Patents by Inventor Michael Sheffer

Michael Sheffer has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6743220
    Abstract: A surgical instrument for use by a surgeon for grasping a tissue of a surgical patient without causing a crush injury of the tissue is disclosed. The instrument includes an elongate shaft having two ends with a handle at a first end of the shaft, and a grasping tip at a second end of the shaft. The grasping tip includes a body housing at least one suction element, wherein the at least one suction element mechanically produces suction locally (distally) within the grasping tip.
    Type: Grant
    Filed: May 1, 2002
    Date of Patent: June 1, 2004
    Inventors: Michael Sheffer, Arkadi Gorenstein
  • Publication number: 20030208185
    Abstract: A surgical instrument for use by a surgeon for grasping a tissue of a surgical patient without causing a crush injury of the tissue is disclosed. The instrument includes an elongate shaft having two ends with a handle at a first end of the shaft, and a grasping tip at a second end of the shaft. The grasping tip includes a body housing at least one suction element, wherein the at least one suction element mechanically produces suction locally (distally) within the grasping tip.
    Type: Application
    Filed: May 1, 2002
    Publication date: November 6, 2003
    Inventors: Michael Sheffer, Arkadi Gorenstein
  • Publication number: 20030025906
    Abstract: A new method of optical inspection of populated printed circuit boards (PCB), specifically of component leads and solder joints, is provided. At least a portion of the PCB being tested is illuminated with a beam of collimated light. A light detecting device detects specular reflection from the features being examined on the PCB for diagnostically useful patterns. For example, each properly soldered gull-wing lead produces three detectable reflections, each properly soldered J-type lead produces two detectable reflections, and each properly soldered rectangular lead produces one detectable reflection. Other PCB features produce other diagnostically useful reflections. An anomalous reflection indicates, for example, improper soldering or a misplaced component. The invention can be configured to inspect a plurality of leads simultaneously, allowing increased throughput.
    Type: Application
    Filed: August 6, 2001
    Publication date: February 6, 2003
    Applicant: BEAMWORKS LTD.
    Inventor: Michael Sheffer
  • Patent number: 6072150
    Abstract: An apparatus and method for thermal processing of a workpiece in an assembly line. The workpiece is carried by a conveyor into a target zone, where one or more optical systems aim multiple radiation beams of a first wavelength at selected locations on the workpiece to heat those locations. Infrared radiation resulting from that heating is monitored for process quality control. Depending on the time profile of the infrared radiation, the workpiece may be diverted for reprocessing or discarded. Each optical systems is translated as a whole with respect to the workpiece, so that the beams can be aimed at a relatively large flat workpiece at incidence angles that do not depart excessively from vertical. The conveyor is transparent to the radiation beams, and a sensor, placed on the other side of the conveyor from the aiming mechanism, is used to calibrate the aim of the optical systems.
    Type: Grant
    Filed: January 26, 1999
    Date of Patent: June 6, 2000
    Assignee: Beamworks Ltd.
    Inventor: Michael Sheffer
  • Patent number: 6043454
    Abstract: An apparatus and method for thermal processing of a workpiece in an assembly line. The workpiece is carried by a conveyor into a target zone, where one or more optical systems aim multiple radiation beams of a first wavelength at selected locations on the workpiece to heat those locations. Infrared radiation resulting from that heating is monitored for process quality control. Depending on the time profile of the infrared radiation, the workpiece may be diverted for reprocessing or discarded. Each optical systems is translated as a whole with respect to the workpiece, so that the beams can be aimed at a relatively large flat workpiece at incidence angles that do not depart excessively from vertical. The conveyor is transparent to the radiation beams, and a sensor, placed on the other side of the conveyor from the aiming mechanism, is used to calibrate the aim of the optical systems.
    Type: Grant
    Filed: May 27, 1998
    Date of Patent: March 28, 2000
    Assignee: Beamworks Ltd.
    Inventor: Michael Sheffer