Abstract: In general, a test instrument includes a first processing system that is programmable to run one or more test programs to test a device interfaced to the test instrument, and that is programmed to control operation of the test instrument, a second processing system that is dedicated to device testing, the second processing system being programmable to run one or more test programs to test the device, and programmable logic configured to act as an interface between the test instrument and the device, the programmable logic being configurable to perform one or more tests on the device. The first processing system and the second processing system are programmable to access the device via the programmable logic.

Abstract: An example test system includes a bus interface to connect to a bus of a computer system; and test instruments to perform one or more test operations on a UUT, where the test instruments connect to the bus interface to enable communication between the computer system and the test instruments via the bus interface. At least one test instrument includes: ports to which the UUT is connectable, with each of the ports interfacing to a corresponding peripheral bus supported by the at least one test instrument; circuits to connect the bus interface to the peripheral buses, with each circuit being configured to convert between a bus interface protocol run on the bus interface and a peripheral bus protocol run on a peripheral bus; and a switch to identify a target circuit of the circuits, with the switch to direct communications between the computer system and the target circuit.

Abstract: An example test system includes a bus interface to connect to a bus of a computer system; and test instruments to perform one or more test operations on a UUT, where the test instruments connect to the bus interface to enable communication between the computer system and the test instruments via the bus interface. At least one test instrument includes: ports to which the UUT is connectable, with each of the ports interfacing to a corresponding peripheral bus supported by the at least one test instrument; circuits to connect the bus interface to the peripheral buses, with each circuit being configured to convert between a bus interface protocol run on the bus interface and a peripheral bus protocol run on a peripheral bus; and a switch to identify a target circuit of the circuits, with the switch to direct communications between the computer system and the target circuit.

Abstract: In general, a test instrument includes a processing system programmed to control operation of the test instrument, including communication with a control system, and programmed to run one or more test programs to test a device interfaced to the test instrument, the processing system including multiple processing devices, and a configurable interface, through which communications are exchanged with the device interfaced to the test instrument, the configurable interface including physical ports, to which different configurations are assignable.

Abstract: In general, a test instrument includes a processing system programmed to control operation of the test instrument, including communication with a control system, and programmed to run one or more test programs to test a device interfaced to the test instrument, the processing system including multiple processing devices, and a configurable interface, through which communications are exchanged with the device interfaced to the test instrument, the configurable interface including physical ports, to which different configurations are assignable.

Abstract: In general, a test instrument includes a first processing system that is programmable to run one or more test programs to test a device interfaced to the test instrument, and that is programmed to control operation of the test instrument, a second processing system that is dedicated to device testing, the second processing system being programmable to run one or more test programs to test the device, and programmable logic configured to act as an interface between the test instrument and the device, the programmable logic being configurable to perform one or more tests on the device. The first processing system and the second processing system are programmable to access the device via the programmable logic.