface of a sample in use, at least a first conduit to convey one or more solvents to the sample and a further conduit to convey at least part of the solution from the sample. At least one pump means delivers solvent to the sample and/or removes solution from the same.

Abstract: An apparatus and method of analysis including at least one microscope means operable to characterize the surface of a sample in use, at least a first conduit to convey one or more solvents to the sample and a further conduit to convey at least part of the solution from the sample. At least one pump means delivers solvent to the sample and/or removes solution from the same.

Abstract: An apparatus and method of analysis including at least one microscope means operable to characterize the surface of a sample in use, at least a first conduit to convey one or more solvents to the sample and a further conduit to convey at least part of the solution from the sample. At least one pump means delivers solvent to the sample and/or removes solution from the same.

Abstract: An apparatus and method of analysis including at least one microscope means operable to characterize the surface of a sample in use, at least a first conduit to convey one or more solvents to the sample and a further conduit to convey at least part of the solution from the sample. At least one pump means delivers solvent to the sample and/or removes solution from the same.

Abstract: An AFM based technique has been demonstrated for performing highly localized IR spectroscopy on a sample surface. Such a technique implemented in a commercially viable analytical instrument would be extremely useful. Various aspects of the experimental set-up have to be changed to create a commercial version. The invention addresses many of these issues thereby producing a version of the analytical technique that can be made generally available to the scientific community.

Abstract: An AFM based technique has been demonstrated for performing highly localized IR spectroscopy on a sample surface. Significant issues as to size, cost of implementation, and repeatability/robustness of results exist in commercializing the technique. The invention addresses many of these issues thereby producing a version of the analytical technique that can be made generally available to the scientific community.

Abstract: An AFM based technique has been demonstrated for performing highly localized IR spectroscopy on a sample surface. Significant issues as to size, cost of implementation, and repeatability/robustness of results exist in commercializing the technique. The invention addresses many of these issues thereby producing a version of the analytical technique that can be made generally available to the scientific community.

Abstract: A system and method for automatic analysis of temperature transition data over an area of a sample surface. The system relies on the use of a microfabricated probe, which can be rapidly heated and cooled and has a sharp tip to provide high spatial resolution. The system also has fast x-y-z positioners, data collection, and algorithms that allow automatic analysis of and visualization of temperature transition data.

Abstract: An AFM based technique has been demonstrated for performing highly localized IR spectroscopy on a sample surface. Such a technique implemented in a commercially viable analytical instrument would be extremely useful. Various aspects of the experimental set-up have to be changed to create a commercial version. The invention addresses many of these issues thereby producing a version of the analytical technique that cab be made generally available to the scientific community.

Abstract: An AFM based technique has been demonstrated for performing highly localized IR spectroscopy on a sample surface. Such a technique implemented in a commercially viable analytical instrument would be extremely useful. Various aspects of the experimental set-up have to be changed to create a commercial version. The invention addresses many of these issues thereby producing a version of the analytical technique that cab be made generally available to the scientific community.

Abstract: A process for assembling molecules on a surface, the process comprising: providing a probe having a variable-temperature tip; providing a first material, which is optionally on a first surface of a substrate; bringing the tip of the probe into contact with the first material, whereby molecules of the first material are transferred to the tip; and moving the tip of the probe to a position above a surface of a second material (the second surface); then heating the tip of the probe to a temperature T2, at which the first material will transfer from the tip to the surface of the second material. Analytical process using this method are also disclosed.

Abstract: A system and method for automatic analysis of temperature transition data over an area of a sample surface. The system relies on the use of a microfabricated probe, which can be rapidly heated and cooled and has a sharp tip to provide high spatial resolution. The system also has fast x-y-z positioners, data collection, and algorithms that allow automatic analysis of and visualization of temperature transition data.

