Abstract: A patch panel includes a first outlet having a first connecting block; a second outlet having a second connecting block, the second connecting block positioned adjacent to the first connecting block; a conductive shield positioned between the first connecting block and the second connecting block to reduce alien crosstalk.

Abstract: A patch panel includes a first outlet having a first connecting block; a second outlet having a second connecting block, the second connecting block positioned adjacent to the first connecting block; a conductive shield positioned between the first connecting block and the second connecting block to reduce alien crosstalk.

Abstract: An electronics systems having variable interconnections among major components is tested by dynamically identifying the locations and types of all system components at the time the test is to be performed, for building a global model describing the interconnections among these components. Specific tests appropriate for this model are then dynamically generated and executed. Data on the components themselves identifies them. The tests employ boundary-scanning techniques to locate failing drivers, receivers, and bidirectional driver/receivers, as well as open and shorted interconnections.

Abstract: Phase difference demodulator for measuring the phase difference between two signals of the same frequency, time multiplexed onto a single analog input, and providing a precision digital output signal representing the phase difference. The most significant part of the signal, the upper bits, is determined by digital processes while analog-to-digital processes determines the lower bits. The analog-to-digital processes utilize an integrating capacitor and current sources for demodulating servo bursts for obtaining phase difference. The current sources are a coarse current and a fine current 1/16 in value of the coarse current source. The capacitor is switched in a differential scheme by the integrator to determine error during the digital approximation of the upper bits in analog to digital conversion. The same capacitor and current sources are utilized in the error acquired in analog form and then during the analog-to-digital conversion.