Abstract: A snap-in fastener is provided for securing a vehicle component to a vehicle structure. The fastener comprises a base having a longitudinal axis, a first leg extending downwardly and outwardly from the base and configured to apply a force to the vehicle structure in a first direction, and a second leg extending downwardly from the base and configured to apply a force to the vehicle structure in a second direction that is substantially opposite the first direction. The first leg may have a first portion extending from the base at a first angle relative to the longitudinal axis and a second portion extending from the first portion at a second angle relative to the longitudinal axis that is different than the first angle. The first leg may also have a foot having a contact surface with an inwardly extending profile for engaging an edge of the vehicle structure.

Abstract: A snap-in fastener is provided for securing a vehicle component to a vehicle structure. The fastener comprises a base having a longitudinal axis, a first leg extending downwardly and outwardly from the base and configured to apply a force to the vehicle structure in a first direction, and a second leg extending downwardly from the base and configured to apply a force to the vehicle structure in a second direction that is substantially opposite the first direction. The first leg may have a first portion extending from the base at a first angle relative to the longitudinal axis and a second portion extending from the first portion at a second angle relative to the longitudinal axis that is different than the first angle. The first leg may also have a foot having a contact surface with an inwardly extending profile for engaging an edge of the vehicle structure.

Abstract: Homogeneity residuals of the refractive index have a strong influence on the performance of lithography tools for both 193 and 157 nm application wavelengths. By systematic investigations of various defects in the real structure of CaF2 crystals, the origin of homogeneity residuals can be shown. Based on a quantitative analysis we define limiting values for the individual defects which can be either tolerated or controlled by optimized process steps, e.g. annealing. These correlations were carried out for all three relevant main crystal lattice orientations of CaF2 blanks. In conclusion we achieved a strong improvement of the critical parameters of both refractive index homogeneity and striae for large size lens blanks up to 270 mm diameter.

Abstract: Homogeneity residuals of the refractive index have a strong influence on the performance of lithography tools for both 193 and 157 nm application wavelengths. By systematic investigations of various defects in the real structure of CaF2 crystals, the origin of homogeneity residuals can be shown. Based on a quantitative analysis we define limiting values for the individual defects which can be either tolerated or controlled by optimized process steps, e.g. annealing. These correlations were carried out for all three relevant main crystal lattice orientations of CaF2 blanks. In conclusion we achieved a strong improvement of the critical parameters of both refractive index homogeneity and striae for large size lens blanks up to 270 mm diameter.

Abstract: The present invention relates to a method and a device for quantitative determination of the optical quality of a transparent material. In the method, a light beam is incident on the sample made of the transparent material, in order to form a scattering volume in the sample, wherein light scattered in the scattering volume at a predefined scattering angle (?s) is imaged on a light-sensitive element and wherein signals of the light-sensitive element are integrated or added up over at least a portion of the scattering volume in order to determine a measured value representing the optical quality of the transparent material of the sample. Signal contributions which do not originate from scattering of the incident light beam at the light entry or light exit surfaces of the sample are used exclusively to determine the measured variable.