Abstract: A modulated differential scanning calorimeter that accounts for heat flow due to evaporative solvent loss. The calorimeter modulates the temperature applied to a sample and a reference to determine the amount of heat flow that is due to evaporation. By calculating the amount of heat flow due to evaporation, the user can determine how much of the heat flow of any given well is due to the process of interest as opposed to evaporation.

Abstract: A method for using a neural network to deconvolute the effects due to surface topography from the effects due to the other physical property being measured in a scanning probe microscopy (SPM) or atomic force microscopy (AFM) image. In the case of a thermal SPM, the SPM probe is scanned across the surface of a sample having known uniform thermal properties, measuring both the surface topography and thermal properties of the sample. The data thus collected forms a training data set. Several training data sets can be collected, preferably on samples having different surface topographies. A neural network is applied to the training data sets, such that the neural network learns how to deconvolute the effects dues to surface topography from the effects dues to the variations in thermal properties of a sample.

Abstract: A modulated differential scanning calorimeter that accounts for heat flow due to evaporative solvent loss. The calorimeter modulates the temperature applied to a sample and a reference to determine the amount of heat flow that is due to evaporation. By calculating the amount of heat flow due to evaporation, the user can determine how much of the heat flow of any given well is due to the process of interest as opposed to evaporation.

Abstract: A method and a system for generating a high spatial resolution multi-dimensional image representing the chemical composition of a sample. Highly localized IR light is used to cause the heating and thermal expansion of the sample. Modulating this IR light will cause this effect to take place at various depths of the material. The method and system of the present invention are used to generate a chemical profile of the sample using a combination of: (i) measurements of the thermal expansion and temperature change caused by absorbing IR radiation together; and (ii) measurements of the thermal expansion properties and thermal properties (such as thermal diffusivity and conductivity) of sites on the surface of the sample and the material surrounding it.

Abstract: A method for calibrating thermal resistance and thermal capacitance parameters characterizing a DSC cell, and then calculating the heat flow to the sample based upon the results of the calibration. The method is applied in a conventional heat flux calorimeter, to obtain thermal analysis data having improved baseline and resolution. A first embodiment is based upon a model of a calorimeter in which there is no cross-talk between the sample and reference sides of a DSC cell. The thermal resistance and thermal capacitance parameters are calculated by carrying out a sequential series of calibration measurements with an empty DSC cell, materials on the reference side and materials on both the sample and reference sides. Another embodiment takes the existence of cross-talk between the sample and reference sides of the calorimeter into account.

Abstract: A method for using a neural network to deconvolute the effects due to surface topography from the effects due to the other physical property being measured in a scanning probe microscopy (SPM) or atomic force microscopy (AFM) image. In the case of a thermal SPM, the SPM probe is scanned across the surface of a sample having known uniform thermal properties, measuring both the surface topography and thermal properties of the sample. The data thus collected forms a training data set. Several training data sets can be collected, preferably on samples having different surface topographies. A neural network is applied to the training data sets, such that the neural network learns how to deconvolute the effects dues to surface topography from the effects dues to the variations in thermal properties of a sample.

Abstract: A platinum/Rhodium resistance thermal probe is used as an active device which acts both as a highly localized heat source and as a detector to perform localized differential calorimetry, by thermally inducing and detecting events such as glass transitions, meltings, recystallizations and thermal decomposition within volumes of material estimated at a few &mgr;m3. Furthermore, the probe is used to image variations in thermal conductivity and diffusivity, to perform depth profiling and sub-surface imaging. The maximum depth of the sample that is imaged is controlled by generating and detecting evanescent temperature waves in the sample.

Abstract: Sub-micron chemical analysis of the surface and sub-surface of a sample material is performed at, above or under atmospheric pressure, or on for a sample material submerged in a substance. A thermal and/or topographic image of the surface of the sample material is obtained. A location for study is selected using the image. The activation device is positioned over the selected location and surface and/or sub-surface products are ablated, desorbed or decomposed from the sample material to a chemical analyzer for analysis.