Patents by Inventor Michael T. Coster

Michael T. Coster has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9269642
    Abstract: Aspects of the present invention relate to methods of testing an integrated circuit of a wafer and testing structures for integrated circuits. The methods include depositing a sacrificial material over a first conductor material of the integrated circuit, and contacting a test probe to the deposited sacrificial material. The methods can also include testing the integrated circuit using the test probe contacting the sacrificial material. Finally, the methods can include removing the sacrificial material over the first conductor material of the integrated circuit subsequent to the testing of the integrated circuit.
    Type: Grant
    Filed: June 12, 2013
    Date of Patent: February 23, 2016
    Assignee: GLOBALFOUNDRIES INC.
    Inventors: Michael T. Coster, Mark A. DiRocco, Jeffrey P. Gambino, Kirk D. Peterson
  • Publication number: 20140367684
    Abstract: Aspects of the present invention relate to methods of testing an integrated circuit of a wafer and testing structures for integrated circuits. The methods include depositing a sacrificial material over a first conductor material of the integrated circuit, and contacting a test probe to the deposited sacrificial material. The methods can also include testing the integrated circuit using the test probe contacting the sacrificial material. Finally, the methods can include removing the sacrificial material over the first conductor material of the integrated circuit subsequent to the testing of the integrated circuit.
    Type: Application
    Filed: June 12, 2013
    Publication date: December 18, 2014
    Inventors: Michael T. Coster, Mark A. DiRocco, Jeffrey P. Gambino, Kirk D. Peterson