Patents by Inventor Michael Ugarov

Michael Ugarov has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9029763
    Abstract: A time-of-flight mass spectrometry (TOF MS) system includes an ion deflector, ion extractor, a flight tube, and a detector. The deflector may be disposed in the flight tube or outside the flight tube upstream of the extractor. The deflector deflects ions away from a main flight path such that the defected ions are not detected.
    Type: Grant
    Filed: August 30, 2013
    Date of Patent: May 12, 2015
    Assignee: Agilent Technologies, Inc.
    Inventor: Michael Ugarov
  • Publication number: 20150060656
    Abstract: A time-of-flight mass spectrometry (TOF MS) system includes an ion deflector, ion extractor, a flight tube, and a detector. The deflector may be disposed in the flight tube or outside the flight tube upstream of the extractor. The deflector deflects ions away from a main flight path such that the defected ions are not detected.
    Type: Application
    Filed: August 30, 2013
    Publication date: March 5, 2015
    Applicant: Agilent Technologies, Inc.
    Inventor: Michael Ugarov
  • Patent number: 8952326
    Abstract: An atmospheric pressure (AP) interface for a spectrometer includes wall for separating an ionization chamber from a reduced-pressure region of the spectrometer, an ion inlet defining an ion path from the ionization chamber to the reduced-pressure region, and a passage defining a gas path from the ionization chamber to a gas outlet external to the reduced-pressure region. The passage may have a greater gas conductance than the ion inlet such that most gas into the passage and not the ion inlet. The interface device is configured for applying a static electric field effective for focusing ions in the ionization chamber preferentially into the ion inlet.
    Type: Grant
    Filed: November 4, 2013
    Date of Patent: February 10, 2015
    Assignee: Agilent Technologies, Inc.
    Inventor: Michael Ugarov
  • Patent number: 8723108
    Abstract: Methods, apparatus and systems for acquiring spectrometric data from analyte ions implement transient-level data acquisition and peak correction in a time-of-flight mass spectrometer. Transient spectra including analyte peaks and reference mass peaks are recorded, from which a set of averaged peak centroids of the reference masses is generated. The peaks of reference masses in each transient spectrum are compared to the averaged peak centroids. From this comparison, an appropriate correction function is applied to each transient spectrum to correct the positions of the analyte peaks in each transient spectrum. The corrected transient spectra are then summed to obtain a corrected averaged spectrum.
    Type: Grant
    Filed: October 19, 2012
    Date of Patent: May 13, 2014
    Assignee: Agilent Technologies, Inc.
    Inventor: Michael Ugarov
  • Publication number: 20140110574
    Abstract: Methods, apparatus and systems for acquiring spectrometric data from analyte ions implement transient-level data acquisition and peak correction in a time-of-flight mass spectrometer. Transient spectra including analyte peaks and reference mass peaks are recorded, from which a set of averaged peak centroids of the reference masses is generated. The peaks of reference masses in each transient spectrum are compared to the averaged peak centroids. From this comparison, an appropriate correction function is applied to each transient spectrum to correct the positions of the analyte peaks in each transient spectrum. The corrected transient spectra are then summed to obtain a corrected averaged spectrum.
    Type: Application
    Filed: October 19, 2012
    Publication date: April 24, 2014
    Applicant: Agilent Technologies, Inc.
    Inventor: Michael Ugarov
  • Patent number: 8633436
    Abstract: Methods, apparatus and systems for acquiring spectrometric data from analyte ions implement a combination of drift-type ion mobility (IM) separation and time-of-flight mass spectrometry (TOF MS). Both separation techniques are carried out in tandem while applying mass filtering with a wide window of ion isolation. One mode of operation entails utilizing a mass filter to limit ion packets to ions in a selected m/z range that remains constant over the entire course of data acquisition. Another mode entails utilizing the mass filter to limit ion packets to an m/z range that varies over the course of data acquisition.
    Type: Grant
    Filed: December 22, 2011
    Date of Patent: January 21, 2014
    Assignee: Agilent Technologies, Inc.
    Inventor: Michael Ugarov
  • Patent number: 8481963
    Abstract: Described herein is an ion slicer that: a) accelerates an ion beam towards a first electrode comprising an ion entrance slit, where the first electrode blocks a portion of ions with high displacement from the axis of the ion beam, thereby slicing the ion beam; and then b) decelerates the ion beam after it is sliced.
    Type: Grant
    Filed: February 27, 2012
    Date of Patent: July 9, 2013
    Assignee: Agilent Technologies, Inc.
