Patents by Inventor Michel M. Azarian

Michel M. Azarian has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8378693
    Abstract: A front end of a vector network analyzer (VNA) on an integrated circuit includes a clock generator and two ports. The VNA couples to a device under test (DUT) using the two ports. Each port may include a plurality of receivers and a VSWR bridge, and can be configured as either an input or an output. The clock generator can generate a stimulus signal, an in-phase I clock signal, and a quadrature-phase Q clock signal. The output port provides the stimulus signal to the DUT and measures both reference and reflected power from the DUT, such as by utilizing two receivers by using direct conversion and the I and Q clock signals. The input port measures transmitted power through the DUT using a second VSWR bridge and one of its receivers by using direct conversion along with the I and Q clock signals. The VNA IC can provide S-parameter measurements to a processing unit for further processing and/or analysis to compute the DUT S-parameters.
    Type: Grant
    Filed: October 27, 2008
    Date of Patent: February 19, 2013
    Assignee: National Instruments Corporation
    Inventor: Michel M. Azarian
  • Patent number: 7969254
    Abstract: A quadrature modulator (QM) may be calibrated by determining total equivalent offsets in the I- and Q-channels, a total equivalent gain imbalance between the I- and Q-channels, and a total equivalent phase skew between the I- and Q-channels. These values may be obtained by taking various scalar measurements of the image to signal ratio (ISR) and carrier to signal ratio (CSR) of the QM, while alternatively altering the system gain imbalance, system phase skew, I-channel offset and Q-channel offset using a respective gain parameter, phase parameter, I-channel offset parameter, and Q-channel parameter. The gain and phase parameters may be defined in terms of the ISR, and the channel offset parameters may be defined in terms of the CSR. The system gain imbalance, system phase skew, and total offset in the channels may then be calculated based on the various ISR and CSR measurements.
    Type: Grant
    Filed: August 7, 2009
    Date of Patent: June 28, 2011
    Assignee: National Instruments Corporation
    Inventor: Michel M. Azarian
  • Publication number: 20110032046
    Abstract: A quadrature modulator (QM) may be calibrated by determining total equivalent offsets in the I- and Q-channels, a total equivalent gain imbalance between the I- and Q-channels, and a total equivalent phase skew between the I- and Q-channels. These values may be obtained by taking various scalar measurements of the image to signal ratio (ISR) and carrier to signal ratio (CSR) of the QM, while alternatively altering the system gain imbalance, system phase skew, I-channel offset and Q-channel offset using a respective gain parameter, phase parameter, I-channel offset parameter, and Q-channel parameter. The gain and phase parameters may be defined in terms of the ISR, and the channel offset parameters may be defined in terms of the CSR. The system gain imbalance, system phase skew, and total offset in the channels may then be calculated based on the various ISR and CSR measurements.
    Type: Application
    Filed: August 7, 2009
    Publication date: February 10, 2011
    Inventor: Michel M. Azarian
  • Publication number: 20100102829
    Abstract: A front end of a vector network analyzer (VNA) on an integrated circuit includes a clock generator and two ports. The VNA couples to a device under test (DUT) using the two ports. Each port may include a plurality of receivers and a VSWR bridge, and can be configured as either an input or an output. The clock generator can generate a stimulus signal, an in-phase I clock signal, and a quadrature-phase Q clock signal. The output port provides the stimulus signal to the DUT and measures both reference and reflected power from the DUT, such as by utilizing two receivers by using direct conversion and the I and Q clock signals. The input port measures transmitted power through the DUT using a second VSWR bridge and one of its receivers by using direct conversion along with the I and Q clock signals. The VNA IC can provide S-parameter measurements to a processing unit for further processing and/or analysis to compute the DUT S-parameters.
    Type: Application
    Filed: October 27, 2008
    Publication date: April 29, 2010
    Inventor: Michel M. Azarian