Abstract: Embodiments may relate to a substrate for use in a system in package (SIP). The substrate may include a first couple to couple with a first component via a permanent couple such that the first component is communicatively coupled with a bridge. The substrate may further include a second couple to removably couple with an interposer such that the interposer is communicatively coupled with the bridge via a communicative couple. Other embodiments may be described or claimed.

Abstract: Examples relate to control apparatus, a control device, a method and a computer program for determining a device-specific supply voltage for a semiconductor device, and to a corresponding semiconductor device and corresponding systems. The control apparatus is configured to obtain measurement data of measurement circuitry of the semiconductor device, the measurement data being related to a progress of aging of the semiconductor device. The control apparatus is configured to determine the device-specific supply voltage of the semiconductor device based on the measurement data. The control apparatus is configured to provide information on the device-specific supply voltage for a supply voltage control apparatus.

Abstract: Embodiments may relate to a substrate for use in a system in package (SIP). The substrate may include a first couple to couple with a first component via a permanent couple such that the first component is communicatively coupled with a bridge. The substrate may further include a second couple to removably couple with an interposer such that the interposer is communicatively coupled with the bridge via a communicative couple. Other embodiments may be described or claimed.

Abstract: A technique includes locking a locked loop circuit onto a reference clock signal. The locking includes locking the lock loop circuit onto the reference clock signal in response to a first feedback signal provided by a first feedback path and locking the locked loop circuit onto the reference clock signal in response to a second feedback signal that is provided by a second feedback path.

Abstract: An embodiment of the present invention is a technique to control clock distribution to a circuit. A scheduler schedules a sequence of a clock distribution of clock signals to a plurality of clock distribution domains (CKDOMs) in the circuit according to a state status of the circuit. A controller controls enabling the clock distribution to the CKDOMs according to the scheduled sequence.

Abstract: A method, an apparatus, and a system for phase jitter measurement circuits are described herein.

Abstract: A system and method for processing signals determines rise and fall times of a driving signal, compares the rise and fall times to desired values, and independently controls the rise and fall times to equal the desired values. The rise and fall times may be controlled by generating one or more first correction bits based on a difference between the rise time and a corresponding one of the desired values, generating one or more second correction bits based on a difference between the fall time and a corresponding one of the desired values, and then separately applying the bits to independently control the rise and fall times of the driving signal. The driving signal may be an I/O signal or another type of signal.

Abstract: A system and method for processing signals determines rise and fall times of a driving signal, compares the rise and fall times to desired values, and independently controls the rise and fall times to equal the desired values. The rise and fall times may be controlled by generating one or more first correction bits based on a difference between the rise time and a corresponding one of the desired values, generating one or more second correction bits based on a difference between the fall time and a corresponding one of the desired values, and then separately applying the bits to independently control the rise and fall times of the driving signal. The driving signal may be an I/O signal or another type of signal.

Abstract: An apparatus and method for calibrating a delay element is described herein.