Patents by Inventor Michael Reinstadtler

Michael Reinstadtler has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7360404
    Abstract: A method for examining a surface of a sample is described using an atomic force scanning microscope (AFM) comprising a cantilever with a longitudinal extension along which a measuring tip is disposed, which is selectively arranged relative to the sample surface by a means for driving and whose spatial position is detected using a sensor unit. Vibration excitation is conducted at excitation amplitudes which produce inside the cantilever torsional amplitudes with maximum values which form a largely (substantively) constant plateau value despite increasing excitation amplitudes and the resonance spectra, in a range of maximum values of the torsional amplitudes, a widening of the resonance spectrum which is determinable by a plateau width. The resonance spectra, preferably the plateau value, the plateau width and/or the gradient of the respective resonance spectra are used for examining the sample.
    Type: Grant
    Filed: August 14, 2003
    Date of Patent: April 22, 2008
    Assignee: Fraunhofer-Gesellschaft zur Förderung der Angelwandten Forschung E.V.
    Inventors: Michael Reinstadtler, Ute Rabe, Walter Arnold
  • Publication number: 20070089497
    Abstract: A method for exciting free torsional vibrations in a spring cantilever, which is clamped in on one side and has a longitudinal extension, of an atomic force microscope (AFM) is disclosed.
    Type: Application
    Filed: May 7, 2004
    Publication date: April 26, 2007
    Inventor: Michael Reinstadtler
  • Publication number: 20060150719
    Abstract: Described is a method for examining a surface of a sample using an atomic force scanning microscope (AFM) comprising a cantilever with a longitudinal extension along which a measuring tip is disposed, which is selectively arranged relative to said sample surface by a driver means and whose spatial position is detected using a sensor unit, and said microscope is provided with at least one ultrasound generator, which initiates vibration excitation at a given excitation frequency between said sample surface and said cantilever, the measuring tip of which is brought into contact with said sample surface in such a manner that said measuring tip is excited to vibrations which are oriented lateral to said sample surface and perpendicular to said longitudinal extension of said cantilever and that the torsional vibrations induced in said cantilever are detected and analyzed by means of an evaluation unit.
    Type: Application
    Filed: August 14, 2003
    Publication date: July 13, 2006
    Inventors: Michael Reinstadtler, Ute Rabe, Walter Arnold