Patents by Inventor Micheal D. Snyder

Micheal D. Snyder has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • METHODS FOR TESTING A MEMORY EMBEDDED IN AN INTEGRATED CIRCUIT
    Publication number: 20130019133
    Abstract: A memory system has a first memory having an array of memory cells that includes a redundant column. The redundant column substitutes for a first column in the array. The first column includes a test memory cell. The array receives a power supply voltage. The test memory cell becomes non-functional at a higher power supply voltage than the memory cells of the array. A memory controller is coupled to the first memory and is for determining if the test memory cell is functional at a first value for the power supply voltage. This is useful in making decisions concerning the value of the power supply voltage applied to the array.
    Type: Application
    Filed: September 13, 2012
    Publication date: January 17, 2013
    Applicant: FREESCALE SEMICONDUCTOR, INC.
    Inventors: Shayan Zhang, James D. Burnett, Kent P. Fancher, Andrew C. Russell, Micheal D. Snyder