Patents by Inventor Michel Delhaye

Michel Delhaye has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6950185
    Abstract: An inelastic diffusion spectrometric imaging apparatus includes an illuminating and energising system including a confocal first aperture and a second confocal aperture combined with the first. A first deflector assembly scanning for scanning a sample and a second deflector assembly sychronised with the first, are placed respectively downstream and upstream of the second confocal aperture and a spectrometer. The input aperture of the spectrometer merges with the second confocal aperture.
    Type: Grant
    Filed: August 8, 2000
    Date of Patent: September 27, 2005
    Assignee: Jobin Yvon S.A.
    Inventors: Edouard Da Silva, Michel DelHaye, Michel Leclercq, Bernard Roussel
  • Patent number: 5956136
    Abstract: In an optical fittering device comprising at least two fitters, the first filter (EF1) is tilted by an angle of incidence whose value is adjusted to bring the cut-off limit of the first filter (EF1) closer to one of the sides of the line of the illumination beam (FLA), which reduces the optical density of the first filter, while the association in series of the first (EF1) and second (EF2) filters enables to obtain a high-pass filtering whose global density corresponds to the sum of the densities of the first and second filters and whose cut-off limit is lower than that obtained by a single filter tilted to its optimum angle. A third filter (EF3) mounted in parallel with respect to the first and second filters (EF1 and EF2) enables to obtain, at the level of the common collection path (TCC), a band eliminating filtering whose cut-off limits are positioned on either side of the illumination line with a view to an optimum analysis of the low frequency lines.
    Type: Grant
    Filed: April 23, 1998
    Date of Patent: September 21, 1999
    Assignee: Dilor
    Inventors: Edouard Da Silva, Michel Delhaye, Michel Leclercq, Bernard Roussel
  • Patent number: 5822061
    Abstract: The spectrometry apparatus of the present invention includes, in addition to conventional analysis, a first diaphragm having a first chosen variable aperture for spatially filtering a coherent-excitation beam. The apparatus also includes a first deflector stage (DF1) for sweeping an excitation beam over a sample according to a first chosen deflection. Additionally, there is included a second diaphragm having a second variable aperture conjugate with the first aperture for filtering the incoherent-scattering beam. The spectrometry apparatus further provides a second deflector stage placed downstream in order to sweep the spectral image of the incoherent-scattering beam thus filtered over the multichannel detection module according to a second chosen deflection.
    Type: Grant
    Filed: November 8, 1996
    Date of Patent: October 13, 1998
    Assignee: Dilor
    Inventors: Michel Delhaye, Jacques Barbillat, Edouard Da Silva
  • Patent number: 5661557
    Abstract: A sample which is exposed to excitation radiation scatters light to a separator filter. The scattered light includes a Raman spectrum. The separator filter reflects, a spectral band of the radiation which it receives and transmits, the remainder of the radiation which it receives. The reflected spectral band is centered on the excitation radiation. The spectral band is collected and guided to a band-eliminating filter in order to eliminate therefrom a spectral band which is narrower than the reflected spectral band, and which embraces the wavelength of the excitation radiation. The band-eliminating filter has a steep elimination slope. A signal corresponding to the reflected spectral band, from which the narrow band has been eliminated in this way, is combined with the radiation transmitted by the separator filter and the combined radiations are supplied to a detection and analysis unit.
    Type: Grant
    Filed: October 27, 1995
    Date of Patent: August 26, 1997
    Assignee: Dilor
    Inventors: Edouard Da Silva, Michel Delhaye, Jacques Barbillat
  • Patent number: 5424825
    Abstract: The filtration means filter the exciter radiation (EX) in a first forward direction from generator means (LS) to the specimen (EC), by allowing a second spectral band (BZ) of predetermined spectral width (l) and centered on a selected frequency corresponding to the wavelength of the exciter radiation (L0) to pass and stopping a first spectral band (FZ) complementary to the second spectral band (BZ), while substantially simultaneously with this first filtration operation, these filtration means further filter the analysis radiation (ON) in a second direction that is the reverse of the first direction, by allowing the first spectral band (FZ) to pass and stopping the second spectral band (BZ).
    Type: Grant
    Filed: September 30, 1992
    Date of Patent: June 13, 1995
    Assignee: Dilor
    Inventors: Michel Delhaye, Edouard Da Silva, Gerard Martinez
  • Patent number: 5164786
    Abstract: The invention relates to a spectrometry installation comprising an inlet, optical fiber means suitable for receiving an inlet beam and delivering a spectrally dispersed image of the beam which image is limited to a selected spectral band, a multi-channel detection module receiving said spectral image, and processor means. The optical filter means are provided with a deflector stage. Control means are associated with the optical deflector means to define the spectral band in terms of center frequency and band width, and control means are associated therewith for displacing the spectral image over the detection module. An electronic control unit is provided to control the control means and to control the processor means in a plurality of operating modes, each of which comprises joint control of the selected spectral band, of the displacement of the spectral image, and of the processor means, for the purpose of selectively using a particular set of detector components.
    Type: Grant
    Filed: June 25, 1991
    Date of Patent: November 17, 1992
    Assignee: Dilor
    Inventors: Michel Delhaye, Edouard Da Silva, Bernard Roussel
  • Patent number: 4678277
    Abstract: The invention relates to a method of discrimination in spectrometry, particularly of eliminating phenomena of fluorescence in Raman spectrometry. According to the invention, a sample (6) is excited by a luminous pulse (5) generated from a laser (1). The light (7) emitted by the sample (6) is directed into an interferometer (8) of which the duration of a round trip of a luminous ray is significantly longer than the duration of the pulse of the incident wave and shorter than the duration of the phenomenon of fluorescence. The resulting light (9) is then directed to a second interferometer (10) of which the optical path is slightly different from that of the preceding interferometer (8). The light (11) is recovered at the outlet of the second interferometer (10) and this wave is analyzed by means of a spectrometer (12). The invention is applicable particularly to the analyzing of samples in the chemical industry.
    Type: Grant
    Filed: September 26, 1984
    Date of Patent: July 7, 1987
    Inventors: Michel Delhaye, Andre Deffontaine, Andre Chapput, Michel Bridoux, Edouard Da Silva
  • Patent number: 4030827
    Abstract: The present invention relates to an apparatus for the non-destructive examination of an heterogeneous sample by analysis of the Raman radiations scattered by the sample receiving an incident of monochromatic radiation of known frequency. The apparatus includes a source of monochromatic light, such as a laser beam, a monochromator for selecting and measuring the change in frequency of the Raman scattered or re-emitted radiations with respect to the frequency of the incident radiation, a radiation detector and an amplifier to amplify signals from the detector. The apparatus identifies each such re-emitted radiation by comparison with control samples or reference spectra. The invention enables selective mapping of the distribution of the polyatomic ions, crystals and molecules of the sample.
    Type: Grant
    Filed: December 2, 1974
    Date of Patent: June 21, 1977
    Assignee: Institut National de la Sante et de la Recherche Medicale (Inserm)
    Inventors: Michel Delhaye, Yves J. M. Moschetto, Paul Dhamelincourt