Patents by Inventor Michal Valík

Michal Valík has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Systems and apparatuses for contamination-free vacuum transfer of samples
    Patent number: 12020895
    Abstract: Various approaches are provided for contamination-free vacuum transfer of samples. As one example, an apparatus includes a compartment configured to store multiple samples held by a cartridge removably coupled to the compartment, a sample port for transferring the cartridge between a charged particle system and a position within the compartment, and a valve configured to seal the compartment at vacuum pressure during transport of the multiple samples between charged particle systems. In this way, samples such as lamellae may be transferred between charged particle systems while maintaining the samples at vacuum pressure, thereby reducing the possibility of sample contamination during sample transfer.
    Type: Grant
    Filed: February 7, 2022
    Date of Patent: June 25, 2024
    Assignee: FEI Company
    Inventors: Jakub Kuba, John M. Mitchels, Jakub Drahotský, Michal Valík
  • METHOD OF SAMPLE PREPARATON AND ANALYSIS
    Publication number: 20240162001
    Abstract: The present invention provides a method of sample preparation and analysis and a sample holder that may be used in said method.
    Type: Application
    Filed: July 27, 2023
    Publication date: May 16, 2024
    Inventors: Michal Valík, Petr Malek, John Mitchels, František Vaške, Veronika Vrbovská, Miloš Hovorka
  • SYSTEMS AND APPARATUSES FOR CONTAMINATION-FREE VACUUM TRANSFER OF SAMPLES
    Publication number: 20230253176
    Abstract: Various approaches are provided for contamination-free vacuum transfer of samples. As one example, an apparatus includes a compartment configured to store multiple samples held by a cartridge removably coupled to the compartment, a sample port for transferring the cartridge between a charged particle system and a position within the compartment, and a valve configured to seal the compartment at vacuum pressure during transport of the multiple samples between charged particle systems. In this way, samples such as lamellae may be transferred between charged particle systems while maintaining the samples at vacuum pressure, thereby reducing the possibility of sample contamination during sample transfer.
    Type: Application
    Filed: February 7, 2022
    Publication date: August 10, 2023
    Applicant: FEI Company
    Inventors: Jakub Kuba, John M. Mitchels, Jakub Drahotský, Michal Valík