Patents by Inventor Michael W. Hucks

Michael W. Hucks has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 5483337
    Abstract: An atomic emission spectrometer includes an induction coupled plasma generator and a detector system for detecting the radiation relative to spectral wavelength. A first mirror is on the longitudinal axis of the generator to receive axial radiation therefrom. A second mirror is disposed laterally from the generator so as to reflect radial radiation therefrom parallel to the longitudinal axis toward a third mirror disposed laterally from the longitudinal axis. The third mirror passes the radiation to a fourth mirror positioned adjacent to the axial radiation without interfering therewith so as to reflect the radial radiation to the first mirror. The first mirror is rotated to a first orientation to reflect the axial radiation into the detector system, or to a second orientation to reflect the radial radiation into the detector system.
    Type: Grant
    Filed: October 19, 1994
    Date of Patent: January 9, 1996
    Inventors: Thomas W. Barnard, Michael I. Crockett, Michael W. Hucks