Patents by Inventor Michael T. Falcinelli

Michael T. Falcinelli has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 5552714
    Abstract: A multistate electronic transfer standard provides electronic conditions to at least one of two ports of a vector network analyzer. One embodiment of the multistate electronic transfer standard includes a plurality of semiconductor interconnected by transmission lines. Each of the semiconductor devices are biased to generate different conditions at each of the two ports. A control computer controls the biasing of devices according to a predetermined procedure and compares impedance values measured for at least one of the two ports of the network analyzer to known values stored by the control computer. The control computer thereby derives calibration coefficients that are used by the network analyzer in performing further measurements.
    Type: Grant
    Filed: June 7, 1995
    Date of Patent: September 3, 1996
    Assignee: ATN Microwave, Inc.
    Inventors: Vahe A. Adamian, Michael T. Falcinelli, Peter V. Phillips
  • Patent number: 5548221
    Abstract: A multistate electronic transfer standard provides electronic conditions to at least one of two ports of a vector network analyzer. One embodiment of the multistate electronic transfer standard includes a plurality of semiconductor interconnected by transmission lines. Each of the semiconductor devices are biased to generate different conditions at each of the two ports. A control computer controls the biasing of devices according to a predetermined procedure and compares impedance values measured for at least one of the two ports of the network analyzer to known values stored by the control computer. The control computer thereby derives calibration coefficients that are used by the network analyzer in performing further measurements.
    Type: Grant
    Filed: June 7, 1995
    Date of Patent: August 20, 1996
    Assignee: ATN Microwave, Inc.
    Inventors: Vahe A. Adamian, Michael T. Falcinelli, Peter V. Phillips
  • Patent number: 5537046
    Abstract: A multistate electronic transfer standard provides electronic conditions to at least one of two ports of a vector network analyzer. One embodiment of the multistate electronic transfer standard includes a plurality of semiconductor interconnected by transmission lines. Each of the semiconductor devices are biased to generate different conditions at each of the two ports. A control computer controls the biasing of devices according to a predetermined procedure and compares impedance values measured for at least one of the two ports of the network analyzer to known values stored by the control computer. The control computer thereby derives calibration coefficients that are used by the network analyzer in performing further measurements.
    Type: Grant
    Filed: June 7, 1995
    Date of Patent: July 16, 1996
    Assignee: ATN Microwave, Inc.
    Inventors: Vahe A. Adamian, Michael T. Falcinelli, Peter V. Phillips
  • Patent number: 5467021
    Abstract: A multistate electronic transfer standard provides electronic conditions to at least one of two ports of a vector network analyzer. One embodiment of the multistate electronic transfer standard includes a plurality of semiconductor interconnected by transmission lines. Each of the semiconductor devices are biased to generate different conditions at each of the two ports. A control computer controls the biasing of devices according to a predetermined procedure and compares impedance values measured for at least one of the two ports of the network analyzer to known values stored by the control computer. The control computer thereby derives calibration coefficients that are used by the network analyzer in performing further measurements.
    Type: Grant
    Filed: November 22, 1993
    Date of Patent: November 14, 1995
    Assignee: ATN Microwave, Inc.
    Inventors: Vahe A. Adamian, Michael T. Falcinelli, Peter V. Phillips
  • Patent number: 5434511
    Abstract: An electronic microwave calibration device provides an electronic load connected to each of two ports of a vector network analyzer. The load comprises a plurality of PIN diodes interconnected by transmission line. Each of the diodes are biased to generate different loads or conditions at each of the two ports. A control computer controls the biasing of diodes according to a predetermined procedure and compares impedance values measured at each of the two ports by the network analyzer to known values stored by the control computer. The control computer thereby derives calibration coefficients that are stored in the network analyzer and used by the network analyzer in performing further measurements.
    Type: Grant
    Filed: May 24, 1993
    Date of Patent: July 18, 1995
    Assignee: ATN Microwave, Inc.
    Inventors: Vahe A. Adamian, Michael T. Falcinelli, Peter V. Phillips