Patents by Inventor Michael Schwertner
Michael Schwertner has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20190041621Abstract: A method for the optical detection of an illuminated specimen, wherein the illuminating light impinges in a spatially structured manner in at least one plane on the specimen and several images of the specimen are acquired by a detector in different positions of the structure on the specimen. An optical sectional image and/or an image with enhanced resolution is then calculated. The method includes generating a diffraction pattern in the direction of the specimen in or near the pupil of the objective lens or in a plane conjugate to the pupil. A phase plate with regions of varying phase delays is dedicated to the diffraction pattern in or near the pupil of the objective lens or in a plane conjugate to said pupil, and different phase angles of the illuminating light are set.Type: ApplicationFiled: June 11, 2018Publication date: February 7, 2019Inventors: Michael Schwertner, Ralf Wolleschensky, Michael Kempe
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Patent number: 9995919Abstract: A method for the optical detection of an illuminated specimen, wherein the illuminating light impinges in a spatially structured manner in at least one plane on the specimen and several images of the specimen are acquired by a detector in different positions of the structure on the specimen. An optical sectional image and/or an image with enhanced resolution is then calculated. The method includes generating a diffraction pattern in the direction of the specimen in or near the pupil of the objective lens or in a plane conjugate to the pupil. A phase plate with regions of varying phase delays is dedicated to the diffraction pattern in or near the pupil of the objective lens or in a plane conjugate to said pupil, and different phase angles of the illuminating light are set.Type: GrantFiled: August 14, 2013Date of Patent: June 12, 2018Assignee: Carl Zeiss Microscopy GmbHInventors: Michael Schwertner, Ralf Wolleschensky, Michael Kempe
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Patent number: 9927226Abstract: A method and a configuration for the depth-resolved optical detection of a specimen, in which a specimen or a part of the specimen is scanned by means of preferably linear illumination. The illumination of the specimen is periodically structured in the focus in at least one spatial direction. Light coming from the specimen is detected and images of the specimen are generated. At least one optical sectional image and/or one image with enhanced resolution is calculated through the specimen. Images are repeatedly acquired and sectional images are repeatedly blended while changing the orientation of the linear illumination relative to the specimen and/or spatial intervals between lines exposed to detection light from the illuminated specimen region are generated for the line-by-line non-descanned detection on an area detector or a camera and/or, during a scan, light is further deflected upstream of the detector through the line in the direction of the scan of the specimen.Type: GrantFiled: January 2, 2014Date of Patent: March 27, 2018Assignee: Carl Zeiss Microscopy GmbHInventors: Michael Kempe, Ralf Wolleschensky, Michael Schwertner
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Patent number: 8797645Abstract: A method for the optical detection of an illuminated specimen, wherein the illuminating light impinges in a spatially structured manner in at least one plane on the specimen and several images of the specimen are acquired by a detector in different positions of the structure on the specimen. An optical sectional image and/or an image with enhanced resolution is then calculated. The method includes generating a diffraction pattern in the direction of the specimen in or near the pupil of the objective lens or in a plane conjugate to the pupil. A phase plate with regions of varying phase delays is dedicated to the diffraction pattern in or near the pupil of the objective lens or in a plane conjugate to said pupil, and different phase angles of the illuminating light are set.Type: GrantFiled: August 14, 2013Date of Patent: August 5, 2014Assignee: Carl Zeiss MicroImaging GmbHInventors: Michael Schwertner, Ralf Wolleschensky, Michael Kempe
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Publication number: 20140177044Abstract: A method for the optical detection of an illuminated specimen, wherein the illuminating light impinges in a spatially structured manner in at least one plane on the specimen and several images of the specimen are acquired by a detector in different positions of the structure on the specimen. An optical sectional image and/or an image with enhanced resolution is then calculated. The method includes generating a diffraction pattern in the direction of the specimen in or near the pupil of the objective lens or in a plane conjugate to the pupil. A phase plate with regions of varying phase delays is dedicated to the diffraction pattern in or near the pupil of the objective lens or in a plane conjugate to said pupil, and different phase angles of the illuminating light are set.Type: ApplicationFiled: August 14, 2013Publication date: June 26, 2014Applicant: Carl Zeiss Microscopy GmbHInventors: Michael SCHWERTNER, Ralf Wolleschensky, Michael Kempe
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Publication number: 20140118750Abstract: A method and a configuration for the depth-resolved optical detection of a specimen, in which a specimen or a part of the specimen is scanned by means of preferably linear illumination. The illumination of the specimen is periodically structured in the focus in at least one spatial direction. Light coming from the specimen is detected and images of the specimen are generated. At least one optical sectional image and/or one image with enhanced resolution is calculated through the specimen. Images are repeatedly acquired and sectional images are repeatedly blended while changing the orientation of the linear illumination relative to the specimen and/or spatial intervals between lines exposed to detection light from the illuminated specimen region are generated for the line-by-line non-descanned detection on an area detector or a camera and/or, during a scan, light is further deflected upstream of the detector through the line in the direction of the scan of the specimen.Type: ApplicationFiled: January 2, 2014Publication date: May 1, 2014Applicant: Carl Zeiss Microscopy GmbHInventors: Michael KEMPE, Ralf Wolleschensky, Michael Schwertner
