Patents by Inventor Michael ROZLER

Michael ROZLER has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Methods of calibrating semiconductor radiation detectors using K-edge filters
    Patent number: 11169286
    Abstract: A set of N standard bin count distributions may be generated by irradiating a test radiation detector system with an X-ray beam attenuated by a respective one of N different K-edge filters for each of the at least one X-ray source energy setting. Energy bins of detectors of a target radiation detector system may be calibrated by generating measured bin count distributions for each calibration setting in which a respective one of the N different K-edge filters attenuates a source X-ray beam. Calibration parameters of the detectors of the target radiation detector system may be adjusted to match each of the measured bin count distributions to a corresponding standard bin count distribution. In addition, energy resolution of the radiation detectors can be measured and calibrated by fitting a portion of the measured X-ray spectrum near a K-edge to a fitting function.
    Type: Grant
    Filed: October 9, 2018
    Date of Patent: November 9, 2021
    Assignee: REDLEN TECHNOLOGIES, INC.
    Inventors: Elmaddin Guliyev, Georgios Prekas, Michael Rozler, Krzysztof Iniewski, Jean Marcoux, Conny Hansson
  • METHODS OF CALIBRATING SEMICONDUCTOR RADIATION DETECTORS USING K-EDGE FILTERS
    Publication number: 20190383956
    Abstract: A set of N standard bin count distributions may be generated by irradiating a test radiation detector system with an X-ray beam attenuated by a respective one of N different K-edge filters for each of the at least one X-ray source energy setting. Energy bins of detectors of a target radiation detector system may be calibrated by generating measured bin count distributions for each calibration setting in which a respective one of the N different K-edge filters attenuates a source X-ray beam. Calibration parameters of the detectors of the target radiation detector system may be adjusted to match each of the measured bin count distributions to a corresponding standard bin count distribution. In addition, energy resolution of the radiation detectors can be measured and calibrated by fitting a portion of the measured X-ray spectrum near a K-edge to a fitting function.
    Type: Application
    Filed: October 9, 2018
    Publication date: December 19, 2019
    Inventors: Elmaddin GULIYEV, Georgios PREKAS, Michael ROZLER, Krzysztof INIEWSKI, Jean MARCOUX, Conny HANNSON