Patents by Inventor Michael S. Keehr

Michael S. Keehr has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7199180
    Abstract: Disclosed are adhesives and processes for preparing the same, comprising at least one first homogeneous ethylene/?-olefin interpolymer, and optionally at least one tackifier, and optionally at least one plasticizer. The claimed adhesives are useful as adhesives such as are employed in various applications, such as in masking tape, clear office tape, labels, decals, bandages, decorative and protective sheets (such as shelf and drawer liners), floor tiles, sanitary napkin/incontinence device placement strips, sun control films, the joining of gaskets to automobile windows, packaging, bookbinding, construction of nonwoven articles, and insulation bonding.
    Type: Grant
    Filed: March 14, 1997
    Date of Patent: April 3, 2007
    Assignees: The Dow Chemical Company, H.B. Fuller Licensing & Financing Inc.
    Inventors: Eugene R. Simmons, William L. Bunnelle, David B. Malcolm, Keith C. Knutson, Thomas F. Kauffman, Mark S. Kroll, Michael S. Keehr, Deepak R. Parikh, Jimmy D. Allen, David R. Speth, Selim Yalvac, Malcolm F. Finlayson, Cynthia L. Rickey
  • Patent number: 6582829
    Abstract: A hot melt adhesive composition comprising a) from about 5 wt-% to about 50 wt-% of at least one homogeneous linear or substantially linear ethylene/alpha-olefin interpolymer characterized as having a density from 0.850 to 0.965 g/cm3; b) from about 1 wt-% to about 40 wt-% of at least one block copolymer; and c) from about 10 wt-% to about 75 wt-% of at least one tackifying resin wherein said adhesive does not fail cohesively.
    Type: Grant
    Filed: June 30, 1999
    Date of Patent: June 24, 2003
    Assignee: H.B. Fuller Licensing & Financing Inc.
    Inventors: Thomas H. Quinn, Janelle C. Cameron, Beth M. Eichler-Johnson, Michael S. Keehr, Jeffrey S. Lindquist, David B. Malcolm, Kevin W. McKay, Deepak R. Parikh