Abstract: Systems, methods, and devices for determining relative and absolute positions and orientations of a detector and an inspection part of a CT system. In some cases positions/orientations of the detector and the inspection part can be defined, at least in part, by tilt angles relative to reference axes and/or planes defined by various combinations of the reference axes. In some embodiments, sensors coupled to the detector and to a stage assembly having the inspection part coupled thereto can be used to determine the tilt angles of the inspection part and the detector, respectively. Data from the sensors characterizing tilt angles of the detector and the inspection part can be used to adjust projectional radiographs of the inspection part to correct for the mechanical wobble of the stage. By using tilt data to adjust projectional radiographs, the quality of tomographic images and 3-dimensional reconstructions of the inspection part can be improved.

Abstract: Systems, methods, and devices for determining relative and absolute positions and orientations of a detector and an inspection part of a CT system. In some cases positions/orientations of the detector and the inspection part can be defined, at least in part, by tilt angles relative to reference axes and/or planes defined by various combinations of the reference axes. In some embodiments, sensors coupled to the detector and to a stage assembly having the inspection part coupled thereto can be used to determine the tilt angles of the inspection part and the detector, respectively. Data from the sensors characterizing tilt angles of the detector and the inspection part can be used to adjust projectional radiographs of the inspection part to correct for the mechanical wobble of the stage. By using tilt data to adjust projectional radiographs, the quality of tomographic images and 3-dimensional reconstructions of the inspection part can be improved.

Abstract: Systems and methods are described that reduce the amount of data that is transferred among the components of the system. In one embodiment, the testing system comprises a scanner device such as a computed-tomography (CT) scanner that generates a volumetric representation of a part-under-inspection. The testing system is further configured to identify a region of interest in the volumetric representation, wherein the region of interest may correspond to an area of the part-under-inspection where a defect or flaw may form. The testing system may further format the data of the volumetric representation so the resulting formatted volumetric representation comprises less data than the original volumetric representation.

Abstract: A system for the automated serial testing and/or measuring of a plurality of substantially identical components by X-radiation, the system comprising a testing device with a support, a rotor mounted so as to be continuously rotatable on the support, and an X-ray device disposed on the rotor, a protective enclosure surrounding the testing device, a handling device for handling a component during X-ray testing, and a control/evaluation unit configured for automatically controlling the system as well as evaluating the X-ray signals by computer tomography. The handling device is configured for periodically reciprocating between a loading region and a testing region and comprises an end face element on which the component can be disposed on the side of the end face.

Abstract: An apparatus for materials testing of test objects using X-rays, the apparatus comprising an X-ray device, comprising: an X-ray source for irradiating a test object held in a test position; an X-ray linear diode array detector comprising at least two detection sections and configured to acquire a complete radial cross-section of the test object; and an electronic control device configured to control the X-ray device, wherein during X-ray testing the test object and the X-ray device are rotatable relative to each other only around an essentially vertical axis of rotation.

Abstract: A system for the automated serial testing and/or measuring of a plurality of substantially identical components by X-radiation, the system comprising a testing device with a support, a rotor mounted so as to be continuously rotatable on the support, and an X-ray device disposed on the rotor, a protective enclosure surrounding the testing device, a handling device for handling a component during X-ray testing, and a control/evaluation unit configured for automatically controlling the system as well as evaluating the X-ray signals by computer tomography. The handling device is configured for periodically reciprocating between a loading region and a testing region and comprises an end face element on which the component can be disposed on the side of the end face.

Abstract: Embodiments of an apparatus, and an inspection system incorporating the apparatus, prevent exposure to radiation during inspection of tubes (e.g., boiler tubes). The embodiments can comprise a housing and a pair of translating baffles that engage the outside of the housing. In one embodiment, the housing moves relative to the translating baffles during rotation of the housing to change the orientation of the housing relative to the boiler tubes. The housing and the translating baffles maintain engagement to prevent radiation from leaking out of the housing and into the surrounding environment.

Abstract: This disclosure describes an apparatus and inspection system that is useful to inspection tubes (e.g., boiler tubes). The apparatus can comprise a housing and a pair of translating baffles that engage the outside of the housing. In one embodiment, the housing moves relative to the translating baffles during rotation of the housing to change the orientation of the housing relative to the boiler tubes. The housing and the translating baffles maintain engagement to prevent radiation from leaking out of the housing and into the surrounding environment.

Abstract: A method and system for automated testing and/or measurement of a plurality of substantially identical components by means of X-ray radiation comprises a testing/measuring device with an X-ray device, a protection cabin surrounding the testing/measuring device, a conveying device for continuously conveying components to or away from the testing/measuring device, and a control/evaluation unit, which is set up for automated control of the system and for evaluation of the X-ray signals. The testing/measuring device comprises a support and a rotor mounted on the support so as to be continuously rotatable, the X-ray device being arranged on the rotor and the conveying device being set up for serial conveying of the components through the rotor and the control/evaluation unit for computer tomographic evaluation of the X-ray signals.

Abstract: Systems and methods are described that reduce the amount of data that is transferred among the components of the system. In one embodiment, the testing system comprises a scanner device such as a computed-tomography (CT) scanner that generates a volumetric representation of a part-under-inspection. The testing system is further configured to identify a region of interest in the volumetric representation, wherein the region of interest may correspond to an area of the part-under-inspection where a defect or flaw may form. The testing system may further format the data of the volumetric representation so the resulting formatted volumetric representation comprises less data than the original volumetric representation.

Abstract: Non-destructive testing and examination systems and methods generate models and other representations of a part. These models can be used to perform analysis such as defect detection and categorization. The present disclosure identifies, in one embodiment, a method and system that identifies particular locations on the part for analysis. These locations correspond to regions of a reference model, which may comprise a representation of the part that a computer aided design (CAD) package can generate. The method provides for test parameters to be assigned or associated with the region so as to direct and instruct the execution of the relevant part analysis protocols. In one example, the test parameters identify criteria for one or more types of defects that may be found on the part.

Abstract: An apparatus for materials testing of test objects using X-rays, the apparatus comprising an X-ray device, comprising: an X-ray source for irradiating a test object held in a test position; an X-ray linear diode array detector comprising at least two detection sections and configured to acquire a complete radial cross-section of the test object; and an electronic control device configured to control the X-ray device, wherein during X-ray testing the test object and the X-ray device are rotatable relative to each other only around an essentially vertical axis of rotation.

Abstract: A method and system for automated testing and/or measurement of a plurality of substantially identical components by means of X-ray radiation comprises a testing/measuring device with an X-ray device, a protection cabin surrounding the testing/measuring device, a conveying device for continuously conveying components to or away from the testing/measuring device, and a control/evaluation unit, which is set up for automated control of the system and for evaluation of the X-ray signals. The testing/measuring device comprises a support and a rotor mounted on the support so as to be continuously rotatable, the X-ray device being arranged on the rotor and the conveying device being set up for serial conveying of the components through the rotor and the control/evaluation unit for computer tomographic evaluation of the X-ray signals.