Abstract: A method and apparatus are provided for controlling an SAR ADC by generating a first signal to control sampling of an analog input voltage at a DAC, and then generating a second signal to start a successive approximation sequence at a comparator and SAR engine to convert the analog input voltage to an N-bit digital value, where the successive approximation sequence includes a settling phase for each bit of the N-bit digital value and is controlled to synchronously end in response to a first synchronous clock signal, and also includes a comparison phase for each bit of the N-bit digital value to allow for comparison of the analog input voltage to a reference voltage, where each comparison phase is controlled to synchronously start in response to the first synchronous clock signal and asynchronously end in response to a second asynchronous clock signal that is self-generated by the comparator.

Abstract: A voltage switch for handling negative voltages includes an input terminal coupled to a voltage that is greater than a voltage rating of oxide in the voltage switch, a top capacitor plate pre-charge module including three cascoded p-channel transistors coupled between a supply voltage and a top plate of a capacitor, a bottom capacitor plate pre-charge module including two cascoded n-channel transistors coupled between a bottom plate of the capacitor and ground, and an output voltage module including an output terminal and four cascoded n-channel transistors with control electrodes of a first and fourth of the cascoded n-channel transistors coupled to a boost node. Control electrodes of a second and third of the cascoded n-channel transistors coupled to the top plate of the capacitor. A voltage switch for positive voltages is also disclosed.

Abstract: A buck converter includes a comparator having first and second gain stages that operate in compare and auto-zero modes. The comparator measures voltage drop across an N-channel transistor to determine when current through an inductor reaches zero. When the inductor current reaches zero, the N-channel transistor becomes inactive to prevent a reduction in efficiency caused by allowing negative inductor current to draw current from a load. The comparator is then placed in a low power state. When the comparator is not in a compare mode, the comparator can operate in an auto-zero mode to cancel offset when measuring the input of the comparator.

Abstract: A tunable clock circuit has a dual overlapping digital to analog converter (DAC) and an oscillator. The dual overlapping DAC provides a first output selectable with a first resolution and a second output selectable with a second resolution. The first resolution is different from the second resolution. The oscillator has a first input coupled to the first output of the dual overlapping DAC, a second input coupled to the second output of the dual overlapping DAC, and an output providing a clock output signal.

Abstract: A boost converter includes a comparator having first and second gain stages that operate in compare and auto-zero modes. The comparator measures voltage drop across a P-channel transistor to determine when current through an inductor reaches zero. When the inductor current reaches zero, the P-channel transistor becomes inactive to prevent a reduction in efficiency caused by allowing negative inductor current to draw current from a load. The comparator is then placed in a low power state. When the comparator is not in a compare mode, the comparator can operate in an auto-zero mode to cancel offset when measuring the input of the comparator.

Abstract: A clock doubler circuit includes a filtering circuit. The filtering circuit includes a first input to receive a first clock signal, a first output to provide a second clock signal, and a second output to provide a third clock signal. The third clock signal is a complementary signal to the second clock signal. The first clock signal, the second clock signal, and the third clock signal are at a first clock frequency. The second clock signal is a low pass filtered version of the first clock signal. The clock doubler circuit includes a frequency doubling circuit. The frequency doubling circuit includes a first input to receive the second clock signal and a second input to receive the third clock signal. The frequency doubling circuit includes an output node. The output node provides a fourth clock signal at a second clock frequency that is twice the first clock frequency.

Abstract: Systems and methods for electronically converting an analog signal to a digital signal are disclosed. The systems and methods may include, for a first bit value, setting a first conversion value to include a first offset; using the output of a first comparison, setting a second conversion value; and if the first bit value has a predetermined relationship to the first offset bit value, removing the first offset from the second conversion value, and, using the output of a second comparison, setting a third conversion value.

Abstract: Systems and methods for electronically converting an analog signal to a digital signal are disclosed. The systems and methods may include, for a first bit value, setting a first conversion value to include a first offset; using the output of a first comparison, setting a second conversion value; and if the first bit value has a predetermined relationship to the first offset bit value, removing the first offset from the second conversion value, and, using the output of a second comparison, setting a third conversion value.

Abstract: A boost converter includes a comparator having first and second gain stages that operate in compare and auto-zero modes. The comparator measures voltage drop across a P-channel transistor to determine when current through an inductor reaches zero. When the inductor current reaches zero, the P-channel transistor becomes inactive to prevent a reduction in efficiency caused by allowing negative inductor current to draw current from a load. The comparator is then placed in a low power state. When the comparator is not in a compare mode, the comparator can operate in an auto-zero mode to cancel offset when measuring the input of the comparator.

