Patents by Inventor Michael Timothy La Tulippe

Michael Timothy La Tulippe has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and system to inspect a component
    Patent number: 7065176
    Abstract: A system and method to inspect a component is disclosed. The system to inspect a component may include an x-ray source to direct an x-ray beam through the component and an x-ray detector to detect the x-ray beam after passing through the component. A processor may be included to transform coordinates on an x-ray detection panel of the x-ray detector that detect any defects to a digital representation of locations on the component of any defects.
    Type: Grant
    Filed: May 28, 2003
    Date of Patent: June 20, 2006
    Assignee: General Electric Company
    Inventors: Kevin Moermond, Andy Joseph Galish, John Robert Brehm, Francis Howard Little, Dean Fredrich Graber, Michael Timothy La Tulippe, Ronald Cecil McFarland
  • METHOD AND SYSTEM TO INSPECT A COMPONENT
    Publication number: 20040240607
    Abstract: A system and method to inspect a component is disclosed. The system to inspect a component may include an x-ray source to direct an x-ray beam through the component and an x-ray detector to detect the x-ray beam after passing through the component. A processor may be included to transform coordinates on an x-ray detection panel of the x-ray detector that detect any defects to a digital representation of locations on the component of any defects.
    Type: Application
    Filed: May 28, 2003
    Publication date: December 2, 2004
    Applicant: GENERAL ELECTRIC COMPANY
    Inventors: Kevin Moermond, Andy Joseph Galish, John Robert Brehm, Francis Howard Little, Dean Fredrich Graber, Michael Timothy La Tulippe, Ronald Cecil McFarland