    Inventors: Harvey D. Loucks, Jr., James L. Bertsch, Michael Ugarov, William E. Barry, Yevgeny Kaplun
  • Publication number: 20130161506
    Abstract: Methods, apparatus and systems for acquiring spectrometric data from analyte ions implement a combination of drift-type ion mobility (IM) separation and time-of-flight mass spectrometry (TOF MS). Both separation techniques are carried out in tandem while applying mass filtering with a wide window of ion isolation. One mode of operation entails utilizing a mass filter to limit ion packets to ions in a selected m/z range that remains constant over the entire course of data acquisition. Another mode entails utilizing the mass filter to limit ion packets to an m/z range that varies over the course of data acquisition.
    Type: Application
    Filed: December 22, 2011
    Publication date: June 27, 2013
    Applicant: AGILENT TECHNOLOGIES, INC.
    Inventor: MICHAEL UGAROV
  • Patent number: 8389930
    Abstract: A mass spectrometer and method for operating the same. The mass spectrometer includes a vacuum chamber and an input port that receives ions to be analyzed in the mass spectrometer. The chamber is adapted to operate at a pressure less than a first pressure, and includes a wall that separates the chamber from an environment outside the chamber at atmospheric pressure. The input port provides a pressure drop between the outside environment at a second pressure and the chamber. The input port includes a plurality of channels, each channel having first and second electrodes arranged on opposing surfaces of that channel and having first and second ends. The first end of each channel is at a pressure equal to the first pressure and the second end is at a pressure less than the second pressure.
    Type: Grant
    Filed: April 30, 2010
    Date of Patent: March 5, 2013
    Assignee: Agilent Technologies, Inc.
    Inventor: Michael Ugarov
  • Publication number: 20120217387
    Abstract: Described herein is an ion slicer that: a) accelerates an ion beam towards a first electrode comprising an ion entrance slit, where the first electrode blocks a portion of ions with high displacement from the axis of the ion beam, thereby slicing the ion beam; and then b) decelerates the ion beam after it is sliced.
    Type: Application
    Filed: February 27, 2012
    Publication date: August 30, 2012
    Inventors: Harvey D. Loucks, JR., James L. Bertsch, Michael Ugarov, William E. Barry, Yevgeny Kaplun
  • Publication number: 20120217388
    Abstract: Provided herein is a bladed ion slicer for blocking ions in an ion beam that have significant distance from the beam axis. In certain embodiments, the bladed ion slicer comprises a body; a first elongated blade; and a second elongated blade; wherein the ion slicer comprises a slit that extends through the body through which ions pass and wherein the edges of the first and second elongated blades define the entrance of the slit and are pointing towards the ion beam. A mass spectrometer system and method for removing unwanted ions are also provided.
    Type: Application
    Filed: February 27, 2012
    Publication date: August 30, 2012
    Inventors: Harvey D. Loucks, JR., James L. Bertsch, Michael Ugarov, William E. Barry, Yevgeny Kaplun
  • Patent number: 8193489
    Abstract: A multipole ion guide comprises rods disposed about an axis, each of the rods having a first end and a second end remote from the first end. Each of the rods is disposed at a respective greater distance from the axis at the first end than at the second end. The multipole ion guide comprises means for applying a radio frequency (RF) voltage between adjacent pairs of rods, wherein the RF voltage creates a multipole field in a region between the rods; and means for applying a direct current (DC) voltage drop along a length of each of the rods. A mass spectroscopy system is also disclosed.
    Type: Grant
    Filed: May 28, 2009
    Date of Patent: June 5, 2012
    Assignee: Agilent Technologies, Inc.
    Inventors: James L. Bertsch, Michael Ugarov
  • Publication number: 20110266432
    Abstract: A mass spectrometer and method for operating the same. The mass spectrometer includes a vacuum chamber and an input port that receives ions to be analyzed in the mass spectrometer. The chamber is adapted to operate at a pressure less than a first pressure, and includes a wall that separates the chamber from an environment outside the chamber at atmospheric pressure. The input port provides a pressure drop between the outside environment at a second pressure and the chamber. The input port includes a plurality of channels, each channel having first and second electrodes arranged on opposing surfaces of that channel and having first and second ends. The first end of each channel is at a pressure equal to the first pressure and the second end is at a pressure less than the second pressure.