Abstract: A buck converter includes a comparator having first and second gain stages that operate in compare and auto-zero modes. The comparator measures voltage drop across an N-channel transistor to determine when current through an inductor reaches zero. When the inductor current reaches zero, the N-channel transistor becomes inactive to prevent a reduction in efficiency caused by allowing negative inductor current to draw current from a load. The comparator is then placed in a low power state. When the comparator is not in a compare mode, the comparator can operate in an auto-zero mode to cancel offset when measuring the input of the comparator.

Abstract: A clock doubler circuit includes a filtering circuit. The filtering circuit includes a first input to receive a first clock signal, a first output to provide a second clock signal, and a second output to provide a third clock signal. The third clock signal is a complementary signal to the second clock signal. The first clock signal, the second clock signal, and the third clock signal are at a first clock frequency. The second clock signal is a low pass filtered version of the first clock signal. The clock doubler circuit includes a frequency doubling circuit. The frequency doubling circuit includes a first input to receive the second clock signal and a second input to receive the third clock signal. The frequency doubling circuit includes an output node. The output node provides a fourth clock signal at a second clock frequency that is twice the first clock frequency.

Abstract: A tunable clock circuit has a dual overlapping digital to analog converter (DAC) and an oscillator. The dual overlapping DAC provides a first output selectable with a first resolution and a second output selectable with a second resolution. The first resolution is different from the second resolution. The oscillator has a first input coupled to the first output of the dual overlapping DAC, a second input coupled to the second output of the dual overlapping DAC, and an output providing a clock output signal.

Abstract: A single-ended SAR ADC includes an additional capacitor, a self-test engine, and independent control of sample and hold conditions, which allows for quick and accurate testing of the ADC.

Abstract: A timer to provide pulses at a comparator output wherein a frequency of the pulses is dependent on temperature, wherein providing each pulse includes biasing a first input of the comparator at a voltage and operating a transistor in a subthreshold region of operation to change the voltage of the first input of a comparator at a rate dependent upon temperature. The output of the comparator changes state when the voltage of the first input crosses a voltage of a second input of the comparator.

Abstract: A timer to provide pulses at a comparator output wherein a frequency of the pulses is dependent on temperature, wherein providing each pulse includes biasing a first input of the comparator at a voltage and operating a transistor in a subthreshold region of operation to change the voltage of the first input of a comparator at a rate dependent upon temperature. The output of the comparator changes state when the voltage of the first input crosses a voltage of a second input of the comparator.

Abstract: A single-ended SAR ADC includes an additional capacitor, a self-test engine, and independent control of sample and hold conditions, which allows for quick and accurate testing of the ADC.

Abstract: A single-ended SAR ADC includes an additional capacitor, a self-test engine, and independent control of sample and hold conditions, which allows for quick and accurate testing of the ADC.

Abstract: A single-ended SAR ADC includes an additional capacitor, a self-test engine, and independent control of sample and hold conditions, which allows for quick and accurate testing of the ADC.

Abstract: A measurement circuit and method for measuring a quiescent current of a circuit under test are provided. The measurement circuit comprises: a comparator having a first input terminal for receiving a reference voltage, a second input terminal coupled to the circuit under test, and an output terminal; a current source having a first terminal coupled to a first power supply voltage terminal, and a second terminal for providing a current to the circuit under test; a first switch having a first terminal coupled to the second terminal of the current source, a second terminal coupled to the circuit under test, and a control terminal coupled to the output terminal of the comparator; and a first counter having a first input terminal coupled to the output terminal of the comparator, a second input terminal for receiving a clock signal, and an output terminal for providing a first counter value associated with the quiescent current.

Abstract: A data converter for converting analog signals to digital signals, or for converting digital signals to analog signals is provided. In one embodiment, a production self-test is provided. In one embodiment, a high-speed lower-resolution method or mode for a data converter is provided. In one embodiment, a differential data converter with a more stable comparator common mode voltage is provided. In one embodiment, the input range of a digitally calibrated data converter is provided and maintained so that there is no loss in input range due to the calibration. In one embodiment, digital post-processing of an uncalibrated result using a previously stored calibration value is provided.