Abstract: The present disclosure provides systems and methods for testing an integrated circuit or device under test (DUT). A DUT of the present invention has a plurality of scan chains, a plurality of shift register elements each associated with a respective one of the scan chains, and a programmable switch matrix to configure shift register elements of a subset of the plurality of shift register elements to cause one shift register element of the subset to receive an interleaved test sequence, and to cause the interleaved test sequence to be shifted to other shift register elements in the subset, and to input deinterleaved test sequences to scan chains associated with the subset.