Patents by Inventor Michäel SIROIS

Michäel SIROIS has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Eddy current array probe with independent transmitters
    Patent number: 10794864
    Abstract: There is described an eddy current array probe for detection and depth sizing of a surface-breaking defect in a metallic material, said eddy current array probe comprising: a probe body comprising a plurality of probe elements arranged in a linear configuration, the probe elements each comprising at least one coil, the probe body being adapted to be displaced along a surface of the metallic material so that a longitudinal axis of the coil be parallel to the surface of the metallic material, the coil, when in use, being adapted to induce an eddy current within the metallic material detect the eddy current; and a set of active elements of the plurality of probe elements being adapted to be selectively operated at a plurality of time-spaced instances.
    Type: Grant
    Filed: April 14, 2015
    Date of Patent: October 6, 2020
    Assignee: EDDYFI NDT INC.
    Inventors: Michäel Sirois, Stèfan Parmentier, Marc Grenier, Nathan Decourcelle
  • Eddy Current Array Probe With Independent Transmitters
    Publication number: 20170030862
    Abstract: There is described an eddy current array probe for detection and depth sizing of a surface- breaking defect in a metallic material, said eddy current array probe comprising: a probe body comprising a plurality of probe elements arranged in a linear configuration, the probe elements each comprising at least one coil, the probe body being adapted to be displaced along a surface of the metallic material so that a longitudinal axis of the coil be parallel to the surface of the metallic material, the coil, when in use, being adapted to induce an eddy current within the metallic material detect the eddy current; and a set of active elements of the plurality of probe elements being adapted to be selectively operated at a plurality of time-spaced instances.
    Type: Application
    Filed: April 14, 2015
    Publication date: February 2, 2017
    Applicant: EDDYFI NDT INC.
    Inventors: Michäel SIROIS, Stèfan PARMENTIER, Marc GRENIER, Nathan DECOURCELLE