Abstract: In the error signal feature sensor of the device, an analog synthesized signal is produced throughout the first portion of each period of the analog noisy test signal to be acquired by means of the digital value of samples memorizing in a random access memory and a digital-to-analog converter. The noisy signal and the synthesized signal are compared therebetween at predetermined sampling times in predetermined number. The sign and modulus of the error signal in relation to a predetermined threshold voltage are written in the memory. During the second portion of the period without the noisy signal, a processing unit as a microprocessor calculates the new digital values of the samples in term of comparison results and the preceding digital values of the samples in accordance with a particular algorithm. A new comparison and calculation cycle is performed and so on.