Abstract: A method and a system for detecting surface defects on electronic circuits, such as Printed Circuit Boards (PCB), are described herein. The method first comprises identifying contours on a digital image of the PCB. Then anomalies are detected on the PCB image by comparing the identified contours to contours on a vectorial model of the PCB. Each detected anomaly is compared to manufacturing data to verify if it corresponds to a defect.

Abstract: The present invention provides a Fast Moiré Interferometry (FMI) method and system for measuring the dimensions of a 3D object using only two images thereof. The method and the system perform the height mapping of the object or the height mapping of a portion of the object. The present invention can be used to assess the quality of the surface of an object that is under inspection. It can also be used to evaluate the volume of the object under inspection.

Abstract: A shadow-free 3D and 2D measurement system combining, in one FMI set-up, a Moiré 3D lighting with other simultaneous external illuminations (for example a coaxial one or another). The reconstructed image combines the advantages of these different illuminations. The relative light intensities are selected in order to assure the best 2D detection while maintaining the 3D measurements.

Abstract: A three-dimensional image grabber allowing for the simultaneous projection of multiple phase-shifted patterns onto an object, and the simultaneous acquisition of multiple images of these phase-shifted patterns is described herein. The grabber comprises a pattern projecting assembly and an image acquisition assembly. The pattern projecting assembly includes, for example, a spectral splitter or a plurality of light sources, grids and projectors for simultaneous projection of a plurality of patterns under different monochromatic lights. The image acquisition assembly includes, for example, a CCD camera sensitive to the different monochromatic lights, or a plurality of CCD cameras with filters to gather lights incoming for the object simultaneously illuminated by the plurality of phase-shifted patterns. A method and a system for measuring the relief of an object, using the above-mentioned process, is also disclosed.

Abstract: A method and a system for detecting surface defects on electronic circuits, such as Printed Circuit Boards (PCB), are described herein. The method first comprises identifying contours on a digital image of the PCB. Then anomalies are detected on the PCB image by comparing the identified contours to contours on a vectorial model of the PCB. Each detected anomaly is compared to manufacturing data to verify if it corresponds to a defect.

Abstract: An optical strain sensor for measuring microdeformations of a surface with a resolution of at least 0.2 microns. The sensor comprises at least one camera for taking photographs of areas of the surface, the photographs being separated by a known fixed distance from one another before deformation has occurred. Templates are selected on the photographs taken before deformation, relocalized on photographs taken after deformation of the surface, and the deformation is derived from the computation of the difference in distances between the templates before and after deformation has occurred.

Abstract: Device (1) for fixing a telpher chair or a telpher car to a cable (2), of the type comprising a part (5,6,8) extending along the cable and forming a travelling surface (12) on which rollers (13) are made to travel, the part having at each of its ends an extension (14,15) comprising an arm (16) which extends laterally relative to the cable and along the latter and which forms a travelling surface (22) or ramp which extends the travelling surface (12) of the part in such a way that the rollers (13) mount or leave by means of tangential contact the travelling surface of the extension (14) at its end or in the vicinity thereof.