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Publication number: 20130329284Abstract: A method for the optical detection of an illuminated specimen, wherein the illuminating light impinges in a spatially structured manner in at least one plane on the specimen and several images of the specimen are acquired by a detector in different positions of the structure on the specimen. An optical sectional image and/or an image with enhanced resolution is then calculated. The method includes generating a diffraction pattern in the direction of the specimen in or near the pupil of the objective lens or in a plane conjugate to the pupil. A phase plate with regions of varying phase delays is dedicated to the diffraction pattern in or near the pupil of the objective lens or in a plane conjugate to said pupil, and different phase angles of the illuminating light are set.Type: ApplicationFiled: August 14, 2013Publication date: December 12, 2013Applicant: Carl Zeiss Microlmaging GmbHInventors: Michael SCHWERTNER, Ralf Wolleschensky, Michael Kempe
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Patent number: 8537461Abstract: A method for the optical detection of an illuminated specimen, wherein the illuminating light impinges in a spatially structured manner in at least one plane on the specimen and several images of the specimen are acquired by a detector in different positions of the structure on the specimen. An optical sectional image and/or an image with enhanced resolution is then calculated. The method includes generating a diffraction pattern in the direction of the specimen in or near the pupil of the objective lens or in a plane conjugate to the pupil. A structured phase plate with regions of varying phase delays is dedicated to the diffraction pattern in or near the pupil of the objective lens or in a plane conjugate to said pupil, and different phase angles of the illuminating light are set.Type: GrantFiled: November 25, 2008Date of Patent: September 17, 2013Assignee: Carl Zeiss MicroImaging GmbHInventors: Michael Schwertner, Ralf Wolleschensky, Michael Kempe
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Publication number: 20120019647Abstract: A method and a configuration for the depth-resolved optical detection of a specimen, in which a specimen or a part of the specimen is scanned by means of preferably linear illumination. The illumination of the specimen is periodically structured in the focus in at least one spatial direction. Light coming from the specimen is detected and images of the specimen are generated. At least one optical sectional image and/or one image with enhanced resolution is calculated through the specimen. Images are repeatedly acquired and sectional images are repeatedly blended while changing the orientation of the linear illumination relative to the specimen and/or spatial intervals between lines exposed to detection light from the illuminated specimen region are generated for the line-by-line non-descanned detection on an area detector or a camera and/or, during a scan, light is further deflected upstream of the detector through the line in the direction of the scan of the specimen.Type: ApplicationFiled: June 28, 2011Publication date: January 26, 2012Inventors: Michael KEMPE, Ralf Wolleschensky, Michael Schwertner
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Patent number: 7977625Abstract: A method and an assembly for generating optical section images permit the three-dimensional, layered optical scanning of spatially extended objects. Illumination patterns with periodicity in at least one direction are projected into a plane and the light from the sample which is reflected and/or scattered and/or emitted fluorescence light is being imaged onto a spatially resolving detector. Initially, there is a calibration step, in which the local phase and/or the local period of the illumination patterns are determined for each location on the detector. In the sample detection mode, for the calculation of each optical section image there are two illumination patterns projected into or onto the sample and the resulting intensity distributions are used to form an image on the detector.Type: GrantFiled: April 11, 2008Date of Patent: July 12, 2011Inventor: Michael Schwertner
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Publication number: 20100108873Abstract: The invention relates to a method and an assembly for generating optical section images. The invention permits the three-dimensional, layered optical scanning of spatially extended objects and is used in microscopy, but is not limited to this field. In said method, illumination patterns with periodicity in at least one direction are projected into a Plane and the light from the sample which is reflected and/or scattered and/or emitted fluorescence light is being imaged onto a spatially resolving detector. According to the invention, initially there is a calibration step, in which the local phase and/or the local period of the illumination patterns are determined for each location on the detector. In the sample detection mode, for the calculation of each optical section image there are two illumination patterns projected into or onto the sample and the resulting intensity distributions are used to form an image on the detector.Type: ApplicationFiled: April 11, 2008Publication date: May 6, 2010Inventor: Michael Schwertner
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Publication number: 20090168158Abstract: A method for the optical detection of an illuminated specimen, wherein the illuminating light impinges in a spatially structured manner in at least one plane on the specimen and several images of the specimen are acquired by a detector in different positions of the structure on the specimen, from which images an optical sectional image and/or an image with enhanced resolution is calculated. The method includes generating a diffraction pattern in the direction of the specimen in or near the pupil of the objective lens or in a plane conjugate to the pupil. A structured phase plate with regions of varying phase delays is dedicated to the diffraction pattern in or near the pupil of the objective lens or in a plane conjugate to said pupil.Type: ApplicationFiled: November 25, 2008Publication date: July 2, 2009Inventors: Michael SCHWERTNER, Ralf Wolleschensky, Michael Kempe
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Publication number: 20090161203Abstract: A method and a configuration for the depth-resolved optical detection of a specimen, wherein a specimen or a part of the specimen is scanned by means of preferably linear illumination, the illumination of the specimen is periodically structured in the focus in at least one spatial direction, light coming from the specimen is detected and images of the specimen are generated, and at least one optical sectional image and/or one image with enhanced resolution is calculated through the specimen is calculated [sic], images are repeatedly acquired and sectional images are repeatedly blended while changing the orientation of the linear illumination relative to the specimen and/or spatial intervals between from lines exposed to detection light from the illuminated specimen region are generated for the line-by-line non-descanned detection on an area detector or a camera and/or, during a scan, light is further deflected upstream of the detector through the line in the direction of the scan of the specimen.Type: ApplicationFiled: November 25, 2008Publication date: June 25, 2009Inventors: Michael KEMPE, Ralf Wolleschensky, Michael Schwertner