    Type: Application
    Filed: April 30, 2010
    Publication date: November 3, 2011
    Inventor: Michael Ugarov
  • Publication number: 20100301210
    Abstract: A multipole ion guide comprises rods disposed about an axis, each of the rods having a first end and a second end remote from the first end. Each of the rods is disposed at a respective greater distance from the axis at the first end than at the second end. The multipole ion guide comprises means for applying a radio frequency (RF) voltage between adjacent pairs of rods, wherein the RF voltage creates a multipole field in a region between the rods; and means for applying a direct current (DC) voltage drop along a length of each of the rods. A mass spectroscopy system is also disclosed.
    Type: Application
    Filed: May 28, 2009
    Publication date: December 2, 2010
    Applicant: AGILENT TECHNOLOGIES, INC.
    Inventors: JAMES L. BERTSCH, Michael Ugarov
  • Publication number: 20060289746
    Abstract: The content of the invention comprises a concept of multi-beam ion pre-selection from a single sample, coordinated mobility (against the gas flow) separation, cooling ions in supersonic gas flow and mass separation of thus low divergent ions by single or plural compact high-resolution orthogonal time-of-flight mass spectrometers both linear or reflectron type with controlled collision-induced dissociation (CID) and multi-channel data recording for the optimization of sample use in the analysis, and obtaining as much useful information about the sample as possible in a reasonably short time.
    Type: Application
    Filed: May 26, 2006
    Publication date: December 28, 2006
    Inventors: Valeri Raznikov, J. Schultz, Thomas Egan, Michael Ugarov, Agnes Tempez, Gennadiy Savenkov, Vladislav Zelenov
  • Publication number: 20060289747
    Abstract: The present invention relates generally to instrumentation and methodology for the characterization of chemical samples in solutions or on a surface which is based on modified ionization methods with or without adjustable pH and controllable H-D exchange in solution, an improved ion mobility spectrometer (IMS), a multi-beam ion pre-selection of the initial flow, and coordinated mobility and mass ion separation and detection using a single or several independent time-of-flight mass spectrometers for different beams with methods for fragmenting ion mobility-separated ions and multi-channel data recording
    Type: Application
    Filed: May 26, 2006
    Publication date: December 28, 2006
    Applicant: Ionwerks, Inc.
    Inventors: J. Schultz, Valeri Raznikov, Thomas Egan, Michael Ugarov, Agnes Tempez, Marina Raznikova, Valentin Tarasenko
  • Publication number: 20060192104
    Abstract: Improved ion focusing for an ion mobility drift cell allows for improved throughput for subsequent detection such as mass detection. Improved focusing is realized by the use of alternating regions of high and low electric fields in the ion mobility drift cell.
    Type: Application
    Filed: January 30, 2006
    Publication date: August 31, 2006
    Applicant: Ionwerks, Inc.
    Inventors: J. Schultz, Valeri Raznikov, Thomas Egan, Michael Ugarov, Agnes Tempez
  • Publication number: 20060138317
    Abstract: The present invention enhances the laser desorption of biological molecular ions from surfaces by creating a surface localized MALDI particle matrix by ion implantation of low energy ionized clusters (gold, aluminum, etc.) or chemically derivatized clusters into the near surface region of the sample. MALDI analysis of the intact biomolecules on the surface or within a narrow subsurface region defined by the implantation range of the ions can then be performed by laser desorption into a mass spectrometer or, in a preferred embodiment, into a combined ion mobility orthogonal time of flight mass spectrometer.
    Type: Application
    Filed: September 21, 2005
    Publication date: June 29, 2006
    Inventors: J. Schultz, Michael Ugarov, Thomas Egan, Agnes Tempez, Yvon Le bayec, Serge Negra
  • Publication number: 20060024720
    Abstract: A method and apparatus for multiplexed data acquisition for gas-phase ion mobility coupled with mass spectrometry is described. Ion packets are injected into an ion mobility drift chamber at a rate faster than the ion mobility separation arrival time distribution. The convoluted arrival time distributions thus generated are deconvoluted by a mass spectrometer and post-processing algorithms.
    Type: Application
    Filed: July 27, 2005
    Publication date: February 2, 2006
    Inventors: John McLean, David Russell, Thomas Egan, Michael Ugarov, J. Schultz
  • Publication number: 20050230615
    Abstract: An ion mobility/mass spectrometry method and instrument using aerosolized samples and dual positive and negative mode detection is described. Sample preparation methods are also described.
    Type: Application
    Filed: December 29, 2004
    Publication date: October 20, 2005
    Inventors: Hiroshi Furutani, Michael Ugarov, Kimberly Prather, J. Schultz