Abstract: An insect barrier strip that prevents targeted insects from climbing up a targeted tree. The insect barrier strip may contain insecticides that the targeted insects will encounter and kill. The insect barrier strip may be made of material(s) with a low coefficient of friction to provide a difficult surface for insects to traverse, that are flexible/expandable to enable the insect barrier strip to be wrapped around a tree trunk and expand over time as the trunk grows, are chemical resistant so insecticides will not degrade, and are capable of withstanding a wide range of environmental conditions. The insect barrier strip may include an overhang to make it more difficult for the targeted insects to get past. The insect barrier strip may include a trough that the insecticide can be located in or clips that insecticide can be secured to. A wick can be utilized to hold the insecticide.

Abstract: Devices and methods for enhancing the operations of fluid systems are provided. For example, this document provides variable-elevation drop tubes that are well suited for use with medical fluid reservoirs. While the variable-elevation drop tubes provided herein are described in the context of a medical fluid system, such as an extracorporeal blood flow circuit, it should be understood that the devices and methods provided herein are not limited to such contexts.

Abstract: Devices and methods for enhancing the operations of fluid systems are provided. For example, this document provides variable-elevation drop tubes that are well suited for use with medical fluid reservoirs. While the variable-elevation drop tubes provided herein are described in the context of a medical fluid system, such as an extracorporeal blood flow circuit, it should be understood that the devices and methods provided herein are not limited to such contexts.

Abstract: A method for quality and reliability assurance testing a lot of fabricated ICs comprising the steps of testing the differential Iddq of a sample of ICs at a plurality of different voltages, burning-in a sample of ICs, and then testing the functionality of the sample of ICs. The method of the present invention enables the reliability of an entire lot of ICs to be tested by determining an effective screening voltage for differential Iddq testing of the ICs, thereby eliminating the need both to burn-in and conduct post burn-in testing of all future lots of the ICs. The method of the present invention also enables fabrication facilities and workers to be engaged in other tasks rather than testing of ICs.