Abstract: Methods and apparatuses for affecting the frequency behavior of connections within a printed circuit board or an integrated circuit are disclosed. Some embodiments include a printed circuit board comprising, a plurality of conductive layers each comprising at least one conductive pad, where each conductive pad on the conductive layers includes a vacancy, and an insulating material disposed about the conductive layers such that the vacancies are at least partially filled with the insulating material.

Abstract: Methods and apparatuses for affecting the frequency behavior of connections within a printed circuit board or an integrated circuit are disclosed. Some embodiments include a printed circuit board comprising, a plurality of conductive layers each comprising at least one conductive pad, where each conductive pad on the conductive layers includes a vacancy, and an insulating material disposed about the conductive layers such that the vacancies are at least partially filled with the insulating material.

Abstract: In one embodiment, a clock generation system comprises first and second hot-swappable oscillator (HSO) devices that generate respective timing signals, a plurality of controllable attenuators for controllably attenuating one of the timing signals, a combiner for combining the timing signals, a redundant clock source (RCS) device for generating at least one clock for distribution to other circuits using an output of the combiner, and logic for switching which of the timing signals is attenuated in response to failure of one of the first and second HSO devices.

Abstract: Electrical circuit apparatuses, systems and/or methods including at least one trace, and at least one via in electrical communication with the trace to form at least a portion of a circuit loop; dielectric material disposed in operative relationship adjacent at least one of the at least one trace and the at least one via; and, a layer of a magnetic material in the electrical circuit apparatus adjacent at least one of the at least one trace and the at least one via; wherein the layer of magnetic material affects the impedance of at least one of the trace, the via or a portion of the circuit loop.

Abstract: A system and method for determining the dielectric properties associated with a substrate. In one embodiment, a network analyzer measures scattering parameters for at least two lines of substantially identical cross-section embedded within the substrate over a specified frequency range. A first engine determines a complex propagation constant based on the scattering parameters and defines the complex propagation constant in terms of an attenuation component and a phase component. A second engine, responsive to the phase component, determines a relative permittivity parameter associated with the substrate over the specified frequency range. A third engine, responsive to the attenuation component and the relative permittivity parameter, performs a least squares analysis to determine a loss tangent parameter associated with the substrate over the specified frequency range.