Patents by Inventor Michel Pecot

Michel Pecot has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6300895
    Abstract: The radar system of the invention uses a digital television network to make a multistatic configuration. The transmitted signal is of the OFDM type. The receiver or receivers carry out a matched filtering operation and recover the synchronization by processing of zero-value Doppler gates.
    Type: Grant
    Filed: February 14, 1997
    Date of Patent: October 9, 2001
    Assignee: Thomson-CSF
    Inventors: Bruno Carrara, Michel Pecot, Philippe Tourtier
  • Patent number: 6061327
    Abstract: The present invention belongs to the field of transmission of a signal, using OFDM modulation (Orthogonal Frequency Division Multiplexing), from a transmitter to at least one receiver, via a transmission channel. The invention relates in particular to a device and a method for equalization of the received OFDM signal. Said equalization device is fitted into the reception system between a synchronization module and a module for binary decoding of the received signal, in which the receiver includes a recursive vector equalizer (10) capable of correcting the received signal in the time domain.According to the invention, the recursive vector equalizer (10) includes computation means (16; 22; 24; 40; 44; 46; 56) capable of estimating each transmitted symbol as a function of an estimate of the transmitted symbol which precedes the said transmitted symbol.
    Type: Grant
    Filed: September 30, 1997
    Date of Patent: May 9, 2000
    Assignee: Thomson Licensing S.A.
    Inventors: Vincent Demoulin, Michel Pecot
  • Patent number: 5844610
    Abstract: An adaptive method for television image encoding by splitting the video image to be transmitted into sub-bands at the time of analysis filtering of the image encoder. These sub-bands are split into a tree-like structure by filtering and decimation. Local adaptive filtering is carried out in the analysis filters of each sub-band.
    Type: Grant
    Filed: January 20, 1995
    Date of Patent: December 1, 1998
    Assignee: Thomson-CSF
    Inventors: Laurent Perdrieau, Michel Pecot
  • Patent number: 5446495
    Abstract: A coder comprising banks of analysis filters (26, 27) for partitioning the spatio-temporal spectrum of each television image into sub-bands. The banks of analysis filters are coupled to devices for differential coding (30.sub.i, 31.sub.i, 32.sub.i) for separately coding the signals obtained in each sub-band. The decoder comprises prediction loops (24; 25; 12, 17 . . . 20, 3, 21, 22, 23) equal in number to the number of sub-bands for reconstructing each television image transmitted by the coder portion together with its level of resolution in each of the sub-bands.
    Type: Grant
    Filed: February 11, 1993
    Date of Patent: August 29, 1995
    Assignee: Thomson-CSF
    Inventors: Philippe Tourtier, Jean-Francois Vial, Jean-Louis Diascorn, Michel Pecot
  • Patent number: 5278915
    Abstract: The method consists in effecting a hierarchical decomposition of the image by levels of resolutions, (I.sub.31, I.sub.32, I.sub.33 ; I.sub.21, I.sub.22, I.sub.23 ; I.sub.11, I.sub.12, I.sub.13 ; I), in estimating an overall movement at the coarsest level of resolution and in refining the estimate (I.sub.31, I.sub.32, I.sub.33) in each level as the resolution increases.
    Type: Grant
    Filed: February 4, 1992
    Date of Patent: January 11, 1994
    Assignee: Thomson-CSF
    Inventors: Bertrand Chupeau, Michel Pecot
  • Patent number: 4989991
    Abstract: An improved method and apparatus are disclosed for calibrating the emissivity characteristics of a semiconductor wafer within a processing chamber by supporting a sample wafer on a graphite susceptor within the chamber and by comparing the temperature measured within the susceptor in close proximity to the center of the wafer with the temperature measured by the emission of radiation from the surface of the wafer through the walls of the processing chamber. Temperature measurements subsequently made from the radiation emitted from the surface of similar wafers are corrected with reference to the measurement made of the temperature within the susceptor on the sample wafer.
    Type: Grant
    Filed: June 12, 1989
    Date of Patent: February 5, 1991
    Assignee: AG Processing Technologies, Inc.
    Inventors: Michel Pecot, Jaim Nulman
  • Patent number: 4854727
    Abstract: An improved method and apparatus are disclosed for calibrating the emissivity characteristics of a semiconductor wafer within a processing chamber by supporting a sample wafer on a graphite susceptor within the chamber and by comparing the temperature measured within the susceptor in close proximity to the center of the wafer with the temperature measured by the emission of radiation from the surface of the wafer through the walls of the processing chamber. Temperature measurements subsequently made from the radiation emitted from the surface of similar wafers are corrected with reference to the measurement made of the temperature within the susceptor on the sample wafer.
    Type: Grant
    Filed: October 26, 1987
    Date of Patent: August 8, 1989
    Assignee: AG Processing Technologies, Inc.
    Inventors: Michel Pecot, Jaim Nulman